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11.
黄静  谢宣 《电子科技》2022,35(5):7-13
针对装饰装修工程中由人工验收带来的诸多问题,文中提出了一种改进的SSD算法并将其应用于监理工作来代替人工验收,推动智能监理的实现。由于SSD算法存在对同一目标复检以及小目标检测效果欠佳等问题,故文中利用DPN网络替换基础特征提取网络VGG16。DPN结合了Resnet和Densenet的优点,具有更好的特征提取能力。通过加权FPN融合特征图,突出不同层特征图的贡献,丰富用于预测的特征图语义。利用深度可分离卷积降低模型的参数量,提高算法的推理速度。实验对比发现,改进后模型的平均精度提升了3.47%,对小数目检测平均精度的提升可达15%,证明新模型在监理目标检测任务中效果良好。  相似文献   
12.
Error surfaces are calculated for the fitting of concentration–depth profiles to angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) data. The shapes of the error surfaces indicate that model parameters related to composition (especially at the very surface of the sample) are well constrained by the data, whereas parameters related to depth have a less significant impact on the fit. It is then shown that certain parameters in the different depth profile models employed are highly correlated and that the different models convey essentially the same information in different ways. Finally, a compromise profile definition is proposed for the fitting of constrained but flexible depth profiles to ARXPS data. Copyright © 2003 John Wiley & Sons, Ltd.  相似文献   
13.
Biomass energy is the most acknowledged renewable resource due to its universality, richness, and renewability. This study utilized a Portulaca oleracea L. plant as a natural colorant for wool fabric dyeing with a high color yield at optimum extraction and dyeing conditions. To evaluate the dyeing mechanism and feasibility of the extracted dyes, we analyzed and characterized the molecular structure and nano-level particle size. The dyeing kinetics and the morphology of dyed fabrics were integratedly explored; the adsorption process of wool fabric on natural colorant molecules was increasingly in line with the pseudo-second-order kinetic adsorption model. Further, the dyeing effects of wool fabrics were compared to that of Musa basjoo mordant and synthetic dyes to confirm the superior color depth (K/S value 23.53), biological function as anti-ultraviolet (UPF value 253.47), and anti-bacterial activity (antibacterial rate of Staphylococcus aureus/Escherichia coli was 71.3%/37%). Our findings provide a feasible scheme for providing deep color and biological activity to wool fabrics. This has broad application prospects in the field of eco-friendly textile materials.  相似文献   
14.
 For investigation of the luminescent center profile cathodoluminescence measurements are used under variation of the primary electron energy E 0 = 2…30 keV. Applying a constant incident power regime (E 0·I 0 = const), the depth profiles of luminescent centers are deduced from the range of the electron energy transfer profiles dE/dx. Thermally grown SiO2 layers of thickness d = 500 nm have been implanted by Ge+-ions of energy 350 keV and doses (0.5–5)1016 ions/cm2. Thus Ge profiles with a concentration maximum of (0.4 – 4) at% at the depth of dm≅240 nm are expected. Afterwards the layers have been partially annealed up to T a = 1100 °C for one hour in dry nitrogen. After thermal annealing, not only the typical violet luminescence (λ = 400 nm) of the Ge centers is strongly increased but also the luminescent center profiles are shifted from about 250 nm to 170 nm depth towards the surface. This process should be described by Ge diffusion processes, precipitation and finally Ge nanocluster formation. Additionally, a Ge surface layer is piled-up extending to a depth of roughly 25 nm.  相似文献   
15.
The influence of surface structure of technical materials on results and statements of surface analytical methods has been investigated. Especially surface roughness as a typical property of rolled products has been observed. For this purpose samples of steel (technical surface, roughness up to 5 m) and silicon wafers (polished surface) have been analyzed by SNMS and GDOS in order to get information about changes of the surface roughness as function of the sputtering time and their influence on the statements about the depth profiles obtained.  相似文献   
16.
