电爆金属丝产生纳米粉体

建立了一台用于纳米粉体制备的电爆炸金属丝装置,它可以在不打开放电腔体情况下,依次电爆炸8根金属丝。对电爆炸金属丝进行了电路模拟,电路模拟结果表明,减小放电回路电感,或在保持电容器初始储能不变条件下,提高充电电压的同时减小储能电容可提高能量注入速率。为了理解金属蒸气形成纳米粉体的物理过程,利用马赫-曾德激光干涉方法,研究了丝爆后金属蒸气及等离子体的演化过程,得到了电爆丝的典型物理图像,观察到电爆丝中金属蒸气喷发的“热滞后”现象及金属蒸气的多次喷发现象。并利用电爆丝法制备了氮化钛、二氧化钛、铜氧化物和氧化锌的纳米粉体。     

超低温度系数的光子晶体光纤Sagnac压力传感器

提出了一种基于光子晶体光纤Sagnac干涉仪的横向压力传感器。使用的光子晶体光纤为低双折射光纤,首先预先在Saganc环中的光子晶体光纤上施加初始压力,使Sagnac干涉仪产生正弦干涉光谱,然后再将被测物体放在光子晶体光纤上,由于被测物体重力的作用,Saganc干涉仪输出的光谱产生移动,实现横向压力传感测量。传感器具有高灵敏度0.529 nm/(N·mm)及超低的温度系数-0.4 pm/℃,其环境温度的影响可以忽略。     

一种新型全光纤速度干涉仪

基于传统速度干涉仪(VISAR)和光纤速度干涉仪(AFVISAR)的特点,提出了一种由光纤和光纤耦合器组成的工作波长为532 nm的新型全光纤速度干涉仪（NAFVISAR）。该干涉仪采用多模光纤器件构成分离系统,单模光纤器件组成核心部分。由于有两路携带不同信息的光束经不同路径传输到耦合器中,当这两路光束满足干涉条件时,可利用它们的干涉场信息来调解出被测靶的信息,从而区分波面的加减速变化。用该系统进行了Hopkinson森杆一维应力加载下的入射杆端面的速度剖面测试,实测速度最大值为49.36 m/s,与理论速度的最大值50.16 m/s基本符合,实现了全光纤速度干涉仪的实用化。     

成像型速度干涉仪散斑成因的研究

在冲击波过程中,利用成像型速度干涉仪探测样品自由面的速度时,散斑的叠加使得干涉曲线被严重干扰,影响了速度信息的精密提取。在理论上从光路的角度分析了系统中可能造成散斑的两种因素：靶面粗糙度和多模光纤。在实验上设计了三种照明方式分别对这两种因素进行验证。离线实验的结果表明,多模光纤的引入对散斑的产生起了主要的作用,这对抑制乃至遏制散斑的产生具有很好的指导性意义。     

单晶硅晶格间距的测量技术进展及应用

单晶硅晶格间距是许多重要物理常数测量的基础。本文介绍了硅晶格间距测量技术的发展历程,包括X射线干涉仪直接测量和晶格比较仪间接测量两种方法,以及影响测量结果不确定度的关键因素。得益于晶格间距测量的进展,在纳米尺度,硅晶格间距被国际计量局(BIPM)批准成为新的米定义复现形式。最后介绍了硅晶格在计量学中的应用,以及基于硅晶格实现纳米几何量测量的溯源体系的研究趋势。     

新型自扫描激光干涉系统

本文介绍了一种新型自扫描激光干涉系统的原理和结构。该系统采用自扫描光电二极管列阵（以下简称ＳＳＰＤＡ）接收器件，实现对干涉仪信号的调制，使测量信号转换成交流信号，避免了直流放大器零点漂移，消除了低频干扰。实验证明，该系统在采用普通器件的情况下，其分辨率优于０．０２μｍ。     

Mie-Rayleigh Doppler Wind Lidar with Two Double-edge Interferometers

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Plane-parallel biaxial plates as polarization interferometers

Plane-parallel biaxial plates as polarization interferometers. Knowing the refractive indices and the directions of the rays inside a birefringent crystal, it is possible to calculate the positions of the images formed, when a non-parallel light beam incides on it.We part from general expressions for images in plane-parallel plates of any type of medium and we use vectorial expressions for the incident and refractive rays and waves in both interfaces.From them, we obtained the interference patterns which are observed when the plate is placed between two crossed polarizers. This experimental device constitutes a polarization interferometer. In order to find the shape of the interference patterns, we superposed the wave's fronts emerging from the images determining, in this way, the phase difference curves of phase constant on a screen.     

Thickness and Surface Profile Measurement by a Sinusoidal Wavelength-Scanning Interferometer

We propose a sinusoidal wavelength-scanning interferometer for measuring thickness and surface profile of a thin film. The interference signal contains phase modulation amplitude Z and phase $aL which are related to the positions and profiles of the reflecting surfaces, respectively. By reducing the difference between the detected signal and the estimated signal using the multidimensional nonlinear least-squares algorithm, we estimate values of Z and $aL. Experimental results show that the front and rear surfaces of a silica glass plate of 20 $mUm-thickness could be measured with an error less than 10 nm.     

On use of ghost-less beam splitter in reversal shear interferometer for measurement of spatial coherence of large cross-section laser beam

A configuration of reversal shear interferometer suitable for measurement of spatial coherence of high average power, large cross-section laser beam has been discussed. Ghost-less beam splitters in which unwanted multiple reflections from the surfaces have been suppressed by total internal reflection are used for beam splitting and re-combination. Advantages and drawbacks of this configuration have been discussed.