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玻璃陶瓷材料中Tm3+离子红外到蓝色上转换发光 总被引:4,自引:0,他引:4
系统研究了PbF2+GeO2+WO3ⅩⅣTmF3玻璃陶瓷材料中,在近红外光(1.06μm)激发下,Tm3+离子的发光特性.实验中观测到Tm3+离子的两组峰值位置分别在20920cm-1和22173cm-1的蓝色上转换发光,并证实这两组上转换发光分别与吸收三个和四个光子有关,同时建立了上转换发光的模型.为了选择最佳掺杂浓度,详细地测量了Tm3+离子峰值为20920cm-1的蓝色上转换发光强度与TmF3浓度的关系. 相似文献
4.
一种低耐压器件实现的压电陶瓷驱动电源 总被引:5,自引:2,他引:3
介绍采用普通低耐压器件三端可调集成稳压块实现的300V输出的压电陶瓷驱动电源的设计思想,电路原理,设计计算及安装调试等内容,该设计的特点是电路简单,可靠性好,经济实用。 相似文献
5.
M. Bennahmias H. B. Radousky T. J. Goodwin R. N. Shelton 《Journal of Electronic Materials》1993,22(10):1189-1193
Magnetic characterization has been performed on the members of the cuprateniobate RBa2Cu2NbO8 (R = Pr, Nd, and La) series and R1.5Ce0.5Sr2Cu2NbO10 (R = Pr, Eu, Nd, and Sm) series. The PrBCNO samples show a signature in the magnetization of a magnetic ordering at 12K.
The PrCSCNO sample is nonsuperconducting and shows two distinct orderings at 17K and 53K. No such magnetic phase transition
is observed down to 2K in the Nd and La based RBCNO materials or the Nd, Sm, and Eu based RCSCNO materials. Measurements of
the lower critical field curve, dc irreversibility line, and critical curent densities are reported for each of the superconducting
NdCSCNO, SmCSCNO, and EuCSCNO compounds. 相似文献
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Yasumitsu Matsuo Takehiko Ijichi Hironori Yamada Junko Hatori Seiichiro Ikehata 《Central European Journal of Physics》2004,2(2):357-366
We have fabricated a field effect transistor (FET) based on an organic ferroelectric insulator and molecular conductor, and
investigated the electrical properties and memory effects on the PEN-FET. We have observed a drastic change in the drain current
at around the coercive electric fieldE
c
of the organic ferroelectric insulator in not only a FET (PEN-FET) based on a pentacene (PEN) film but also a FET (IPEN-FET)
based on an iodine doped PEN film. The magnitude of the change of the drain current for the IPEN-FET is 200 times larger than
that for the PEN-FET. It is expected from these results that the PEN-FET (especially the IPEN-FET) is an improvement in such
devices, since it operates at a low gate electric field accompanied by the appearance of the spontaneous polarization in the
organic ferroelectric insulator. In addition, we have found that the drain current for the PEN-FET does not return to the
initial drain current ofE
G
=0 V/cm for more than one week, even if the gate electric field is changed to 0 V/cm from 500 V/cm(>E
c
). From these results, it is suggested that the PEN-FET becomes a memory device. 相似文献
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Total-reflection X-ray fluorescence spectrometry has been compared with Instrumental Neutron Activation Analysis in order to test its potential application to the study of archaeological ceramics in the archaeometric field. Two direct solid non-chemical sample preparation procedures have been checked: solid sedimentation and solid chemical homogenization. For sedimentation procedure, total-reflection X-ray fluorescence allows the analysis of the elemental composition with respect to the size fraction but not the average evaluation of the composition. For solid chemical homogenization procedure, total-reflection X-ray fluorescence provides precise (from 0.8% to 27% of coefficient of variation) and accurate results (from 91% to 110% of recovery) for 15 elements (Cr, Hf, Ni, Rb, Al, Ba, Ca, K, Mn, Ti, V, Cu, Ga, Y and Fe) with an easy sample preparation process of the solid clay and without previous chemical treatment. The influence of the particle sizes has been checked by total-reflection X-ray fluorescence sample angle scans and anomalous behaviors have been found for three additional detected elements: As, Sr and Zn, which can be attributed to interference effects of the mineral grain sizes of their associated chemical phases in the total-reflection X-ray fluorescence interference region. The solid chemical homogenization procedure produces data useful for archaeological interpretation, which is briefly illustrated by a case-study. Finally, the decantation procedure data can be also useful for size chemical speciation and, consequently, for alternative environmental total-reflection X-ray fluorescence applications. 相似文献
10.
Nb2O5掺杂对ZnO压敏电阻器电性能的影响 总被引:5,自引:1,他引:4
本文研究了Nb_2O_5掺杂以及Nb_2O_5与ZnO煅烧对ZnO压敏电阻器电性能的影响。实验表明,Nb_2O_5的掺入使压敏电场减少,当Nb_2O_5含量为0.1%mol时,其压敏电场最小.非线性系数最大。煅烧温度越高,压敏电场越高,非线性系数越大。 相似文献