Nd0.7Sr0.3MnO3中显微结构相关电致电阻效应

用固相反应和高能球磨合成后续热处理两种方法分别得到钙钛矿结构Nd_0.7Sr_0.3MnO₃氧化物.两种不同方法得到的多晶样品,虽然晶体结构相同,化学成分和晶粒大小相近,但它们电输运性质却表现出很大差异.用固相反应法制得的样品的电阻几乎不随负载电流的变化而变化,即不表现电致电阻行为;而通过高能球磨合成后续热处理方法得到的样品电阻随外加电流增大而急剧减小,出现显著电致电阻效应.产生这种截然不同电输运特性的原因可能与样品的显微结构和界面性质有关. 关键词： 电致电阻效应 显微结构 钙钛矿结构锰氧化物 界面电阻     

Response properties at the dynamic water/dichloroethane liquid–liquid interface

ABSTRACT

We present a novel approach for calculating the static dielectric permittivity profile of a liquid–liquid interface (LLI) from molecular dynamics simulations. To obtain well-defined features, comparable to those observed at solid–liquid interfaces, we find it essential to reference to the instantaneous liquid–liquid interface rather than the more commonly used average Gibbs interface. We provide a coarse-grained approach for the practical definition of the instantaneous interface and present numerical results for the prototypical water/1,2-dichloroethane system. These results show that the parallel components of the dielectric permittivity tensor can be accurately extracted. In contrast, the perpendicular component does not converge to the correct bulk value at large distances from the LLI, highlighting a flaw in the regularly applied coarse-graining procedure.     

超声空化引起界面湍动促进的传质机理

本文分析了超声空化引起界面湍动对传质过程的影响,提出了相界面上超声空化气泡析出增强边界层液体湍动并促进传质的机理,在传质理论和流体动力学原理的基础上,建立了超声空化引起界面湍动促进的传质机理模型,获得了超声空化引起界面湍动促进的传质系数表达式。实验结果验证了模型的合理性。该模型既证实了超声对传质有强化效应,又对传质过程有很好的预测功能,为工业化提供了理论依据。     

正常金属-铁磁绝缘层-dx2-y2+idxy混合波超导结中的磁散射对隧道谱的影响

在正常金属铁磁绝缘层dx2-y2 idxy混合波超导隧道结中,考虑到铁磁绝缘层的磁散射和界面的粗糙散射效应,运用BogoliubovdeGennes(BdG)方程和BlonderTinkhamKlapwijk(BTK)理论,计算了隧道结中的准粒子传输系数和微分电导.研究表明:(1)磁散射和界面粗糙散射均可以压低电导峰,其中磁散射能使电导峰滑移,而粗糙界面散射却能阻止这种滑移,且两散射的共同作用可抑制由混合波两序参数的幅值比不同所导致的电导峰滑移;(2)随铁磁层离超导表面距离的增加,隧道谱在零偏压处由凹陷变成了零偏压电导峰,继而又演化为凹陷中的中心峰;(3)当铁磁层离开超导表面有若干相干长度时,隧道谱中将呈现一些子能级谐振峰.     

Monte Carlo study of interfacial silicon suboxide layers and oxidation kinetics

A simple simulation scheme that simultaneously describes the growth kinetics of SiO₂ films at the nanometer scale and the SiO_x/Si interface dynamics (its extent, and spatial/temporal evolution) is presented. The simulation successfully applies to experimental data in the region above and below 10 nm, reproduces the Deal and Grove linear-parabolic law and the oxide growth rate enhancement in the very thin film regime (the so-called anomalous region). According to the simulation, the oxidation is governed mainly by two processes: (a) the formation of a transition suboxide layer and (b) its subsequent drift towards the silicon bulk. We found that it is the superposition of these two processes that produces the crossover from the anomalous oxidation region behavior to the linear-parabolic law.     

