电磁继电器触点参数的测试

本文介绍了电磁继电器触点电参数的测试方法，包括接触电阻、绝缘电阻参数测试。     

Phase Measurement Algorithm in Wavelength Scanned Fizeau Interferometer

Wavelength scanned interferometry allows the simultaneous measurement of top surface shape and optical thickness variation of a transparent object consisting of several parallel surfaces. Interference signals from these surfaces can be separated in frequency space, and their phases are detected by discrete Fourier analysis. However, these signal frequencies are shifted from the detection frequency by the refractive index dispersion of the object and a nonlinearity of the wavelength scanning. The Fourier analysis is sensitive to the detuning of the signal frequency and suffers from the multiple-beam interference noise. Conventional error-compensating algorithms cannot be applied to an object consisting of more than three reflecting surfaces. We derive a new 2N-1 sample error-compensating algorithm, which allows the phase detection of any order of harmonic frequency among the interference signals. The new algorithm suppresses the effect of signal frequency detuning as well as the multiple-beam interference noise and can be applied to the measurement of complex objects consisting of more than three reflecting surfaces.     

Analysis and modelling of overtone singing in the sygyt style

Overtone singing, also called biphonic singing, xöömij or chant diphonique in french; is a special singing style that exhibits two or more separate sounds - one “drone” sound of relatively low pitch and one or more high pitch melody sounds. The perceived pitches of the upper tones are multiples of the drone sound, i.e. taken from its overtone scale. Compared to voiced sounds of western style singers, the relative amplitude of the melody pitches is quite high, and the formant bandwidth of overtone sounds is small. This paper tries to answer the question of how these formant properties are achieved. Experimental investigations and numerical calculations prove the existence of two closely neighboured formants for the production of the melody sound in the sygyt style.     

基于可靠性的相位去包裹算法

提出了一种新的基于可靠性的相位去包裹算法。采用了队列算法及去包裹可靠性的判别标准。与传统方法相比,能够自动避开噪声区域,解决了相位去包裹中的阴影遮挡以及空洞等问题,克服了传统去包裹方法中的误差传播效应,能准确快速地对全场进行相位去包裹。设计了一套基于此算法的三维形面测量系统。     

基于分层光学扫描的三维数字化测量技术

采用切削分层光扫描测量与计算机数据信息合成相结合的方法，有效地解决了具有复杂内外腔结构零件的三维数字化测量。该方法比传统三维测量速度快、自动化程度高，能同时准确测量零件内外腔表面，零件边缘测量误差可控制在CCD两个像素内。利用获取的铝合金精密小箱体三维数据，在计算机上重构了零件的三维模型，并用RP技术制造出了零件物理原形。     

Problem of the free oscillations of a capillary bridge

The free oscillations of a capillary bridge whose equilibrium shape is determined by the surface tension forces and the static gravity field are investigated. The values of 25 “lower” levels of the spectrum of natural oscillations of the capillary bridge are found for various control parameters in accordance with the experimental conditions.     

Surface roughness investigation of semi-conductor wafers

Conventionally, surface roughness is predominantly determined through the use of stylus instruments. However, there are certain limitations involved in the method, particularly when a test specimen, such as a silicon wafer, has a smooth mirror-like surface. Hence, it is necessary to explore alternative non-contact techniques. Light scattering has recently been gaining popularity as an optical technique to provide prompt and precise inspection of surface roughness. In this paper, the total integrated scattering (TIS) model is modified to retrieve parameters on surface micro-topography through light scattering. The applicability of the proposed modified TIS model is studied and compared with an atomic force microscope. Experimental results obtained show that the proposed technique is highly accurate for measuring surface roughness in the nanometer range.     

应用无衍射贝塞尔光束的固体线膨胀系数测量系统

测量固体线膨胀系数是工程设计中的一项重要工作。这套非接触固体线膨胀系数测量系统利用激光三角法进行了设计。通过采用线阵CCD作为信号传感器来实现自动化测量。通过采用无衍射贝塞尔光束来提高测量精度和增大测量范围。     

光学系统光阑应用的实例

介绍了一种光学组合系统，通过构造光学系统虚拟的视场光阑实现人眼屈光度测量，它是光学系统光阑应用的生动实例.     

Measurement of wire diameter by optical diffraction

A combined interference and diffraction pattern, in the form of equidistant interference fringes, resulting from illuminating a vertical metallic wire by a laser beam is analyzed to measure the diameter of four standard wires. The diameters range from 170 to 450 μm. It is found that the error in the diameter measurements increases for small metallic wires and for small distances between the wire and the screen due to scattering effects. The intensity of the incident laser beam was controlled by a pair of sheet polaroids to minimize the scattered radiation. The used technique is highly sensitive, but requires controlled environmental conditions and absence of vibration effects. The expanded uncertainty for k=2 is calculated and found to decrease from U(D)=±1.45 μm for the wire of nominal diameter 170 μm to ±0.57 μm for the diameter 450 μm.