某接收机测试台系统设计

介绍某接收机测试台设计方案、主要技术特点及实现方法。     

微型热驱动热声热机热端换热器的优化设计

该文基于热声环境,采用厘米级扁管和deltaE数值计算对微型热声换热器进行了优化设计。     

计算器时钟切换及自动关断电路的分析与改进

时钟切换和自动关断是新一代计算器集成电路档器芯片快慢时钟切换电路,详细分析了计算器的两种关断途径,在此基础上设计了一种新的关断电路.给出了这两种电路的仿真结果,证明了改进电路的正确性和高效性.     

退火温度对Fe基纳米晶粉芯磁致频移特性影响的研究

研究了充有不同温度退火Fe基纳米晶粉芯LC回路的磁致频移特性（MFS），发现充有不同温度退火Fe基纳米晶粉芯LC回路的磁致频移不同，充有经600℃退火Fe基纳米晶粉芯LC回路的磁致频移最灵敏。     

CAD8903机芯的视频音频转换电路设计

本文概要介绍了CAD 8903机芯采用国产集成电路CD7680,CD74211,DG4053实现音频、视频切换功能的电路,并对CD7680中音频信号处理电路的特殊用法进行了说明。     

电流模式n阶传输函数的OA-OTA实现

提出了一种新的实现任意 n阶电流模式传输函数的网络结构。该电路仅含运算放大器 (OA)和运算跨导放大器 (OTA)有源器件 ,因而适于全集成。适当设置 OTA的跨导值能实现任意高阶传输函数 ,且传输函数的系数可独立调整。文中推导了滤波器的设计公式 ,并给出了截止频率为 1 0 0 k Hz的三阶巴特沃斯低通滤波器实例 ,PSPICE仿真结果表明所提电路及设计公式是正确的     

微波BJT超宽带低噪声放大器的设计

本文给出了一种频带覆盖达１０－１６００ＭＨｚ的微波ＢＪＴ超宽带低噪声放大器的设计方法，从微波ＢＪＴ的噪声模型出发，通过拟合５０Ω源阻抗下微波ＢＪＴ的噪声系数ＮＦ５０和Ｓ参数来提取其噪声参数，然后根据增益，噪声及驻波比要求优化设计放大器，使放大器在超宽带范围内获得平坦增益和低噪声，本文所给出的微波ＢＪＴ惨数提取及放大器优化设计方法已由实验结果所验证。     

Trade-off analysis on cost and manufacturing technology of an electronic product: Case study

A trade-off analysis on the cost and system packaging metrics of an electronic product aimed at the commercial/retail industry has been carried out. By comparing the system cost and packaging metrics with those of comparable consumer products, we have determined that there is opportunity for significant cost, size, and weight reduction of the overall electronics packaging system. These include the use of fine pitch IC packages, smaller discrete components, denser PCB wiring technology, double sided IC package surface mount, surface mount connectors, and improved plastics for the product housing. The analysis concluded that PCB area reduction of 40%, using a single PCB instead of three boards, reduction in board cost of over 50% and product weight reduction of over 28% are possible using available technologies.     

RF电路瞬态包络分析算法研究

瞬态包络分析算法是一种快速有效的仿真算法，被广泛应用于RF电路仿真中，文章主要研究了基于打靶法的瞬态包络分析算法－采样包络算法，并给出了该算法的具体流程和计算机实现结果。     

Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme

Pseudo-random testing techniques for mixed-signal circuits offer several advantages compared to explicit time-domain and frequency-domain test methods, especially in a BIST structure. To fully exploit these advantages a suitable choice of the pseudo-random input parameters should be done and an investigation on the accuracy of the circuit response samples needed to reduce the risk of misclassification should be carried out. Here these issues have been addressed for a testing scheme based on the estimation of the impulse response of the device under test (DUT) by means of input-output cross-correlation. Moreover, new acceptance criteria for the DUT are suggested which solve some ambiguity problems arising if the classification of the DUT as good or bad is based on a few samples of the cross-correlation function. Examples of application of the proposed techniques to real cases are also shown in order to assess the impact of the measurement system inaccuracies on the reliability of the test.