激光束整形光学系统的设计与研究

提出了一种改善激光投线仪光束均匀性的新方法,该方法运用几何光线追迹的原理,对激光束通过带孔柱透镜的光路进行了计算,模拟了柱透镜内孔在不同大小、形状、透镜介质折射率等参数下的光束远场能量分布,获得了能量分布均匀的远场激光线.     

涂布流动和涂布材料的流变性能

本文列举涂布工艺的实例,给出基本流动方程。叙述了涂布材料流变性质的某些例子。评述了:①棱形条纹;②斜面流动的稳定性;③“桔皮”现象;④在表面张力作用下薄膜表面变平的过程;⑤三相线的奇异性。最后,为了很好地理解涂布现象,考虑了旋转甩涂过程。      

静电场自动描绘器

本文介绍了利用MCS-51单片机控制,实现静电场自动描绘系统。     

卤化银微晶的含碘结构的测定

用超薄切片法及X-射线线扫描法研究了半个碘溴化银微晶中碘的成层分布,结果与预想的碘的分布相一致。横扫过薄样品的X-射线线扫描提供了一个比较准确的测定含有不同碘量成层结构的技术。这有助于我们改进碘溴化银乳剂的制备。文章还讨论了在该种工作条件下,X-射线源的空间分辨率和超薄切片的厚度。 利用这种方法,把一种商用多层彩色片做超薄切片,用X-射线线扫描法直接对超薄切片中卤化银微晶的断面扫描,得到了各个轧剂层中的卤化银微晶的含碘结构。     

A Comparative Study of Various Size Distribution

One of the major product specifications of a crystalline material is the crystal size distribution (CSD). In order to monitor and control the CSD in an industrial crystallization process, on‐line sensors are required. Over the years, a number of techniques to measure the CSD have been established. In this paper, three instruments operated in an on‐line fashion and an off‐line method are compared. The instruments were the OPUS, a HELOS/VARIO (both manufactured by Sympatec) and a Malvern 2600c (manufactured by Malvern). They were implemented on an 1100‐l evaporative draft tube baffle (DTB) crystallizer producing ammonium sulfate crystals from aqueous solution. Samples from this crystallizer were also analyzed offline by wet sieving. The results show reasonably good agreement between the different on‐line techniques and the wet sieving technique concerning the shape of the distribution. However, there is a discrepancy regarding the absolute values, which can be explained by the fact that the techniques used are based on different measuring principles.     

两对边简支中间有任意多个单向弹性线支矩形板横向振动的一个解析解法*

本文给出了两对边简支另两对边任意支承的中间有任意多个单向弹性线支矩形板横向振动的一个新的解析解法、将弹性线支反力看作是作用于板上的待求外力,求得了含有来知的弹性线支反力的两对边简支矩形板的运动方程的解析解;利用弹性线支反力与板横向位移之间的线性关系导出频率方程;频率方程及振型函数的表述均与已有方法不同.     

Zeeman原子吸收光谱分析法中谱线轮廓的研究(Ⅳ)──Te 214.3 nm和Te 225.9 nm谱线

Te214．3nm和Te225．9nm谱线分别是原子吸收光谱分析（AAS）法中Te的灵敏线和非灵敏线．在Zeeman原子吸收光谱分析（ZAAS）法中,尤其当Zeeman调制方式不同时,分析性能的差异非常明显,颇为典型．本文从原子吸收光谱法的基本原理,即原子发射（AE）、原子吸收（AA）和Zeeman原子吸收（ZAA）谱线轮廓间重叠关系留［‘］来研究其分析特性差异的原因以及在实际分析工作中的应用．1理论部分在原子吸收光谱法中吸光度值A和原子吸收系数间的关系式为：普通AAS法：AN一043K“（1）偏振调制方式ZAAS法：AZ（。;一0．43［K：一大：］…     

Interaction between a rigid line inclusion and an elastic circular inclusion

I.IntroductionManypracticalproblemsinengineering,suchascompositematerial,weldedjointorribbedslab,needustostudytheinteractionproblemoflineinclusionandcircularinclusionasshowninFig.1.Sotheproblemwasdiscussedinthispaper.Proceedingfromthestressfieldofplanecon…     

Effect of Disclination Lines on Free Energy of Nematic Liquid Crystals

In the light of φ-mapping method and topological current theory, the effect of disclination lines on the free energy density of nematic liquid crystals is studied. It is pointed out that the total Frank free energy density can be divided into two parts. One is the distorted energy density of director field around the disclination lines. The other is the saddle-splay energy density, which is shown to be centralized at the disclination lines and to be topologically quantized in the unit of kπ /2 when the Jacobian determinant of the director field does not vanish at the singularities of the director field. The topological quantum numbers are determined by the Hopf indices and Brouwer degrees of the director field at the disclination lines, i.e., the disclination strengthes. When the Jacobian determinant vanishes, the generation, annihilation, intersection, splitting and merging processes of the saddle-splay energy density are detailed in the neighborhoods of the limit points and bifurcation points, respectively. It is shown that the disclination line with high topological quantum number is unstable and will evolve to the low topological quantum number states through the splitting process.     

X射线荧光光谱法测定化探样品中主、次和痕量组分

采用粉末样品压片制样,用PW2440X射线荧光光谱仪对化探样品中氯、溴、硫、氧化钠、氧化镁、三氧化二铝、二氧化硅、磷、氧化钾、氧化钙、钛、锰、三氧化二铁、钴、铌、锆、钇、锶、铷、铅、钍、锌、铜、镍、钒、铬、钡、镧、铈、钕、钪、镓、砷、铪等34个组分进行测定。讨论了微量元素的背景选择和谱线重叠校正及氯测定的问题。使用经验系数法和康普顿散射线作内标校正基体效应,经标准物质检验,分析结果与标样值吻合,用GBW 07308国家一级标准物质作精密度试验,统计结果RSD（n=12）除砷、钒、镍、铜〈6．0％,溴、硫、铈、铪、钕、钪、氧化钠、镧、铬、钴和钍〈14．0％以外,其余各组分均小于3．0％。