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11.
Nitridated /3-Ga2Os (100) substrate was investigated as the substrate for CaN epitaxial growth.The effects of nitridation temperature and surface roughness of -Ga2O3 wafers on the formation of CaN were studied. 相似文献
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Aarne Kasikov Alar Gerst Arvo Kikas Leonard Matisen Agu Saar Aivar Tarre Arnold Rosental 《Central European Journal of Physics》2009,7(2):356-362
The resistive response of atomic layer deposited thin epitaxial α-Cr2O3(0 0 1) films, to H2 and CO in air, was studied. The films were covered with Pt nanoislands formed by electron-beam evaporation of a sub-monolayer
amount of the material. The gas measurements were performed at 250°C and 450°C. These temperatures led to different proportion
of chemical states, Pt2+ and Pt4+, to which the Pt oxidized. The modification was ascertained by the X-ray photoelectron spectroscopy method. As a result of
the modification, the response was fast at 250°C, but slowed at 450°C. A disadvantageous abundance of Pt4+ arising at 450°C in air could be diminished by high-vacuum annealing thus restoring the response properties of the system
at 250°C.
相似文献
15.
Multiferroic NiFe2O4 (NFO)-BaTiO3 (BTO) bilayered thin films are epitaxially grown on (001) Nb-doped SrTiO3 (STO) substrates by pulsed-laser deposition (PLD). Different growth sequences of NFO and BTO on the substrate yield two kinds of epitaxial heterostructures with (001)-orientation, i.e. (001)-NFO/(001)-BTO/substrate and (001)- BTO/(001)-NFO/substrate. Microstructure studies from x-ray diffraction (XRD) and electron microscopies show differences between these two heterostructures, which result in different multiferroic behaviours. The heterostructured composite films exhibit good coexistence of both ferroelectric and ferromagnetic properties, in particular, obvious magnetoelectric (ME) effect on coupling response. 相似文献
16.
采用分子束外延的方法在BaF2(111)衬底上制备出了高质量的Pb1-xMnxSe(0≤x≤0.0681)薄膜.X射线衍射结果表明,Pb1-xMnxSe薄膜为立方相NaCl型结构,没有观察到MnSe相分离现象,薄膜的取向为平行于衬底(111)晶面.晶格常数随着Mn含量的增加逐渐减小,Mn含量由Vegard公式得到.通
关键词:
1-xMnxSe外延薄膜')" href="#">Pb1-xMnxSe外延薄膜
透射光谱
带隙
折射率 相似文献
17.
研究了Si3N4层在ZrN/Si3N4纳米多层膜中的晶化现象及其对多层膜微结构与力学性能的影响. 一系列不同Si3N4层厚度的ZrN/Si3N4纳米多层膜通过反应磁控溅射法制备. 利用X射线衍射仪、高分辨透射电子显微镜和微力学探针表征了多层膜的微结构和力学性能. 结果表明,由于受到ZrN调制层晶体结构的模板作用,溅射条件下以非晶态存在的Si3N4层在其厚度小于0.9 nm时被强制晶化为NaCl结构的赝晶体,ZrN/Si3N4纳米多层膜形成共格外延生长的柱状晶,并相应地产生硬度升高的超硬效应. Si3N4随层厚的进一步增加又转变为非晶态,多层膜的共格生长结构因而受到破坏,其硬度也随之降低. 相似文献
18.
高亮度白光LED用外延片的新进展 总被引:5,自引:0,他引:5
文章首先介绍了发光二极管(LED)的内量子效率、外量子效率的基本概念和提高量子效率的基本方法,接着对LED外延的结构和方法做了简要介绍.文章的第三和第四部分则着重介绍了提高内、外量子效率的外延方法,这些方法包括外延结构的优化,侧向外延生长,SiC和GaN衬底的生长,AIInGaN四元系有源区生长,非极性面、半极性面的外延,表面粗化结构生长,图形化二次外延结构.图形化蓝宝石衬底上的外延,提高载流子注入效率的结构和组分设计.文章的第五部分则介绍了基于可靠性和成本考虑的其他新型外延结构,第六部分介绍了提高LED可靠性的外延方法.最后得出结论:采用非极性面的GaN衬底,生长优化的LED结构,并结合光子晶体技术,可望取得突破性进展. 相似文献
19.
Henrik Hovde Sønsteby Dmitry Chernyshov Michael Getz Ola Nilsen Helmer Fjellvåg 《Journal of synchrotron radiation》2013,20(4):644-647
A multipurpose six‐axis κ‐diffractometer, together with the brilliance of the ESRF light source and a CCD area detector, has been explored for studying epitaxial relations and crystallinity in thin film systems. The geometrical flexibility of the six‐axis goniometer allows measurement of a large volume in reciprocal space, providing an in‐depth understanding of sample crystal relationships. By a set of examples of LaAlO3 thin films deposited by the atomic layer deposition technique, the possibilities of the set‐up are presented. A fast panoramic scan provides determination of the crystal orientation matrices, prior to more thorough inspection of single Bragg nodes. Such information, in addition to a broadening analysis of families of single reflections, is shown to correlate well with the crystallinity, crystallite size, strain and epitaxial relationships in the thin films. The proposed set‐up offers fast and easy sample mounting and alignment, along with crucial information on key features of the thin film structures. 相似文献
20.
Oxygen vacancy control of electrical,optical, and magnetic properties of Fe0.05Ti0.95O2 epitaxial films
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Qing-Tao Xia 《中国物理 B》2021,30(11):117701-117701
High-quality Fe-doped TiO2 films are epitaxially grown on MgF2 substrates by pulsed laser deposition. The x-ray diffraction and Raman spectra prove that they are of pure rutile phase. High-resolution transmission electron microscopy (TEM) further demonstrates that the epitaxial relationship between rutile-phased TiO2 and MgF2 substrates is 110 TiO22. The room temperature ferromagnetism is detected by alternative gradient magnetometer. By increasing the ambient oxygen pressure, magnetization shows that it decreases monotonically while absorption edge shows a red shift. The transport property measurement demonstrates a strong correlation between magnetization and carrier concentration. The influence of ambient oxygen pressure on magnetization can be well explained by a modified bound magnetization polarization model. 相似文献