首页 | 本学科首页   官方微博 | 高级检索  
文章检索
  按 检索   检索词:      
出版年份:   被引次数:   他引次数: 提示:输入*表示无穷大
  收费全文   45篇
  免费   2篇
化学   6篇
物理学   24篇
无线电   17篇
  2021年   1篇
  2019年   1篇
  2018年   1篇
  2016年   1篇
  2015年   2篇
  2014年   2篇
  2013年   2篇
  2011年   5篇
  2010年   1篇
  2009年   4篇
  2008年   3篇
  2007年   6篇
  2006年   7篇
  2005年   6篇
  2004年   1篇
  2001年   1篇
  2000年   1篇
  1997年   1篇
  1996年   1篇
排序方式: 共有47条查询结果,搜索用时 343 毫秒
11.
This article focuses on ion transport through nanoporous systems with special emphasis on rectification phenomena. The effect of ion‐current rectification is observed as asymmetric current–voltage (I–V) curves, with the current recorded for one voltage polarity higher than the current recorded for the same absolute value of voltage of opposite polarity. This diode‐like I–V curve indicates that there is a preferential direction for ion flow. Experimental evidence that ion‐current rectification is inherent to asymmetric, e.g., tapered, nanoporous systems with excess surface charge is provided and discussed. The fabrication and operation of asymmetric polymer nanopores, gold nanotubes, glass nanocapillaries, and silicon nanopores are presented. The possibility of tuning the direction and extent of rectification is discussed in detail. Theoretical models that have been developed to explain the ion‐current rectification effect are also presented.  相似文献   
12.
F. Golek  P. Mazur  Z. Ryszka  S. Zuber 《Surface science》2006,600(8):1689-1696
Thin layers of alkali halides were investigated by atomic force microscope (AFM). The studied systems were: LiBr/KBr(0 0 1) with −16.7% misfit, LiF/Si(0 0 1) with +4.4% misfit, LiBr/LiF(0 0 1) with +36.8% misfit and NaCl/Si(0 0 1) with +46.5% misfit. The results show that the surface morphology strongly depends on the temperature of layer formation. The alkali halides deposited on the foreign substrate at elevated temperatures or at room temperature and subsequently annealed form preferentially 3D islands leaving uncovered substrate areas between them. It is suggested that Ostwald ripening takes place at elevated temperatures.  相似文献   
13.
Nanosphere lithography is an inexpensive method used to fabricate gold nanostructures on a substrate. Using dispersed-nanosphere lithography, in which the nanospheres are dispersed on a substrate, 2D or 3D nanostructures can be fabricated by obliquely depositing a gold film on the nanospheres and etching the gold film afterward. These nanostructures are tunable and acute, and are thus good emitting elements for the localized surface plasmon resonance applications. So far, for the fabrication of nanostructures on a substrate with dispersed nanospheres, only 2D nanostructures have been reported through perpendicular etching. We report in this paper that the 3D nanostructures fabricated by dispersed-nanosphere lithography are rigid non-conformal structures, and perpendicular gold etching can be expanded to oblique etching, which provides more possibilities for fabricating the gold nanostructures in various shapes. The profiles of gold nanostructures after several varying angle depositions, and their final profiles after perpendicular or oblique etching, are calculated in this paper. Our profile simulations are applicable for nanospheres (or microspheres) within the range of tens of nanometers to tens of micrometers, and are consistent with our fabricated nanostructures observed using scanning electron and atomic force microscopy. Electronic Supplementary Material  The online version of this article (doi:) contains supplementary material, which is available to authorized users.  相似文献   
14.
基于扫描探针显微镜的纳米加工技术研究进展   总被引:1,自引:0,他引:1  
何光宏  杨学恒 《微电子学》2005,35(2):169-173
扫描探针显微镜(SPM)纳米加工技术是当前非常活跃的纳米加工研究领域,其研究成果有可能成为微纳米器件制作的主要方法。文章主要介绍了单原子操纵、阳极氧化法,以及机械刻蚀加工等SPM纳米加工方法的机理、特点及研究进展,提出了今后需要重视的研究方向。  相似文献   
15.
