圆感应同步器数显表检测方法研究

介绍了圆感应同步器数显表测角系统的工作原理,以及在静态和动态测角方法。提出了两种提高动态测量精度的方法。实验数据验证了方法的合理性。     

Extension of the range of resonator scanning spectrometer into submillimeter band and some perspectives of its further developments

Extension of the working frequency of modern resonator spectrometers into submillimeter wave range is described. Experimental record of atmospheric absorption spectrum covering 45-370 GHz range is demonstrated for the first time, and measured water vapor J′_{ka′, kc′}-J_{ka, kc} = 5_1,5-4_2,2 at 325 GHz line parameters are presented. For the first time pressure lineshift for the 325-GHz water vapor line is measured. Further extension of working range is discussed. New estimations of physical limits of time needed for measurements of absorption in the whole Backward Wave Oscillator (BWO) range are given for phase continuous synthesizer regime. Basic schemes of fast broadband continuous phase synthesized sources are discussed. Verification of the previous measurements of water vapor 3_1,3-2_2,0 at 183 GHz line parameters is presented. Comparisons with ringdown resonator spectrometers are given.     

A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy

An apparatus has been designed and implemented to measure the elastic tensile properties (Young's modulus and tensile strength) of surface micromachined polysilicon specimens. The tensile specimens are “dog-bone” shaped ending in a large “paddle” for convenient electrostatic or, in the improved apparatus, ultraviolet (UV) light curable adhesive gripping deposited with electrostatically controlled manipulation. The typical test section of the specimens is 400 μm long with 2 μm×50 μm cross section. The new device supports a nanomechanics method developed in our laboratory to acquire surface topologies of deforming specimens by means of Atomic Force Microscopy (AFM) to determine (fields of) strains via Digital Image Correlation (DIC). With this tool, high strength or non-linearly behaving materials can be tested under different environmental conditions by measuring the strains directly on the surface of the film with nanometer resolution.     

WDM光环形网络保护及实现方法

提出了WDM环形网络的几种保护方案,分析了利用1:1环路配置方式进行WDM光环形网络保护的实现方法,简单介绍APS在环保护中的应用。     

从江苏苏南数字微波线路看广播电视专用网发展前景

新建微波干线电路采用高质量的数字微波设备是广电部科技工作会议的精神之一。本文介绍了江苏苏南数字微波线路，并从方案确定、技术实现、设备选型等方面进行分析比较，从而得到一个合理的整体方案。本文还着重阐述了数字传输的关键设备－编码器的现状与发展趋势，提出广播电视专用网多功能应用的设想。     

我国有线电视事业的现状和发展

本文详细系统地介绍了我国有线是视发展历史和现状，及其经营和管理方法。重点介绍了北美的ＣＡＴＶ技术发展动向。最后，指出我国ＣＡＴＶ事业发展中的应用重视的问题。     

美国高清晰度电视的发展与现状

本文作者根据对美国高清晰度电视（ＨＤＴＶ）现状考察的情况，详细系统地介绍了美国大联盟（ＧＡ）系统的形成及关键技术的确定，使用极化方式进行ＨＤＴＶ的频率规划，普通电视采用数字压缩技术的发展状况，以及美国目前正在讨论和实验的数字显频业务。     

短毫米波和亚毫米波接收机的发展现状

本文概述了短毫米和亚毫米波接收机的发展现状，介绍了接收机的重要组成部件：混频器、振荡器和放大器的发展水平以及毫米波单片集成电路的现状，给出了接收机的最新性能指标。     

任意型一维FIR数字滤波器设计新方法

本文介绍了一种设计任意型（宽带、窄带、低阶、高阶、低通、高通、带通、带阻）一维FIR数字滤波器新方法．给出设计不同类型滤波器的统一方法。各种类型滤波器脉冲响应的设计公式简单、计算方便。该方法消除了Gibbs现象．不仅克服了优化设计中收敛速度、设计精度及初值选取等问题，而且减少设计高阶滤波器的时间。最后，本文给出了各种类型滤波器设计的仿真结果。     

Energy minimization and design for testability

The problem of fault detection in general combinational circuits is NP-complete. The only previous result on identifying easily testable circuits is due to Fujiwara who gave a polynomial time algorithm for detecting any single stuck fault inK-bounded circuits. Such circuits may only contain logic blocks with no more thanK input lines and the blocks are so connected that there is no reconvergent fanout among them. We introduce a new class of combinational circuits called the (k, K)-circuits and present a polynomial time algorithm to detect any single or multiple stuck fault in such circuits. We represent the circuit as an undirected graphG with a vertex for each gate and an edge between a pair of vertices whenever the corresponding gates have a connection. For a (k, K)-circuit,G is a subgraph of ak-tree, which, by definition, cannot have a clique of size greater thank+1. Basically, this is a restriction on gate interconnections rather than on the function of gates comprising the circuit. The (k, K)-circuits are a generalization of Fujiwara'sK-bounded circuits. Using the bidirectional neural network model of the circuit and the energy function minimization formulation of the fault detection problem, we present a test generation algorithm for single and multiple faults in (k, K)-circuits. This polynomial time aggorithm minimizes the energy function by recursively eliminating the variables.