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51.
针对光学元件使用过程中中频误差将导致光学元件的激光破坏这一问题,提出一种中频误差突出频率提取方法。采用基于统计学的多样本数据处理,对于每一种采样方向都可以得到数个较为突出的不合格频率。利用这些频率进行确定性加工后,在特定方向,空间频率0.044 1 mm-1,0.085 8 mm-1,0.041 7 mm-1所出现的不合格次数分别降至加工前的23.9%,18.3%,29.2%,而整体中频误差减少至50.1%。结果表明,此方法降低了由光学表面中频误差方向性与局部性引起的不确定性。 相似文献
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Jos S. Cmara Rosa Perestrelo Cristina V. Berenguer Carolina F. P. Andrade Telma M. Gomes Basit Olayanju Abuzar Kabir Cristina M. R. Rocha Jos Antnio Teixeira Jorge A. M. Pereira 《Molecules (Basel, Switzerland)》2022,27(9)
Green extraction techniques (GreETs) emerged in the last decade as greener and sustainable alternatives to classical sample preparation procedures aiming to improve the selectivity and sensitivity of analytical methods, simultaneously reducing the deleterious side effects of classical extraction techniques (CETs) for both the operator and the environment. The implementation of improved processes that overcome the main constraints of classical methods in terms of efficiency and ability to minimize or eliminate the use and generation of harmful substances will promote more efficient use of energy and resources in close association with the principles supporting the concept of green chemistry. The current review aims to update the state of the art of some cutting-edge GreETs developed and implemented in recent years focusing on the improvement of the main analytical features, practical aspects, and relevant applications in the biological, food, and environmental fields. Approaches to improve and accelerate the extraction efficiency and to lower solvent consumption, including sorbent-based techniques, such as solid-phase microextraction (SPME) and fabric-phase sorbent extraction (FPSE), and solvent-based techniques (μQuEChERS; micro quick, easy, cheap, effective, rugged, and safe), ultrasound-assisted extraction (UAE), and microwave-assisted extraction (MAE), in addition to supercritical fluid extraction (SFE) and pressurized solvent extraction (PSE), are highlighted. 相似文献
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This paper presents an analysis of diffraction effects taking place at different Schlieren diffracting elements. Two types
of diffraction effects are prominent in the Schlieren schemes. One is diffraction of direct light (source image) at the Schlieren
element, which limits the sensitivity and resolution of Schlieren systems. The second type is the diffraction of light deflected
from the test object at the Schlieren-diffracting element. This second type of diffraction degrades the quality of Schlieren
results. Experimental results showing the effect of diffraction of light deflected from the test object at a phase knife-edge,
corner of a square phase aperture and an optical fiber tip as Schlieren diffracting elements have been presented and discussed.
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Dielectric measurements on a sample consisting of banana-shaped molecules were carried out in a frequency range between 0.1 Hz and 10 MHz. The sample exhibited B2 and B4 phases. As usual, two ranges of relaxation were detected in the B2 phase, the fast reorientation about the long axes of the molecules and a slow collective process. In the B4 phase, only one dielectric active process at low frequencies was found; this does not differ from the low frequency relaxation of the B2 modification. This relaxation is probably related to the dynamics of superstructures. Crystallization could be observed after keeping the sample for a longer time at higher temperature. Thus, it was possible to differentiate clearly between the crystalline and the B4 phases. AFM investigations prove the existence of focal-conic domains and periodic superstructures in the B4 phase; then do not appear in the crystalline state. For this reason the B4 phase is regarded as different from a classical crystalline phase. 相似文献
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