Time‐Resolved Synchrotron Radiation Excited Optical Luminescence: Light‐Emission Properties of Silicon‐Based Nanostructures

The recent advances in the study of light emission from matter induced by synchrotron radiation: X‐ray excited optical luminescence (XEOL) in the energy domain and time‐resolved X‐ray excited optical luminescence (TRXEOL) are described. The development of these element (absorption edge) selective, synchrotron X‐ray photons in, optical photons out techniques with time gating coincide with advances in third‐generation, insertion device based, synchrotron light sources. Electron bunches circulating in a storage ring emit very bright, widely energy tunable, short light pulses (<100 ps), which are used as the excitation source for investigation of light‐emitting materials. Luminescence from silicon nanostructures (porous silicon, silicon nanowires, and Si–CdSe heterostructures) is used to illustrate the applicability of these techniques and their great potential in future applications.     

Photoelectron core levels for enargite,Cu3AsS4

The mineral chemistry of enargite surfaces and near‐surfaces prepared by fracture within an ultrahigh vacuum are investigated using XPS and synchrotron radiation XPS (SRXPS). The purpose of the study is to identify surface core‐level line positions in high‐resolution photoelectron spectra. The XPS spectra obtained using monochromatic Al Kα radiation show that there are near‐identical monosulphide line positions in S 2p spectra for the As–S and Cu–S bonds in enargite. The SRXPS spectra for sulphur are remarkably similar to the XPS spectra for sulphur, showing that there is minimal difference in the chemical environment between sulphur atoms at the surface and in the mineral matrix. The Cu 2p XPS data have only cuprous contributions and a minor surface contribution. The surface Cu contribution is observed as a high‐binding‐energy tail in the Cu 2p_3/2 spectrum. The As 3d data for both XPS and SRXPS show contributions from arsenic atoms at the surface and in the bulk mineral matrix. The surface contribution is distinct and is found 1 eV below the bulk contribution. The results of the study suggest that, following fracture, the enargite surface is reorganized in such a manner that the surface is characterized by protrusions of individual arsenic atoms. Copyright © 2004 John Wiley & Sons, Ltd.     

用同步辐射X-荧光定量测定电泳分离后蛋白条带内的微量元素

建立了同步辐射X荧-光(SRXRF)定量测定生物样品等电聚焦(IEF)分离后蛋白条带内的微量元素Fe、Cu和Zn的方法。用薄层聚丙烯酰胺凝胶分离人血红蛋白后,用SRXRF测定了各亚型条带内的金属含量,用加一定量金属的含蛋白聚丙烯酰胺凝胶做SRXRF定量测定蛋白条带内微量元素Fe、Cu和Zn的定量标准,校准曲线线性回归系数r在0~8μg/g范围内均大于0.99;检出限分别为2.43、1.12和0.96μg/g;测定蛋白条带内Fe和Zn的回收率分别为90.4%和115.7%。该联用技术可用于生物样品中微量元素的化学形态分析,同时给出蛋白质的微量元素组成和等电点等信息。     

Synchrotron radiation circular dichroism spectroscopy of ribose and deoxyribose sugars, adenosine, AMP and dAMP nucleotides.

Synchrotron radiation circular dichroism (SRCD) spectra of ribose and deoxyribose sugars, adenosine, AMP and dAMP nucleotides and cyclic derivatives were measured in the vacuum ultraviolet region (down to 168 nm for sugars and 175 nm for adenine derivatives) and at different pH values (3, 6-7, 9-10) and temperatures (between 5 and 45 degrees C). The information content in the VUV region is important since the CD bands strongly depend on the chemical structure of the sugar, the presence and orientation of a phosphate group and the protonation state of adenine. On the other hand, single or double deprotonation of the phosphoric acid group has no influence on the spectra. We assign the vacuum ultraviolet (VUV) CD bands of the nucleoside and nucleotides to be due mainly to n-->pi* transitions in the adenine nucleobase based on a comparison with the absorption spectra. The CD bands of the sugars are due to n(O -->sigma*) transitions and are much smaller than the CD signal from the nucleotides in the VUV region. Bands are assigned to both pyranose and open-chain forms.     

Verification of terahertz-wave spectrophotometry by Compton backscattering of coherent synchrotron radiation

We developed a continuous-spectrum light beam from Compton backscattering by using coherent synchrotron radiation in an L-band linac at the Kyoto University Research Reactor Institute. The ratio of Compton backscattered photons to background photons when coherent synchrotron radiation was used was three times larger than when coherent transition radiation was used. The transmission spectrum of a polystyrene film in the terahertz-wave region was evaluated by measuring the spectrum of the Compton backscattered photons and it roughly agreed with that measured by a Martin–Puplett-type interferometer. The spectrophotometry using Compton backscattering shows promise as a new tool for investigations in terahertz-wave science.     

X射线相位衬度成像

文章使用形象、生动、通俗、易懂的语言,介绍X射线相位衬度成像的基本概念,物理思想和方法,其中包括X射线的基本性质、光的波粒二象性、同步辐射X射线光源和常规非相干X射线光源的相位相干性,以及X射线相位衬度成像方法、三维成像的基本原理和相位衬度成像的最新进展,将抽象的相位、相位一阶导数和相位二阶导数概念与形象的光波阵面平移、倾斜和弯曲等形变联系在一起,着重介绍相位衬度成像发展中的创新思想,力图使读者能分享人类文明在这个学科发展中积累的精神财富.     

Penetrating view of nano-structures in Aleochara verna spermatheca and flagellum by hard X-ray microscopy

A penetrating view of the three-dimensional nanostructure of female spermatheca and male flagellum in the species Aleochara verna is obtained with 100-nm resolution using a hard X-ray microscope, which provides a fast noninvasive imaging technology for insect morphology. Through introducing Zernike phase contrast and heavy metal staining, images taken at 8 keV displayed sufficient contrast for observing nanoscale fine structures, such as the spermatheca cochleate duct and the subapex of the flagellum, which have some implications for the study of the sperm transfer process and genital evolution in insects. This work shows that both the spatial resolution and the contrast characteristic of hard X-ray microscopy are quite promising for insect morphology studies and, particularly, provide an attractive alternative to the destructive techniques used for investigating internal soft tissues.     

High pressure X-ray emission spectroscopy at the advanced photon source

ABSTRACT

The structural, electronic, and magnetic properties of materials under high pressure are of fundamental interest in physics, chemistry, materials science, and earth sciences. Among several hard X-ray-based techniques, X-ray emission spectroscopy (XES) provides a powerful tool to probe element-specific information for understanding the electronic and magnetic properties of materials under high pressure. Here, we discuss on the particular requirements and instrumentation used in high pressure XES experiments. We then present several examples to illustrate the recent progress in high pressure XES studies at the Advanced Photon Source, followed by an outlook toward future development in high pressure XES.     

同步辐射软X射线显微成像

软X射线显微成像是同步辐射最主要的应用之一,本文简明介绍软X射线显微成像的衬度机制,光源,成像方法和一些应用结果。