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61.
A new ordered structure of the C60 derivative PCBM ([6‐6]‐phenyl C61‐butyric acid methyl ester) is obtained in thin films based on the blend PCBM:regioregular P3HT (poly(3‐hexylthiophene)). Rapid formation of needlelike crystalline PCBM structures of a few micrometers up to 100 μm in size is demonstrated by submitting the blended thin films to an appropriate thermal treatment. These structures can grow out to a 2D network of PCBM needles and, in specific cases, to spectacular PCBM fans. Key parameters to tune the dimensions and spatial distribution of the PCBM needles are blend ratio and annealing conditions. The as‐obtained blended films and crystals are probed using atomic force microscopy, transmission electron microscopy, selected area electron diffraction, optical microscopy, and confocal fluorescence microscopy. Based on the analytical results, the growth mechanism of the PCBM structures within the film is described in terms of diffusion of PCBM towards the PCBM crystals, leaving highly crystalline P3HT behind in the surrounding matrix.  相似文献   
62.
The properties of organic‐semiconductor/insulator (O/I) interfaces are critically important to the operation of organic thin‐film transistors (OTFTs) currently being developed for printed flexible electronics. Here we report striking observations of structural defects and correlated electrostatic‐potential variations at the interface between the benchmark organic semiconductor pentacene and a common insulator, silicon dioxide. Using an unconventional mode of lateral force microscopy, we generate high‐contrast images of the grain‐boundary (GB) network in the first pentacene monolayer. Concurrent imaging by Kelvin probe force microscopy reveals localized surface‐potential wells at the GBs, indicating that GBs will serve as charge‐carrier (hole) traps. Scanning probe microscopy and chemical etching also demonstrate that slightly thicker pentacene films have domains with high line‐dislocation densities. These domains produce significant changes in surface potential across the film. The correlation of structural and electrostatic complexity at O/I interfaces has important implications for understanding electrical transport in OTFTs and for defining strategies to improve device performance.  相似文献   
63.
We present the optimization and characterization of heterojunction solar cells consisting of an amorphous silicon emitter, a single crystalline absorber and an amorphous silicon rear side which causes the formation of a back surface field (a‐Si:H/c‐Si/a‐Si:H). The solar cells were processed at temperatures <220°C. An optimum of the gas phase doping concentration of the a‐Si:H layers was found. For high gas phase doping concentrations, recombination via defects located at or nearby the interface leads to a decrease in solar cell efficiency. We achieved efficiencies >17% on p‐type c‐Si absorbers and >17·5% on n‐type absorbers. In contrast to the approach of Sanyo, no additional intrinsic a‐Si:H layers between the substrate and the doped a‐Si:H layers were inserted. Copyright © 2006 John Wiley & Sons, Ltd.  相似文献   
64.
We present a comprehensive summary of our observations of metal‐rich particles in multicrystalline silicon (mc‐Si) solar cell materials from multiple vendors, including directionally‐solidified ingot‐grown, sheet, and ribbon, as well as multicrystalline float zone materials contaminated during growth. In each material, the elemental nature, chemical states, and distributions of metal‐rich particles are assessed by synchrotron‐based analytical x‐ray microprobe techniques. Certain universal physical principles appear to govern the behavior of metals in nearly all materials: (a) Two types of metal‐rich particles can be observed (metal silicide nanoprecipitates and metal‐rich inclusions up to tens of microns in size, frequently oxidized), (b) spatial distributions of individual elements strongly depend on their solubility and diffusivity, and (c) strong interactions exist between metals and certain types of structural defects. Differences in the distribution and elemental nature of metal contamination between different mc‐Si materials can largely be explained by variations in crystal growth parameters, structural defect types, and contamination sources. Copyright © 2006 John Wiley & Sons, Ltd.  相似文献   
65.
随着遥感技术的不断发展和进步,人们对遥感观测仪器精度的要求也越来越高,而对仪器进行响应度定标是提高观测仪器输入、输出精度的重要保证。主要介绍了一种利用光谱辐射计传递实现太阳辐射计实验室定标的方法,这种方法能够比较精确地对太阳辐射计进行有效的定标,得到精确的响应度比例系数,同时定标原理简单,定标方法十分方便,便于在实验室中进行。  相似文献   
66.
在掺杂P室采用甚高频等离子体增强化学气相沉积(VHF—PECVD)技术,制备了不同硅烷浓度条件下的本征微晶硅薄膜.对薄膜电学特性和结构特性的测试结果分析表明:随硅烷浓度的增加,材料的光敏性先略微降低后提高,而晶化率的变化趋势与之相反;X射线衍射(xRD)测试表明材料具有(220)择优晶向.在P腔室中用VHF—PECVD方法制备单结微晶硅太阳能电池的i层和p层,其光电转换效率为4.7%,非晶硅/微晶硅叠层电池(底电池的p层和i层在P室沉积)的效率达8.5%.  相似文献   
67.
