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41.
分析了α-Si∶H薄膜的质量和厚度对α-Si∶HTFT关键性指标的影响,深入、详细地讨论了其PECVD淀积工艺,并在实验的基础上确定了最佳淀积工艺参数,从而获得了高性能的75mm372×276像素α-Si∶HTFT有源矩阵  相似文献   
42.
An in‐line monitoring device using a quartz crystal resonator for thin film polymerization was proposed, and its performance has been evaluated by implementing in the UV polymerization of 2‐hydroxyethyl methacrylate with a photoinitiator of 1‐chloroanthraquinone. Because the variation of resonant resistance of the resonator is proportional to the square root of viscosity change that is closely related to the polymerization degree, the resistance can be used as a measure of the polymerization degree. The resistance measurements were compared with the outcome of instrumental analyses of polymerization degree using an FTIR spectrometer and a gel permeation chromatograph. The experimental results showed that the resistance measurements were consistent with the experimental outcome of the instrumental analyses, and this indicates the effectiveness of the proposed device. Owing to the simplicity and availability of the resonator system, its wide utilization in the monitoring of a variety of film polymerization processes, including photoresistor application, is expected. © 2006 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 44: 2428–2439, 2006  相似文献   
43.
A differential AC-chip calorimeter capable of measuring the step in heat capacity at the glass transition in nanometer-thin films is described. Because of the differential setup, pJ/K sensitivity is achieved. Heat capacity can be measured for sample masses below 1 ng in broad temperature range as needed for the study of the glass transition in nanometer-thin polymeric films. Relative accuracy is sufficient to investigate the changes in heat capacity as the step at the glass transition of polystyrene. The step is about 25% of the total heat capacity of polystyrene. The calorimeter allows for the frequency dependent measurement of complex heat capacity in the frequency range from 1 Hz to 1 kHz. The glass transition in thin polystyrene films (50–4 nm) was determined at well-defined experimental time scales. No thickness dependency of the glass transition temperature was observed within the error limits (±3 K)—neither at constant frequency (40 Hz) nor for the trace in the activation diagram (1 Hz–1 kHz). © 2006 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 44: 2996–3005, 2006  相似文献   
44.
Tetraethoxysilane (TEOS) and polyethoxysiloxanes (PEOSs; prepared by the acid‐catalyzed hydrolytic polycondensation of TEOS) were subjected to the sol–gel process in the presence of cetyltrimethylammonium bromide (CTAB), respectively. The PEOSs with Mw 700–26,000, as prepared by sol–gel coating of TEOS and PEOS under various conditions, were used. Uniform and crack‐free thin films of thickness 276–613 nm were prepared by spin‐coating of a PEOS solution containing CTAB. When the coating films were sintered at 400 °C, the combustion of ethoxy groups and CTAB took place to provide porous silica thin films. The structure of the thin films was found to be dependent on the molecular weight of PEOS and the molar ratio of CTAB/Si: lamellar or hexagonal phase was observed for Mw less than 15,000 and for CTAB/Si molar ratios greater than 0.10. Honeycomb structures were observed for Mw less than 5000 and for CTAB/Si molar ratios of 0.15. The honeycomb structure was also observed by atomic force microscopy and transmission electron microscope. © 2006 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 44: 2542–2550, 2006  相似文献   
45.
Films of piezoelectric PVDF and P(VDF‐TrFE) were exposed to vacuum UV (115–300 nm VUV) and γ‐radiation to investigate how these two forms of radiation affect the chemical, morphological, and piezoelectric properties of the polymers. The extent of crosslinking was almost identical in both polymers after γ‐irradiation, but surprisingly, was significantly higher for the TrFE copolymer after VUV‐irradiation. Changes in the melting behavior were also more significant in the TrFE copolymer after VUV‐irradiation due to both surface and bulk crosslinking, compared with only surface crosslinking for the PVDF films. The piezoelectric properties (measured using d33 piezoelectric coefficients and D‐E hysteresis loops) were unchanged in the PVDF homopolymer, while the TrFE copolymer exhibited more narrow D‐E loops after exposure to either γ‐ or VUV‐radiation. The more severe damage to the TrFE copolymer in comparison with the PVDF homopolymer after VUV‐irradiation is explained by different energy deposition characteristics. The short wavelength, highly energetic photons are undoubtedly absorbed in the surface layers of both polymers, and we propose that while the longer wavelength components of the VUV‐radiation are absorbed by the bulk of the TrFE copolymer causing crosslinking, they are transmitted harmlessly in the PVDF homopolymer. © 2006 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 44: 3253–3264, 2006  相似文献   
46.
本文研究了SiH4—O2体系LPCVDSiO2的工艺及设备。为了得到厚度均匀性好的薄膜,改进了反应气体的进气方式和装片舟的结构,获得了每炉100片、直径为100mm的硅片的膜厚不均匀性≤士5%的结果。  相似文献   
47.
“双驱动足”回转式压电马达初步研究   总被引:7,自引:6,他引:1  
提出一种“双驱动足”回转式压电马达,分析了其工作原理,并根据工作原理,设计,研制了样机,进行了初步的试验研究,证明工作原理基本正确,为今后进一步研究提供了参考依据。  相似文献   
48.
钢铁表面锌系磷化膜的研究   总被引:3,自引:0,他引:3  
本文采用SEM和TEM等测试手段,研究了四功能处理液不同条件下在钢铁表面上形成锌系磷化膜的形貌,晶体结构;采用EDS研究了磷化膜的化学成发,通过实验确定了Zn/P值在2.12~3.20时,磷化膜具有良好的耐蚀性。  相似文献   
49.
四元缔合物体系薄层树脂相分离与光度法联用测定痕量钴   总被引:2,自引:0,他引:2  
提出了在酸性条件下 (pH=5.0),利用阳离子交换树脂-丁二酮肟-碘-钴四元体系,通过薄层树脂相光度法测定钴的新方法。本法灵敏度高 (e454=1.7105L/molcm),比水相光度法提高14倍,精密度理想 (测定2.0礸/ml Co(II) 6次,RSD=1.3%),选择性好。实测药品VB12及天然水中钴,线性范围0.024~2.0礸/ml (定容50ml),检出限10.4ng/ml。  相似文献   
50.
The determination of zinc ion (1-60 ng ml−1) by anodic square-wave stripping voltammetry on an anion-exchange perfluorinated polymer Tosflex mercury film electrodes (TMFE) was evaluated. The detection limit was 0.1 ng ml−1 Zn(II). The effect of various organic compounds (gelatin, albumin, starch, camphor, humic acid, Triton X-100, sodium dodecyl sulfate (SDS) and cetyltrimethylammonium bromide (CTAB)) is explored. The results indicate that due to the size-exclusion and ion-exchange properties of Tosflex film, the TMFE is considerably more resistant to organic interference than the bare mercury film electrode.  相似文献   
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