Fixed charge and interface traps at heterovalent interfaces between Si(1 0 0) and non-crystalline Al2O3–Ta2O5 alloys

Characterization by Auger electron spectroscopy (AES) and Fourier transformation infrared spectroscopy (FTIR) confirms (Ta₂O₅)_x(Al₂O₃)_1−x alloys are homogeneous pseudo-binary alloys with increased thermal stability with respect to end member oxides, Ta₂O₅ and Al₂O₃. Capacitance–voltage (C–V) and current density–voltage (J–V) data as a function of temperate show that the Ta d-states of the alloys act as localized electron traps, and are at an energy approximately equal to the conduction band offset of Ta₂O₅ with respect to Si.     

采用热处理方法提高MEH-PPV单层聚合物有机发光二极管发光性能的研究

对以MEH－PPV为发光层的单层聚合物有机发光二极管（OLED）器件在最佳条件下进行真空热处理，并用金相显微镜观察施加电压后器件的阴极表面形貌。发现处理后的器件阴极表面的气泡及黑斑明显减少。器件的发光性能显著提高。与未经处理的器件相比，最大相对发光强度提高了一个数量级、启亮电压降低了2．0V，半寿命提高了12．7倍。初步分析表明热处理方法提高器件发光性能的主要原因在于有效地减少了器件在工作过程中由于焦耳热产生的某些气体，从而减少阴极表面气泡及黑斑的出现，另一方面，热处理方法也增强了有机发光层与阴极接触界面的结合力，提高电子注入水平。     

Relationship between Dispersive Surface Tension and Density and Molecular Weight of Solvents and Polymers

The surface and interfacial properties of polymers are important for their applications. Generally, the surface property is quantitatively characterized by the surface tension or surface tension component parameters, which are obtained with the contact angle technique. However, the contact angle technique has an inherent problem, contact angle hysteresis phenomenon, which will result in many incredible surface tension data. In order to find a simple and easy method to estimate the rationality of a surface tension result, the relationship between dispersive surface tension component and density and molecular weight is researched in this work. It is found that for 30 organic solvents, there is a good relationship between the dispersive surface tension r^d and the parameter . In addition, for 12 polymers, when the molecular weight is replaced with the molecular weight of the repeat unit, there is still the same relationship as for small liquids. However, because it is difficult to judge the accuracy of the published dispersive data of the polymers, the found experiential relationship needs further confirmation, requiring more reliable published data.     

Effects of charge and dipole on flatband voltage in an MOS device with a Gd-doped HfO_2 dielectric

Gd-doped HfO2 has drawn worldwide interest for its interesting features.It is considered to be a suitable material for N-type metal-oxide-semiconductor(MOS)devices due to a negative flatband voltage(Vfb)shift caused by the Gd doping.In this work,an anomalous positive shift was observed when Gd was doped into HfO2.The cause for such a phenomenon was systematically investigated by distinguishing the effects of different factors,such as Fermi level pinning(FLP),a dipole at the dielectric/SiO2interface,fixed interfacial charge,and bulk charge,on Vfb.It was found that the FLP and interfacial dipole could make Vfbnegatively shifted,which is in agreement with the conventional dipole theory.The increase in interfacial fixed charge resulting from Gd doping plays a major role in positive Vfbshift.     

LaAlO3/SrTiO3界面的电子结构及光学性质的第一性原理研究

采用基于密度泛函理论框架下的第一性原理平面波超软赝势方法,结合局域密度近似(LDA)研究了钙钛矿结构氧化物LaAlO3/SrTiO3界面的电子结构及光学性质.能带结构分析表明当形成(AlO2)-/(TiO2)0界面时其禁带宽度为1.888 eV,呈现绝缘体的性质,当形成(LaO)+/(SrO)0界面时其禁带宽度为0.021eV,呈现半导体或半金属性质.同时,对不同界面的光学性质也进行了研究,结果表明纯相的LaAlO3和SrTiO3的吸收系数、反射系数及能量损失谱强度明显高于由这两种单质形成不同界面的强度.