Microelectronics packaging has been developing rapidly due to the demands for faster, lighter and smaller products. Printed circuit boards (PCBs) provide mechanical support and electrical interconnection for electronic devices. Many types of composite PCBs have been developed to meet various needs. Recent trends in reliability analysis of PCBs have involved development of the structural integrity models for predicting lifetime under thermal environmental exposure; however the theoretical models need verification by the experiment.
The objective of the current work is the development of an optical system and testing procedure for evaluation of the thermal deformation of PCBs in the wide temperature range. Due to the special requirements of the specimen and test condition, the existing technologies and setups were updated and modified. The discussions on optical methods, thermal loading chambers, and image data processing are presented. The proposed technique and specially designed test bench were employed successfully to measure the thermal deformations of PCB in the −40°C to +160°C temperature range. The video-based moiré interferometry was used for generating, capturing and analysis of the fringe patterns. The obtained information yields the needed coefficients of thermal expansion (CTE) for tested PCBs. 相似文献
基于微波多层板技术,通过对单片微波集成电路(MMIC)、微机电系统(MEMS)和低温共烧陶瓷(LTCC)滤波器等微组装工艺的优化和分析,使多通道接收前端进一步实现小型化设计和应用。同时,对电路和结构进行改进,使前端组件具有更好的幅相一致性和高隔离度。最终实现的C频段四通道接收前端尺寸为120 mm×50 mm×12 mm,幅相一致性分别小于±0.8 d B和±5°,通道间隔离度高于60 d Bc。该设计方法的实现为小型化多通道接收前端的工程化应用提供了一种有效的解决方案。 相似文献