B‐doped Si multiple delta‐layers (MDL) were developed as certified reference materials (CRM) for secondary ion mass spectrometry (SIMS) depth profiling analysis. Two CRMs with different delta‐layer spacing were grown by ion beam sputter deposition (IBSD). The nominal spacing of the MDL for shallow junction analysis is 10 nm and that for high energy SIMS is 50 nm. The total thickness of the film was certified by high resolution transmission electron microscopy (HR‐TEM). The B‐doped Si MDLs can be used to evaluate SIMS depth resolution and to calibrate the depth scale. A consistency check of the calibration of stylus profilometers for measurement of sputter depth is another possible application. The crater depths measured by a stylus profilometer showed a good linear relationship with the thickness measured from SIMS profiling using the calibrated film thickness for depth scale calibration. The sputtering rate of the amorphous Si thin film grown by sputter deposition was found to be the same as that of the crystalline Si substrate, which means that the sputtering rate measured with these CRMs can be applied to a real analysis of crystalline Si. Copyright © 2005 John Wiley & Sons, Ltd.  相似文献   
17.
大口径光学元件波前调制PSD模拟分析   总被引:1,自引:1,他引:1       下载免费PDF全文
 使用PSD作为大口径光学元件表面加工质量的评价参数,针对不同的波前调制进行了初步的模拟计算,得到了不同调制频率和不同调制深度情况下的PSD曲线变化情况。当调制频率不同时,PSD曲线的突变部分会发生相应的频移,调制频率高则突变发生在空间频率较高的频段,同时PSD峰值不变。相对应调制深度不同时,PSD曲线的突变部份峰值发生变化,调制深度大则峰值大,与此同时峰值出现的位置不会发生变化。计算和分析结果表明PSD分析结果能够在频率域反应出元件表面受到的不同程度的调制信息。  相似文献   
18.
The increased demand for sustainability requires, among others, the development of new materials with enhanced corrosion resistance. Transition metal diborides are exceptional candidates, as they exhibit fascinating mechanical and thermal properties. However, at elevated temperatures and oxidizing atmospheres, their use is limited due to the fact of their inadequate oxidation resistance. Recently, it was found that chromium diboride doped with silicon can overcome this limitation. Further improvement of this protective coating requires detailed knowledge regarding the composition of the forming oxide layer and the change in the composition of the remaining thin film. In this work, an analytical method for the quantitative measurement of depth profiles without using matrix-matched reference materials was developed. Using this approach, based on the recently introduced online-LASIL technique, it was possible to achieve a depth resolution of 240 nm. A further decrease in the ablation rate is possible but demands a more sensitive detection of silicon. Two chromium diboride samples with different Si contents suffering an oxidation treatment were used to demonstrate the capabilities of this technique. The concentration profiles resembled the pathway of the formed oxidation layers as monitored with transmission electron microscopy. The stoichiometry of the oxidation layers differed strongly between the samples, suggesting different processes were taking place. The validity of the LASIL results was cross-checked with several other analytical techniques.  相似文献   
19.
使用多层空间光调制器的压缩光场(compressive light field,CLF) 显示技术具有空间带宽利用率高、图像分辨率好等优势,是一种很有前景的光场显示技术。传统的方法将光场分解视为超定问题并使用优化算法求解。随着重建光场的分辨率、深度、视角等性能参数的提升,优化算法的计算效率低、内存消耗大的缺陷被放大,难以实现快速计算。为此,本文提出了一种新型CLF分解算法,该算法将原始光场分解为物点进行存储,仅占用少量内存;利用深度权重和加权平均代替了优化算法,大幅提高了运算效率。在同等条件下,所提出的算法占用内存仅是传统方法的38.8%,计算时间缩短了93.7%,图像质量提高约1 dB。最后通过仿真和实验两种方式对比了该方法和传统方法的显示效果,验证了算法的有效性。  相似文献   
20.
相位生成载波(Phase Generated Carrier, PGC)解调算法是目前光纤干涉传感领域中重要的解调算法。针对目前PGC解调算法中光强扰动和调制深度影响信号解调准确度的问题,提出了一种改进的PGC解调算法(PGC-Ameliorated),并搭建了基于分布反馈(Distributed Feedback, DFB)激光器的振动传感系统进行实验验证。实验结果表明,当被测振动信号的频率为800 Hz时,该算法信噪比为57 dB,优于微分交叉相乘(Differential and Cross Multiplying, DCM)算法和反正切(Arctan)算法近20 dB。在不同光强下,该算法解调信号幅值波动范围在±0.02 rad;在不同调制深度下,该算法总谐波失真最小为0.61%,信纳比最大为25.9 dB,相比于DCM算法和Arctan算法具有更低的总谐波失真和更高的信纳比。  相似文献   
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