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121.
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The potential of rapid thermal processing (RTP) for the preparation of thin films of niobium oxynitrides was investigated. The 200 and 500 nm niobium films were deposited via sputtering on oxidized silicon(1 0 0)- and on sapphire(1 −1 0 2)-substrates. At first, oxidation of niobium films in molecular oxygen and then nitridation in ammonia using an RTP-system was performed. The films were characterized before and after the oxidation and nitridation processes by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and secondary ion mass spectrometry (SIMS). The influence of the two different substrates, amorphous SiO2 and single crystalline sapphire on the reactivity of the niobium films was studied in dependence of temperature, time of reaction and film thickness. The existence of niobium oxynitride formation was verified for some of the films. In some of the experiments, crack formation in the films or even delamination of the Nb-films from the substrates was observed. 相似文献
123.
The aim of this study is to investigate market depth as a stock market liquidity dimension. A new methodology for market depth measurement exactly based on Shannon information entropy for high-frequency data is introduced and utilized. The proposed entropy-based market depth indicator is supported by an algorithm inferring the initiator of a trade. This new indicator seems to be a promising liquidity measure. Both market entropy and market liquidity can be directly measured by the new indicator. The findings of empirical experiments for real-data with a time stamp rounded to the nearest second from the Warsaw Stock Exchange (WSE) confirm that the new proxy enables us to effectively compare market depth and liquidity for different equities. Robustness tests and statistical analyses are conducted. Furthermore, an intra-day seasonality assessment is provided. Results indicate that the entropy-based approach can be considered as an auspicious market depth and liquidity proxy with an intuitive base for both theoretical and empirical analyses in financial markets. 相似文献
124.
The present work discusses the effect of the pearlitic morphology with varying fineness on the cavitation erosion behavior of eutectoid rail steel. Cavitation erosion of three different types of the pearlitic steels (furnace-cooled, air-cooled, and forced-air-cooled) consisting of coarse, fine, and very fine microstructures were tested in 3.5% NaCl solution and compared with that of the as-received pearlitic rail steel. The variation in the mean depth of erosion (MDE) and mean depth erosion rate (MDER) with erosion time was analyzed. Furthermore, the cavitation erosion resistance of the as-received, the air-cooled, and the forced-air-cooled was found to be 1.03, 1.51, and 2.14 times better than the furnace-cooled pearlitic steel, respectively. It was concluded that the cavitation erosion resistance of the pearlitic steel increased with the increase in the fineness of the microstructure. 相似文献
125.
《中国物理 B》2021,30(5):53702-053702
Micromotion induced by the radio-frequency field contributes greatly to the systematic frequency shifts of optical frequency standards. Although different strategies for mitigating this effect have been proposed, trapping ions optically has the potential to provide a generic solution to the elimination of micromotion. This could be achieved by trapping a single ion in the dipole trap composed of a highpower laser field. Here, we present the setup of the dipole trap composed of a 532 nm laser at a power of 10 W aiming to optically trap a single ~(40)Ca~+ and we observe an AC-Stark shift of the fluorescence spectrum line of ~22 MHz caused by the 532 nm dipole beam. The beam waist of the dipole laser is several microns, which would provide a dipole potential strong enough for all-optical trapping of a single ~(40)Ca~+ ion. 相似文献
126.
Y. Kudriavtsev A. Hernandez R. Asomoza S. Gallardo M. Lopez K. Moiseev 《Surface and interface analysis : SIA》2017,49(2):145-148
We have performed secondary ion mass spectrometry depth profiling analysis of III–V based hetero‐structures at different target temperatures and found that both the surface segregation and surface roughness caused by ion sputtering can be radically reduced if the sample temperature is lowered to ?150 °C. The depth profiling of ‘frozen’ samples can be a good alternative to sample rotation and oxygen flooding used for ultra‐low‐energy depth profiling of compound semiconductors. Copyright © 2016 John Wiley & Sons, Ltd. 相似文献
127.
Effect of SIMS ionization probability on depth resolution for organic/inorganic interfaces
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Nicholas J. Popczun Lars Breuer Andreas Wucher Nicholas Winograd 《Surface and interface analysis : SIA》2017,49(10):933-939
Secondary ion mass spectrometry (SIMS) relies on the fact that surface particles ejected from a solid surface are ionized under ion bombardment. By comparing the signal of molecular secondary ions desorbed from an organic film with that of the corresponding sputtered neutral precursor molecules, we investigate the variation of the molecular ionization probability when depth profiling through the film to the substrate interface. As a result, we find notable variations of the ionization probability both at the original surface and in the interface region, leading to a strong distortion of the measured SIMS depth profile. The experiments show that the effect can act in two ways, leading either to an apparent broadening or to an artificial sharpening of the observed film‐substrate transition. As a consequence, we conclude that care must be taken when assessing interface location, width, or depth resolution from a molecular SIMS depth profile. 相似文献
128.
用MFRSR仪器观测气溶胶光学厚度 总被引:2,自引:0,他引:2
气溶胶对激光大气传输有着重要的影响。MFRSR(多光谱旋转遮蔽影带辐射计)是一种用于地基辐射和气溶胶测量的仪器。该仪器使用自动旋转影带技术同时在七个波段交替进行总的水平辐射和漫射水平辐射测量,然后推算得出直接辐射。其中6个波段的中心波长分别是414.3nm,495.3nm,613.7nm,671.5nm,867.6nm,939.3nm,还有一个硅探测器进行宽波段太阳总辐射测量。本文首先介绍了MFRSR仪器及其定标和资料处理方法,然后利用香河观测站2004-2005年MFRSR观测资料,分析了气溶胶的统计特性。为了说明利用MFRSR观测气溶胶光学厚度的可靠性,我们将MFRSR与AERONET的观测结果进行了比较,结果表明二者在500nm、670nm和870nm三个波段的平均偏差分别为-0.021,-0.009,-0.004;标准差分别为0.067,0.051,0.050。文中还对造成二者偏差的原因进行了讨论。 相似文献
129.
130.
在对二叉树存储结构进行分析的基础上,介绍二叉树遍历算法的一种应用,即基于求解二叉树深度算法设计实现的搜索二叉树中最长路径的算法。这里详细介绍了搜索二叉树中最长路径问题的分析解决思路,在对可能的预期结果进行分析的基础上,给出了算法的设计方案,同时给出了具体的C语言算法描述。 相似文献