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941.
Desorption/ionization on porous silicon (DIOS) is a very useful technique in the case of small molecular weight compounds, compared to the matrix-assisted laser desorption ionization (MALDI). This is because MALDI generates matrix-related ions that overlap with the mass range of interest. The aim of our work was to investigate the suitability of the DIOS technique in the case of fatty acids in negative ion mode. The analysis of the chosen fatty acid models, nonadecanoic acid (C(19)H(38)O(2)) and heneicosanoic acid (C(21)H(42)O(2)), gave rise to the observation of the deprotonated monomeric species and selective cationized multimeric species. This cation selectivity was further elucidated by complementary studies based on the addition of various metals such as Ag(I), Zn(II), Fe(II), and also Cu(II). Specific behavior, depending upon the introduced metal, was highlighted by different redox reaction processes and also metastable decompositions (in PSD mode). 相似文献
942.
El-Khouly ME Kang ES Kay KY Choi CS Aaraki Y Ito O 《Chemistry (Weinheim an der Bergstrasse, Germany)》2007,13(10):2854-2863
Silicon-phthalocyanine-cored fullerodendrimers with up to eight fullerene substituents (SiPc-n C(60); n=2, 4, and 8) have been synthesized. Photophysical properties of newly synthesized SiPc-n C(60) have been investigated by time-resolved fluorescence and transient absorption analysis with pulsed laser light. Laser photolysis measurements suggest the occurrence of a charge-separation process from (1)SiPc* to the C(60) subunits. The nanosecond transient absorption spectra in the near-IR region indicate that the lifetimes of the formed radical ion pairs are prolonged on the order of SiPc-8 C(60)>SiPc-4 C(60)>SiPc-2 C(60), which may be related to the electron migration among the C(60) subunits. The usefulness of SiPc-n C(60) as light-harvesting systems, evaluated as a ratio of the rates of charge recombination to those of charge separation, increases markedly with the dendrimer generation. 相似文献
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944.
945.
单晶硅是Eg为1.1eV的间接带隙半导体材料,在可见光区不发光,不能应用于光电子领域.但是,Canham 1990年首次发现[1],适当条件下形成的多孔硅在室温下就可发出强度能与Ⅲ-Ⅴ族半导体发光二极管相媲美的可见光。 相似文献
946.
947.
针对Si,GaAs半导体晶片中金属杂质玷污的问题,本文提出了紫外光致荧光谱的检测方法。常温下,晶片中的Fe,Ni杂质玷污可产生紫外特征荧光峰。这种新的检测方法是非破坏性的,并适用于φ76.2mm,φ100mm大圆片的直接检验,而且具有较高的检测灵敏度。 相似文献
948.
生物活性含硅有机锡化合物的研究 总被引:12,自引:0,他引:12
对近年来含硅有机锡化合物的进展进行了综述,结构和活性关系的研究表明化合物的生物活性主要取决于硅原子上的取代基,生物活性大小顺序为:(Me3SiCH2)3SnY>>(PhMe2SiCH2)3SnY>(Ph2MeSiCH2)3SnY,(PhCH2Me2SiCH2)3SnY. 相似文献
949.
Joerg Isenberg Wilhelm Warta 《Progress in Photovoltaics: Research and Applications》2004,12(5):339-353
The principles of a recently introduced measurement technique for power losses in solar cells, illuminated lock‐in thermography (ILT), are reviewed. The main advantage of ILT over dark lock‐in Thermography (DLT) is measurement under realistic operational conditions of solar cells. The main focus of this paper is to demonstrate the wide range of applications of ILT in identifying the causes of power losses in solar cells. For this purpose different evaluation methods are presented. A method for the evaluation of improvement potentials within a given cell technology is demonstrated. It is shown that different types of series resistance may be localized. Small areas of recombination losses (e.g., grain boundaries) can routinely be detected, which is not possible in dark lock‐in thermography. Good correspondence with light‐beam‐induced current images is found. A realistic evaluation of the impact of recombination losses on solar cell performance is demonstrated on two examples. Finally, process‐ or treatment‐induced recombination losses are investigated. In summary ILT is shown to be an extremely powerful tool in localizing, identifying and quantifying power losses of solar cells under realistic illumination conditions. Copyright © 2004 John Wiley & Sons, Ltd. 相似文献
950.
L. J. Geerligs D. Macdonald 《Progress in Photovoltaics: Research and Applications》2004,12(4):309-316
The optimisation of base doping for industrial crystalline silicon solar cells is examined with model calculations. Focus is on the relation between base doping and carrier recombination through the important impurities interstitial iron (Fei) and the metastable boron–oxygen (BO) complex. In p‐type silicon, the optimum base resistivity is strongly dependent on defect concentration. In n‐type silicon, recombination due to Fei is much lower and nearly independent of resistivity. Fei is likely representative for other transition metal impurities. In many real cells a balance between Fei or similar defects, and BO will occur. Copyright © 2004 John Wiley & Sons, Ltd. 相似文献