Nanoporous Structure in Low-Dielectric Films with Positronium Annihilation Lifetime Spectroscopy

We investigate nano-porous structures in thin low-dielectric films, i.e. the pore sizes, distributions, and interconnectivity, by using depth profiled positronium annihilation lifetime spectroscopy (PALS). It is found that PALS has good sensitivity to probe both interconnected and closed pores in the range from 0.3nm to 3Onto, even in the film buried beneath a diffusion barrier. A series of low dielectric constant films of organosilicon-silsequioxane with different weight percentages of porogen have been comparatively investigated. The PALS technique can be used to distinguish the open porosity from the closed one, to determine the pore size, and to detect the percolation threshold with the increasing porosity that represents the transition from closed pores to interconnected pores.Furthermore, the pore percolation length can be derived.     

Structure and Photoluminescence of Nano-ZnO Films Grown on a Si （100） Substrate by Oxygen- and Argon-Plasma-Assisted Thermal Evaporation of Metallic Zn

Nano-ZnO thin films were prepared by oxygen- and argon-plasma-assisted thermal evaporation of metallic Zn at low temperature, followed by low-temperature annealing at 300℃ to 500℃ in oxygen ambient. X-ray diffraction patterns indicate that the nano-ZnO films have a polycrystalline hexagonal wurtzite structure. Raman scattering spectra demonstrate the existence of interface layers between Zn and ZnO. Upon annealing at 400℃ for i h, the interface mode disappears, and photoluminescence spectra show a very strong ultraviolet emission peak around 381 nm. The temperature-dependent PL spectra indicate that the UV band is due to free-exciton emission.     

Magnetic and Crystalline Microstructures of Fe-Pt-B Nanocomposite Ribbons

We investigate magnetic and crystalline microstructures of melt-spun (Fe0.675Pt0.325)100-xBx (x=12, 14, 16, 18,20) nanocomposite ribbons after optimal thermal treatment using a magnetic force microscope. The magnetic microstructures are characterized by darker spots adjacent to brighter ones in a sub-micro scale and in random distribution. It is found that the strength of the exchange coupling interaction between the crystals in the 10-100 nm scale, implied by the maximum value (δM)max of the Henkel plot, could be roughly described by the ratio of the average width of the magnetic spots w^- to the average crystal size D^- for the ribbons. Moreover, we find that the intrinsic coercivity jHc of the ribbons is sensitive to their crystal sizes, and the smaller D^-, the higher jHc. Finally, by using roughness analysis, the curve of the root mean square values (δФ)rms of the phase shift of the magnetic force images versus the boron content x is obtained, which is qualitatively consistent with that of the magnetization σ12 kOe of the ribbons versus x.     

模拟纳米晶体原子分布及X射线散射理论图案

通过分子动力学方法模拟纳米晶体（1—3nm）的结构．利用模拟的结果，进行了X射线衍射及径向分布函数的模拟计算．结果表明：纳米晶体晶界呈短程有序，界面原子间距分布很宽；随着晶粒尺寸的减小，晶粒的畸变越大，原子体积常数也明显增大 关键词：     

Fe2O3纳米微粒溶胶非线性光学特性的Z-扫描研究

利用Z扫描技术在透明区域研究了Fe₂O₃纳米微粒水溶胶和表面包覆有机溶胶的非线性光学特性，给出了非线性折射率γ、双光子吸收系数β、自由载流子折射系数σ_r和自由载流子吸收截面σ_ab等重要物理参数，讨论了自由载流子效应对Fe₂O₃纳米微粒非线性特性的影响 关键词：     

纳米碳管的电子衍射及其螺旋度测量

本文对电弧放电和催化剂热解碳氢气法制备的多层直形纳米碳管的倒空间及其螺旋度，采用电子衍射进行了研究。结果表明：尽管制备方法不同，两类多层管的结构相似，皆由螺旋和非螺旋的单层石墨管组成；对其倒空间的分析以及系列倾转电子衍射实验证明，衍射图中测得的表观螺旋度值随和射条件而改变，只有在垂直入射条件下该值才代表碳管的真实螺旋度；     

纳米硅量子线的发现与研究

一维纳米材料是当今介观物理学研究的前沿领域．文章报道了一种利用脉冲激光成功地制备纯度高、直径分布均匀的纳米硅量子线（ＳｉＮＷｓ）的方法，介绍了纳米量子线的形貌、显微结构、生长机理和物理性能研究的最新结果．纳米硅量子线的发现具有重要的科学意义和潜在的应用前景．     

Ni-Si多层膜中固态非晶化反应的热力学与动力学过程

研究了Ni/非晶Si(a-Si)多层组分调制膜(ML)中界面上的固相反应。根据计算的亚稳自由能图,对界面上固相反应形成非晶态进行了热力学与动力学的分析。提出了Ni/a-Si多层膜中的固相反应的动力学模型。 关键词：     

特征提取在硅内部微/纳米级体缺陷检测中的应用

提出了一种利用特征提取来对硅中微/纳米级体缺陷的激光散射图样进行分析,以获得缺陷大小信息的分析方法.给出了该方法中第一特征值和第二特征值的定义,指出通过所提出的第一特征值及第二特征值即可迅速地判断出缺陷的大小量级所在.这种分析方法具有分析速度快,在体缺陷小于1μm时分辨率高,且可使系统实现自动化等优点.     

纳米电子技术

<正> 微电子技术引发了本世纪的信息革命,纳米科学技术将成为二十一世纪信息时代的核心和国际科学界和工程技术界关注的热点。 纳米电子技术应运而生 微电子技术经历了50年代小规模集成电路(集成度为100个元件)、60年代中规模集成电路(集成度为1000个元件)、70年代大规模集成电路(集成度为1000个元件以上)和超大规模集成电路(集成度为10~5个元件)以及80年代特大规模集成电路(集成度为10~6个元件以上)几个发展阶段。