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本文介绍了一种鱼类耳石样品的扫描电镜制样方法,通过对草鱼耳石进行包埋,抛磨,并用合适的腐蚀剂处理,用SEM成功地观察了耳石的日轮及超微结构,该方法简便易行,保证所观察耳石样品的微观结构完整与清晰。 相似文献
156.
A method for the deposition of BN onto graphite and other substrates is described. Boron trichloride (BCl3) and ammonia (NH3) diluted with Ar were used as reacting gases. The deposition process was carried out at 1300 K as well as lower temperatures in an open system at pressures of 1 atm. The consequences of the introduction of hydrogen to the system were considered. It was demonstrated that the replacement of argon with hydrogen increases the efficiency of the process as well as the theoretical rate of BN deposition. However, the acceleration of the deposition seems to be unprofitable, because the resulting supersaturation leads to the formation of an amorphous phase. The modification of the experimental conditions were proposed.Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthday 相似文献
157.
We have performed selective area epitaxy (SAE) of CdTe layers grown by molecular beam epitaxy using a shadow mask technique.
This technique was chosen over other SAE techniques due to its simplicity and its compatibility with multiple SAE patterning
steps. Features as small as 50 microns × 50 microns were obtained with sharp, abrupt side walls and flat mesa tops. Separations
between mesas as small as 20 microns were also obtained. Shadowing effects due to the finite thickness of the mask were reduced
by placing the CdTe source in a near normal incidence position. Intimate contact between the mask and the substrate was essential
in order to achieve good pattern definition. 相似文献
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159.
单晶光纤损耗谱测量装置 总被引:4,自引:1,他引:3
本文描述了一套用以测量单晶光纤损耗谱的装置。本装置由卤钨灯,单色仪,积分球,AgORbCs光电倍增管以及数据采集,处理和控制系统组成。可测量300~1150nm的光谱范围。利用本装置可获得单晶光纤的吸收光谱,透过率谱,散射光谱以及散射位置谱。 相似文献
160.
Monocrystalline 6H-SiC thin films have been epitaxially grown on off-axis 6H-SiC {0001} substrates in the temperature range
of 1623–1873 K via chemical vapor deposition. The growth rate was a strong function of the growth temperature and the reactant
gas concentration. The activation energies for growth were 64 kJ/mole and 55 kJ/mole for the (0001) Si face and the (0001)
C face, respectively. The concentration of growth pits in the films increased as a function of decreasing deposition temperature,
increasing concentration of reactant gases and increasing off-axis orientation. Beta-SiC islands were also observed in the
epilayers when the (SiH4 + C2H4)/H2 ratio was ≥2.5:3000. 相似文献