数字电视信号的基带传输

一数字基带信号的码型 对于数字基带信号来讲,不同的码型具有不同的频谱结构,如何合理地选择基带信号的码型,使之能够适应给定信道的频谱结构,在数字信号基带传输中是首先要考虑的问题.在选择数字基带信号码型时,应遵循以下原则:     

超薄氧化层中的中性陷阱对隧穿电流的影响和应变诱导漏电流

用数值分析的方法讨论了中性陷阱对超薄场效应晶体管(MOSFET )隧穿电流的影响.中性陷阱引起势垒的变化在二氧化硅的导带中形成一个方形的势阱.对于不同的势垒变化,计算了电子隧穿氧化层厚度为4nm的超薄金属氧化物半导体结构的电流.结果表明,中性陷阱对隧穿电流的影响不能被忽略,中性陷阱的存在使隧穿电流增加,并且通过这个简单的模型能够理解应变诱导漏电流的产生机制.     

The Casimir effect of Reissner-NordstrSm black hole

The stress tensor of a massless scalar field satisfying a mixed boundary condition in a （1 ＋ 1）-dimensional Reissner- Nordstrom black hole background is calculated by using Wald＇s axiom. We find that Dirichlet stress tensor and Neumann stress tensor can be deduced by changing the coefficients of the stress tensor calculated under a mixed boundary condition. The stress tensors satisfying Dirichlet and Neumann boundary conditions are discussed. In addition, we also find that the stress tensor in conformal flat spacetime background differs from that in flat spacetime only by a constant.     

用干涉方法测量薄膜应力

基于基片弯曲法和牛顿环的基本原理,使用He-Ne激光器、扩束镜、凸透镜和带分光镜的移测显微镜,搭建了薄膜应力测量装置.采用直流溅射法制备了厚度为30~144 nm的银薄膜,衬底采用厚度为0.15 mm、直径为18 mm的圆形玻璃片.实验发现,薄膜厚度对银薄膜的内应力有显著的影响,在薄膜厚度很小时,随着薄膜厚度的增加,应力迅速增大,达到最大值后,随着厚度的继续增加,薄膜应力下降较快并趋于稳定值.     

激光穿透焊的三维数值模拟

本文对激光穿透焊进行了三维数值模拟，除考虑焊接速度影响外，还研究了Ｍａｒａｎｇｏｎｉ对流对熔池流动与传热的影响。将三维数值模拟结果与相应的二维模拟结果进行了比较，结果表明，Ｍａｒａｎｇｏｎｉ对流对熔池的形成有很大的影响，因此不可忽略。本文还给出了估计激光穿透焊中蒸气孔尺寸与焊接热效率的方法。     

轴快流CO2激光器气体压力控制

激光切割对激光功率模式、功率密度和功率稳定性要求很高,采用轴快流CO2激光器时,控制工作气体压力工作在最佳状态并保持其恒定是激光器输出连续、稳定功率的必要条件和关键技术之一。在深入研究激光器工作原理和影响激光输出功率因素的基础上,采用带积分分离的智能PID控制算法对工作气体压力进行调节。该过程控制算法简单实用,可以有效地提高气体压力控制精度,改善功率控制精度和稳定性,并用实验加以验证。     

A Novel Contactless Method for Characterization of Semiconductors：Surface Electron Bean Induced Voltage in Scanning Electron Microscopy

We present a novel contactless and nondestructive method called the surface electron beam induced voltage (SEBIV) method for characterizing semiconductor materials and devices.The SEBIV method is based on the detection of the surface potential induced by electron beams of scanning electron microscopy (SEM).The core part of the SEBIV detection set-up is a circular metal detector placed above the sample surface.The capacitance between the circular detector and whole surface of the sample is estimated to be about 0.64pf.It is large enough for the detection of the induced surface potential.The irradiation mode of electron beam (e-beam) influences the signal generation When the e-beam irradiates on the surface of semiconductors continuously,a differential signal is obtained.The real distribution of surface potentials can be obtained when a pulsed e-beam with a fixed frequency is used for irradiation and a lock-in amplifier is employed for detection.The polarity of induced potential depends on the structure of potential barriers and surface states of samples.The contrast of SEBIV images in SEM changes with irradiation time and e-beam intensity.     

高加速应力筛选(HASS)概述

高加速应力筛选（HASS）是一种新兴的试验技术，用于产品的生产阶段。在暴露和剔除产品的制造和工艺缺陷，提高可靠性，降低野外失败和返修率等方面非常有效。从研究开发HASS的背景出发，介绍了HASS的目的及作用，重点探讨了高加速的基本原理，典型的HASS过程。