Magnetic Thomas-Fermi-Weizsäcker model for quantum dots: A comparison with Kohn-Sham ground states

The magnetic extension of the Thomas-Fermi-Weizs?cker kinetic energy is used within density-functional-theory to numerically obtain the ground state densities and energies of two-dimensional quantum dots. The results are thoroughly compared with the microscopic Kohn-Sham ones in order to assess the validity of the semiclassical method. Circular as well as deformed systems are considered. Received 26 October 2000 and Received in final form 14 December 2000     

TEM and Raman scattering investigation of carbon in annealed Co/C soft X-ray multilayers

The structures of the carbon sublayers in the annealed Co/C soft X-ray multilayers fabricated by using a dual-facing-target sputtering system have been characterized by transmission electron microscopy (TEM) and Raman spectroscopy (RS). The results suggest that the structural variations in the carbon layers can be roughly divided into three stages, i.e. ordering, crystalline and grain growth stages. At the ordering stage with annealing temperatures below 400°C, the amorphous carbon layers change from ones of bond-angle disorder and fourfold-bonding only to ones of threefold-bonding. At the crystalline stage, the amorphous carbon layers in the as-deposited multilayers crystallize to graphite crystallites in the annealing temperature range of 500–600°C. At the grain growth stage, the specimens are annealed at temperatures higher than 700°C. A growth in the graphite crystallite dimensions is observed, which is consistent with the TEM results. Project supported by the National Natural Science Foundation of China and Beijing Zhongguancun Associated Center of Analysis and Measurement.     

直流磁控溅射Si和玻璃衬底Fe/Co多层膜的磁性能比较

对直流磁控溅射Si和玻璃衬底［Co_t/Fe_3t］₅(t=2, 3, 4, 5nm)多层膜的磁性能进行了比较.对于t相同但衬底不同的样品,实验发现饱和磁化强度相差很小,但是矫顽力却相差很大.对矫顽力差异的理论分析表明,多层膜的粗糙度和畴壁类型是引起这种差异的主要原因. 关键词： Fe/Co多层膜 磁性能 矫顽力     

Fe/Si多层膜的层间耦合与界面扩散

对以本征Si及重掺杂ｐ型和ｎ型Si作为中间层的Fe/Si多层膜的层间耦合进行研究，并通过退火，增大Fe，Si之间的扩散，分析界面扩散对层间耦合的影响. 实验结果表明，层状结构良好的制备态的多层膜，Fe，Si之间也存在一定程度的扩散，它是影响层间耦合的 主要因素，远远超过了半导体意义上的重掺杂，使不同种类的Si作为中间层的层间耦合基本 一致.进一步还发现，在一定范围内增大Fe，Si之间的扩散，即使多层膜的层状结构已经有了相当的退化，Fe/Si多层膜的反铁磁耦合强度基本保持不变. 关键词： Fe/Si多层膜 层间耦合 界面扩散     

Resonance split of ballistic conductance peaks in electric and magnetic superlattices

Resonant peak splitting for ballistic conductance in finite electric superlattices (ES) and magnetic superlattices (MS) was investigated theoretically. It is shown that, for electron tunneling through the ES (MS) of identical n electric (magnetic) barriers, the resonance split of the conductance peak is (n–1)-fold; while for electron tunneling through the ES (MS) made of two different barriers, one resonant window of the former splits into two subwindows, within each of which the resonance split is (m–1)-fold, where m is the number of the renormalized building blocks consisting of two different barriers of the latter. Received 15 February 2000     

Interfacial roughness and angle dependence of giant magnetoresistance in magnetic superlattices

Using the two-point conductivity formula, we numerically evaluate the giant magnetoresistance (GMR) in magnetic superlattices with currents in the plane of the layers (CIP), from which the effect of the interfacial roughness and magnetization configuration on the GMR is studied. With increasing interfacial roughness, the maximal GMR ratio is found to first increase and then decrease, exhibiting a peak at an optimum strength of interfacial roughness. For systems composed of relatively thick layers, the GMR is approximately proportional to ,where is the angle between the magnetizations in two successive ferromagnetic layers, but noticeable departures from this dependence are found when the layers become sufficiently thin. Received 21 September 1998 and Received in final form 22 December 1998     

Electronic Structure and Crystalline Coherence in Fe/Si Multilayers

Soft x-ray fluorescence spectroscopy has been used to examine the electronic structure of deeply buried silicide thin films that arise in Fe/Si multilayers. These systems exhibit antiferromagnetic (AF) coupling of the Fe layers, despite their lack of a noble metal spacer layer found in most GMR materials. Also, the degree of coupling is very dependent on preparation conditions, especially spacer layer thickness and growth temperature. The valence band spectra are quite different for films with different spacerlayer thickness yet are very similar for films grown at different growth temperatures. The latter result is surprising since AF coupling is strongly dependent on growth temperature. Combining near-edge x-ray absorption with the fluorescence data demonstrates that the local bonding structure in the silicide spacer layer in epitaxial films which exhibit AF coupling are metallic. These results indicate the equal roles of crystalline coherence and electronic structure in determining the magnetic properties of these systems.     

Comparison of polyelectrolyte multilayers built up with polydiallyldimethylammonium chloride and poly(ethyleneimine) from salt-free solutions by in-situ surface plasmon resonance measurements

Polyelectrolytes offer a widespread potential for the defined modification of planar inorganic or polymer surfaces. Essential parameters for the regular adsorption of subsequent polymer layers by electrostatic interactions are the charge of polyelectrolyte and of the outermost surface region, the surface of the substrate, and the molar mass of the polyelectrolyte. To study such effects in mono- and multilayers we used poly(diallyldimethylammonium chloride (PD) with a molar mass from 5000 to 400000 g/mol as a strong polycation and poly(ethyleneimine) (PEI) with 75000 g/mol as a weak polycation and poly(sodium styrenesulfonate) (PSS) from 70000 to 1Mio g/mol in the diluted and semi-diluted region. The characterization of the layers was performed by streaming potential, in-situ SPR and UV-Vis spectroscopy. Thereby the layer built up at the solid/liquid-interface could be followed and quantified at the molecular level. SPR revealed that the thicknesses of the multilayer depends strongly on pK values of the polyelectrolyte (strong or weak) and the molar masses. We observed a linear growth if both polyelectrolytes are strong and an exponential growth if one polyelectrolyte is weak. The thickness increased with higher molar masses of the polyelectrolytes. The process was followed in-situ in short time steps.     

Dependence of mesoscopic growth on molecular configuration in Langmuir-Blodgett multilayers

Systematic studies by atomic force microscopy and X-ray reflectivity of three monolayer Langmuir-Blodgett films of M-Stearate (M = Cd, Zn, Mn) show change in surface morphology and growth mode with change in metal ions in the headgroup. Growth proceeds via Volmer Weber mode in CdSt, Stranski-Krastanov mode in ZnSt and Frank Van der Merwe mode in MnSt, as ascertained from fractal dimensions and out-of-plane density profiles. This is closely related with increase in number of metal ions incorporated per headgroup with change in metal ions in the order Cd, Zn and Mn. A preliminary correlation with metal atomic number is noted.