One step required for the fabrication of a quantum dot array on an aluminum substrate is the preparation of a flat aluminum surface. To enable the optimization of the electropolishing procedure, atomic force microscopy was used to examine the morphology of electropolished polycrystalline aluminum surfaces that were prepared under different electropolishing conditions. The electropolishing voltage, time, and temperature were varied. Two distinctly different surface morphologies were observed for different electropolishing conditions and transitional structures were observed for intermediate conditions. It was found that the type of surface morphology and the surface roughness could be controlled primarily with the electropolishing voltage while temperature and time had relatively little effect over the range examined in this study.  相似文献   
16.
Silica capsules with hollow macroporous core–mesoporous shell (HCMS) were synthesized through template-assisted replication of submicrometer-size polystyrene spheres as templates. The silica mesoporous shell exhibited highly ordered hexagonal structure as confirmed by X-ray diffraction pattern and TEM image. The pore diameter and BET surface area of this sample were found to be 2.1 nm and 1387 m2/g, respectively.  相似文献   
17.
《Microelectronics Reliability》2014,54(9-10):1779-1784
Gallium focused ion beam (Ga-FIB) systems have been used historically in the semiconductor industry for circuit edit. Significant efforts have been invested to improve the performance of Ga-FIB. However, as the dimensions of integrated circuits continue to shrink, Ga-FIB induced processes are being driven to their physical limits. A helium ion beam offers high spatial resolution imaging as well as precise ion machining and sub-10 nm nanofabrication capabilities because the probe size can be brought to as small as 0.25 nm. However, it is limited by its relatively low material removal rate. Recently, the new Zeiss Orion-NanoFab microscope provides multiple ion beams (He, Ne and Ga as an option) into one platform and promotes the further studies of He and Ne induced deposition and etching processes to compare with a Ga ion beam. Because of the mass difference between He, Ne and Ga ions, the interactions of ions with sample surface and precursor molecules result in different sputtering rates, implantation and deposition yields. This presentation gives an overview of our current studies using this new platform to deposit or mill nanostructures for circuit edit.  相似文献   
18.
In addition to its well-known capabilities in imaging and spectroscopy, scanning near-field optical microscopy (SNOM) has recently shown its great potentials for fabricating various structures at the nanoscale. A variety of SNOM-based fabrication techniques have been developed for different applications. In this paper, the SNOM-based techniques involving three major functions: material modification, addition, and removal, are examined with emphasis on their abilities and reliability to make structures with resolutions at the nanometer level. The principles and procedures underlying each technique are presented, and the differences and uniqueness among them are subsequently discussed. Finally, concluding remarks are provided to summarize the major techniques studied and to recommend the scopes for technology improvement and future research.  相似文献   
19.
利用STM进行纳米加工的研究   总被引:1,自引:0,他引:1  
本文对空气中应用扫描隧道显微镜(STM)进行的纳米级加工进行了研究。采用石墨(HOPG)和金薄膜作为样品.通过在STM探针和样品之间施加一定的电压脉冲制造出了具有纳米级尺度的结构。本文对形成的特征结构进行了分析.总结出部分实验规律.认为电场静电力作用使STM针尖或样品产生的机械变形是特征结构形成的主要原因。  相似文献   
20.
We present a method for fabrication of nanoscale patterns in silicon nitride (SiN) using a hard chrome mask formed by metal liftoff with a negative ebeam resists (maN-2401). This approach enables fabrication of a robust etch mask without the need for exposing large areas of the sample by electron beam lithography. We demonstrate the ability to pattern structures in SiN with feature sizes as small as 50 nm. The fabricated structures exhibit straight sidewalls, excellent etch uniformity, and enable patterning of nanostructures with very high aspect ratios. We use this technique to fabricate two-dimensional photonic crystals in a SiN membrane. The photonic crystals are characterized and shown to have quality factors as high as 1460.  相似文献   
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号