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11.
A. Ulyanenkov 《Applied Surface Science》2006,253(1):106-111
Several novel methods for evaluation and interpretation of X-ray data from modern nanostructures are presented along with their applications. The background of methods and their relations to fundamental problems of X-ray analysis is shortly described. The key features of LEPTOS software, which is designed for the analysis of X-ray data measured with various geometries and setups and implements all discussed techniques, are discussed. 相似文献
12.
Adhesion of zein to solid substrates has been studied using surface energy profiles as indices and by adhesion mapping using
atomic force microscopy (AFM). Different plasticizers like glycerol and sorbitol have been used to form mixed films with zein
and properties of these films are studied using surface energy profiles. Comparison of the results from the different mixed
samples with those from the pure zein films showed that force mapping could identify areas rich in protein. The adhesion maps
produced were deconvoluted from sample topography and contrasted with the data obtained from contact angle measurements. A
comparison of the two methods shows that the extent of contact angle hysteresis is indicative of both hydrophobicity of the
surface as well as the force of adhesion. Mechanical properties and microstructure of zein films prepared by casting from
solutions and using Langmuir-Blodgett film technique have been investigated. Pure zein seemed brittle and exhibited an essentially
linear relationship between stress and strain. Films with plasticizer were tougher than these films. In general, mixed films
showed better mechanical properties than pure films and had higher ultimate tensile strength and increased per cent elongation.
Further, the mixed films of zein showed a higher force of adhesion compared to the pure films. 相似文献
13.
14.
P. C. Chen 《中国化学会会志》1995,42(5):755-760
Three ab initio calculations (HF/6-3IG, HF/6-3IG*, and HF/6-3IG**) on 2,4,6-trinitrotoluene were made, The results compare well with xray data, except dihedral angles of NO2 relative to the plane of the benzene ring. The deviations are attributed to packing forces and steric effects in the crystal. The most stable structure was a torsional angle 10° of the methyl top with the benzene ring, unlike toluene. The rotational barriers of the methyl top and the 4-nitro group are small. Hydrogen bonding, dipole moments and total atomic charges arc calculated. 相似文献
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16.
激光标线的原理和实验 总被引:1,自引:1,他引:0
根据几何光学知识分析了激光标线原理.理论和实验表明:激光标线长度与激光光束形状、光学元件形状及材料折射率有关.并讨论了激光标线向两侧扩展的原因. 相似文献
17.
X-ray reflectivity (XRR), X-ray fluorescence (XRF) and small angle X-ray scattering (SAXS) techniques are used to the monitoring of Cu/porous low κ processes, which are developed for the next generation (≤65 nm) integrated circuits. Sensitivity of XRR and XRF is sufficient to detect drifts of the copper barrier layer, copper seed layer and Cu CMP (chemical-mechanical polishing) processes. Their metrology key parameters comply with production requirements. SAXS allows determining the pore structure of low κ films: average pore size and pore size distribution. 相似文献
18.
Chen-Cheng Sun Shih-Chin Lee Yaw-Shyan Fu Yu-Hwe Lee 《Applied Surface Science》2006,252(23):8295-8300
CrNx thin films have attracted much attention for semiconductor IC packaging molding dies and forming tools due to their excellent hardness, thermal stability and non-sticking properties (low surface free energy). However, few data has been published on the surface free energy (SFE) of CrNx films at temperatures in the range 20-170 °C. In this study CrNx thin films with CrN, Cr(N), Cr2N (and mixture of these phases) were prepared using closed field unbalanced magnetron sputtering at a wide range of Cr+2 emission intensity. The contact angles of water, di-iodomethane and ethylene glycol on the coated surfaces were measured at temperatures in the range 20-170 °C using a Dataphysics OCA-20 contact angle analyzer. The surface free energy of the CrNx films and their components (e.g., dispersion, polar) were calculated using the Owens-Wendt geometric mean approach. The influences of CrNx film surface roughness and microstructure on the surface free energy were investigated by atomic force microscopy (AFM) and X-ray diffraction (XRD), respectively. The experimental results showed that the lowest total SFE was obtained corresponding to CrN at temperature in 20 °C. This is lower than that of Cr(N), Cr2N (and mixture of these phases). The total SFE, dispersive SFE and polar SFE of CrNx films decreased with increasing surface temperature. The film roughness has an obvious effect on the SFE and there is tendency for the SFE to increase with increasing film surface roughness. 相似文献
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20.
N[a,b]类中边界Nevanlinna-Pick插值(I) 总被引:1,自引:1,他引:0
用所谓的Hankel向量方法求解N[a,b]函数类中带边界插值数据的Nevanlina-Pick插值(BNP(N[a,b]))问题,并建立BNP(N[a,b])问题与[a,b]上的某种带约束条件的Hausdorff矩量问题之间等价的可解条件以及解之间明确的一一对应关系.这使得当BNP(N[a,b])问题有多解时,能通过带约束条件的矩量问题的可解性准则和解获得BNP(N[a,b])问题的可解性准则和解的参数化描述,而在唯一解的情况下,通过BNP(N[a,b])问题解的存在唯一性准则和唯一解来获得带约束条件的 相似文献