Partial scan design and test sequence generation based on reduced scan shift method

This paper presents a partial scan algorithm, calledPARES (PartialscanAlgorithm based onREduced Scan shift), for designing partial scan circuits. PARES is based on the reduced scan shift that has been previously proposed for generating short test sequences for full scan circuits. In the reduced scan shift method, one determines proch FFs must be controlled and observed for each test vector. According to the results of similar analysis, PARES selects these FFs that must be controlled or observed for a large number of test vectors, as scanned FFs. Short test sequences are generated by reducing scan shift operations using a static test compaction method. To minimize the loss of fault coverage, the order of test vectors is so determined that the unscanned FFs are in the state required by the next test vector. If there are any faults undetected yet by a test sequence derived from the test vectors, then PARES uses a sequential circuit test generator to detect the faults. Experimental results for ISCAS'89 benchmark circuits are given to demonstrate the effectiveness of PARES.     

SXDG-1型汽车前照灯全自动检测仪的微机控制

SXDG—1型汽车前照灯全自动检测仪是用于检测汽车前照大灯光轴的偏斜情况及发光强度并进行定量检验的专用设备。它可以自动测出有关参数,并予以数字显示和打印输出。本文介绍了该仪器的主要性能、工作原理及微机控制系统(包括硬件结构和软件设计思想等)。     

Test Generation for Crosstalk-Induced Faults: Framework and Computational Results

Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital combinational circuits. These noise effects can propagate through a circuit and create a logic error in a latch or at a primary output. We have developed a mixed-signal test generator, called XGEN, that incorporates classical static values as well as dynamic signals such as transitions and pulses, and timing information such as signal arrival times, rise/fall times, and gate delay. In this paper we first discuss the general framework of the test generation algorithm followed by computational results. Comparison of results with SPICE simulations confirms the accuracy of this approach.     

一种低频 空间定向及高灵敏遥感方法研究

本文提出一种低频、空间定向及高灵敏的遥感方法。文中介绍了传感器及其二次仪表设计原理和关键技术。由作者研制的本检测系统,在空气中的定向接收灵敏度,离1米处高达120mV/μPa,比HP4905A型机的输出信噪比高8倍.     

物理实验课程考核、评估体系初探

对物理实验课程考核、评估方法进行了探讨，提出了物理实验课程考核、评估体系及实施细则．重点介绍了体系中的核心部分——正规的物理实验课程考试．     

基于离差最大化原理的灰色综合评判方法及其应用

在灰色综合隶属度评价方法基础上,按照离差最大化原理,提出了一种品种区域试验的新的确定权重的方法.应用这种方法,对2002-2003年度国家黄淮南片小麦冬水组区域试验进行了分析.结果表明,这种分析方法克服了通常专家调查法和层次分析法主观随意性强的缺点,因而其分析结果更加客观、可靠.大面积生产实践也表明该方法具有一定可行性和有效性.     

Weighted Kolmogrov–Smirnov type tests for grouped Rayleigh data

We consider goodness of fit tests for the Rayleigh distribution with grouped data. New Kolmogrov–Smirnov type tests are suggested and compared with the traditional chi-square and likelihood ratio tests. The results show that some of the suggested tests have a good power performance as compared with the traditional ones.     

Tests for Varying G

In this note we consider a variable G cosmology which is consistent with observation and which had successfully predicted an ever expanding accelerating universe with a small cosmological constant amongst other things. Three further tests are proposed in this note: First, the inexplicable anomalous accelerations of the Pioneer spacecrafts can be explained. It is then shown that the observed shortening of the orbital periods of binary pulsars is in good agreement with this model. Finally, more general changes in orbital parameters are deduced, which may be observed in the future.     

火工品可靠性试验数据的综合分析方法

升降法试验数据和固定刺激量下的成败型试验数据,是两种最常见的火工品可靠性试验数据．我们应用Markov链,研究了升降法试验数据下,感度分布参数的极大似然估计的特性．在此基础上,应用Bootstrap方法和Bayes方法,给出了综合分析两种试验数据的方法．最后,将该方法应用于520底火的可靠性鉴定,得出了有益的结论．     

环境光对PE塑料薄膜近红外激光拉曼光谱的影响

探讨了环境光自然光和室内荧光灯光的存在,对PE透明塑料薄膜的近红外激光拉曼光谱的影响.研究表明不同的环境光,会对近红外拉曼光谱产生不同的明显特征峰.自然光干扰产生的是以倒峰群形式为主,而室内荧光灯光造成的干扰主要以尖锐的脉冲峰形式.虽干扰表现形式不同,但都有严重地影响,在测定时一定要引起重视,不能忽略.建议在进行透明塑料近红外拉曼光谱检测时,须在暗室或暗罩遮光保护中进行,以完全隔离环境光的影响.