Substrate configuration allows for the deposition of thin film silicon (Si) solar cells on non‐transparent substrates such as plastic sheets or metallic foils. In this work, we develop processes compatible with low Tg plastics. The amorphous Si (a‐Si:H) and microcrystalline Si (µc‐Si:H) films are deposited by plasma enhanced chemical vapour deposition, at very high excitation frequencies (VHF‐PECVD). We investigate the optical behaviour of single and triple junction devices prepared with different back and front contacts. The back contact consists either of a 2D periodic grid with moderate slope, or of low pressure CVD (LP‐CVD) ZnO with random pyramids of various sizes. The front contacts are either a 70 nm thick, nominally flat ITO or a rough 2 µm thick LP‐CVD ZnO. We observe that, for a‐Si:H, the cell performance depends critically on the combination of thin flat or thick rough front TCOs and the back contact. Indeed, for a‐Si:H, a thick LP‐CVD ZnO front contact provides more light trapping on the 2D periodic substrate. Then, we investigate the influence of the thick and thin TCOs in conjunction with thick absorbers (µc‐Si:H). Because of the different nature of the optical systems (thick against thin absorber layer), the antireflection effect of ITO becomes more effective and the structure with the flat TCO provides as much light trapping as the rough LP‐CVD ZnO. Finally, the conformality of the layers is investigated and guidelines are given to understand the effectiveness of the light trapping in devices deposited on periodic gratings. Copyright © 2008 John Wiley & Sons, Ltd.  相似文献   
68.
为了得到激光光束的某些参量,为设计和改进激光器提供依据,建立了一套激光光斑自动采集与分析系统,搭建了实验平台,并编写了一套基于虚拟仪器开发平台LabVIEW及其图像处理软件包NI Vision的用于采集和分析激光光斑的软件。该软件能实时显示光斑中心位置的漂移轨迹、在x方向和y方向漂移的标准差及其随时间变化的趋势等,同时,还能对基模高斯光束进行分析。经过去噪处理的光斑图样能以3维灰度图的形式显示出来,得到任意剖面的光强信息,并以此进行高斯曲线拟合,得出拟合参量以判断光强曲线接近高斯曲线的程度。结果表明,这种系统可以动态地采集光斑信息并进行处理,具有实时性。  相似文献   
69.
This work presents a low temperature with high resolution capability UV-patternable polymer, i.e. mr-UVCur06, for use as a gate insulator in OTFTs, by investigating the morphology transformation of pentacene deposited on the mr-UVCur06. The device structure is polyethylene terephthalate (PET)/indium-tin oxide (ITO)/mr-UVCur06/pentacene/Au (source/drain). In addition to its solution-processable capability, mr-UVCur06 is directly patterned by UV light in a low-temperature process. UV/ozone post-treatment of the patternable mr-UVCur06 can illuminate organic contaminants from its surface and increases surface energy. Experimental results indicate that a high surface energy existing at the mr-UVCur06 surface has produced in a larger ratio of Ithin film phase/Itriclinic bulk phase in pentacene. Then, the distance of pentacene molecular crystal structure, which is arranged in the thin film phase, is shorter than that in triclinic bulk phase. The performance of pentacene-based OTFTs can be enhanced with few contaminants and a high surface energy on the UV-patternable gate insulator. By performing UV/ozone post-treatment on the mr-UVCur06 insulator surface for 60 s, the OTFTs demonstrate a mobility, on/off drain current ratio, and VT of 0.34 cm2/V s, 5.5 × 104, and 2.5 V, respectively. Furthermore, the low-temperature photopatternable polymer dielectric paves the way for a relatively easy and low-cost fabrication of an OTFT array without expensive and complicated photolithography and dry etching.  相似文献   
70.
This article addresses the most challenging question facing the organic spintronics community today – what causes the universal loss of Giant Magnetoresistance (GMR) signal in organic spin valve devices made with different spin-polarized electrodes and organic semiconductor spacers? Careful analysis of our own and other experimental results available in literature indicate that transition of transport from polaron tunneling limit (suggested by the variable range hopping model) to thermally activated hopping limit (in the temperature range of 40–58 K) marks the most significant decrease of spin relaxation in organic semiconductors. With increasing occupancy of the available hopping sites by the thermally activated carriers, chances of spin flip inside the organic semiconductors increases significantly causing fast spin relaxation in the spin-valves.  相似文献   
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