转动喇曼散射截面的群论计算

本文利用群链U(4)U(3)O(3)描述双原子分子N_2和O_2振转谱的对称性质,并利用群论方法计算了N_2和O_2分子转动喇曼散射的跃迁矩阵元,给出了它们的转动喇曼散射的截面。结果与实验较好地符合。     

AFM, SEM and GIXRD studies of thin films of red polycarbazolyldiacetylenes

In this paper we report the results of a morphological and structural investigation on film properties of a soluble polydiacetylene, the poly[1,6-bis(3,6-dihexadecyl-N-carbazolyl)-2,4-hexadiyne] (polyDCHD-HS). The red films of this polymer, prepared by standard spin-coating techniques, revealed absence of linear dichroism and birefringence in contrast with the ordered mesophases detected by powder X-ray studies. In order to interpret the optical behavior of this polymer, we performed AFM and SEM studies of polyDCHD-HS films spun on hydrophylic and hydrophobic glass substrates. We found the presence of surfaces organized in rod-like particles, more regularly oriented on the hydrophylic substrate. GIXRD studies, carried out on films sufficiently thick to allow the observation of the diffraction pattern, reveled the presence of a lamellar structure with a spacing of 3.22 nm. The low intensity of the diffraction peaks and the isotropic linear optical properties of the films show that the lamellar mesophases are not extended over large areas. These findings were compared with the data obtained from AFM and SEM studies on films of two other polydiacetylenes, the poly[1-(3,6-dihexadexyl-N-carbazolyl)-6-(N-carbazolyl)-2,4-hexadyine] (polya-DCHD) and the poly[1,6-bis(3,6-dipalmitoyl-N-carbazolyl)-2,4-hexadyine] (polyDPCHD), spun on hydrophylic glass substrate. The results confirmed the presence of nodular morphologies which seem to be a general characteristic of this class of materials. The particles organization appears instead related to the chemical nature of the substituents on the carbazolyl rings.     

The lay-out of the photon collider at the international linear collider

One of the interaction regions at the linear colliders should be compatible both with e ⁺ e ⁻ and γγ, γe modes of operation. In this paper, the differences in requirements and possible design solutions are discussed.      

Surface elastic properties of Si decorated with Ni nanostructures

Brillouin spectroscopy was used to study elastic properties of the Si (1 1 1) decorated with Ni nanostructures deposited by nanospherical lithography. The height of the nickel nanostructure deposited was about 25 nm, while the area taken by the structure differed depending on the type of matrix used. It was found that the Ni nanostructures change the velocity of both bulk and surface phonons in the systems studied. This finding is in contradiction to the results concerning the surface phonons velocities in different media covered with a homogenous thin metal film, in which the effect was observed for films thicker than 70 nm.     

Insight into chain dimensions in PEO/water solutions

Small‐Angle Neutron Scattering has been performed from poly(ethylene oxide) in deuterated water at temperature ranging from 10 to 80 °C. A simple fitting model was used to obtain a correlation length and a Porod exponent. The correlation length L characterizes the average distance between entanglements in the semidilute region and is proportional to the individual coil sizes in the dilute region. L was found to increase with temperature in the semidilute region but it decreases with temperature in the dilute region. This decrease is the precursor to the single‐chain collapse which applies to very dilute polymer solutions. © 2007 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 45: 2196–2200, 2007     

On acoustic and electric waves diffraction in piezoelectric medium by a permeable half-plane crack

The problem of electric and acoustic waves diffraction by a half-plane crack in a transversal isotropic piezoelectric medium is investigated. The crack is assumed to be electric permeable and free of tractions. The so-called “quasi-hyperbolic approximation” [15] is adopted. Applying Laplace transformations and Wiener–Hopf technique a closed form solution is obtained. By the means of Cagniard–de Hoop method a detailed dynamic full electroacoustic wavefield’s investigation is conducted. Mode conversion between electric and acoustic waves, effect of electroacoustic head wave, Bleustein–Gulyaev surface wave and the wavefield structure depending on the type of the incident wave (acoustic or electric) and its angle of incidence are analyzed in details. The dynamic field intensity factors at the crack tip depending on the angle of incidence and on time are derived explicitly. Numerical analysis is presented.     

利用喇曼光谱测量氧碘化学激光器氯气利用率的实验研究

 介绍了利用自发喇曼散射光谱测量氧碘化学激光器单态氧发生器氯气利用率的原理及实验装置，并给出了在以氮气作为稀释气的0.1mol/s射流式氧发生器上测试的结果，测试相对误差小于12%。由于该方法只需要通过测量喇曼谱线相对强度之比，即可算出氯的利用率，因此不需要另外的标定实验，从而避免了因标定带来的影响。该方法减小了测试误差，简化了实验过程，提高了测试效率。     

含腔电大尺寸导体目标电磁散射的一体化数值模拟

应用等效原理，通过引入口面上等效磁流将含腔导电目标电磁散射简化为腔内、外两个等效 问题. 腔内问题分段求解并应用级联法获得口面等效导纳矩阵；腔内外的耦合关系应用近似 边界元方法描述并由此获得口面等效磁流；最后，这一具有混合源的腔体内外一体化散射问 题则应用所提出的广义混合场积分方程方法建立电磁模型，并用多层快速多极子方法实现高 效数值求解. 实例计算结果与测试结果具有很好的一致性. 关键词： 含腔目标 电磁散射 混合场积分方程 数值分析     

X-ray metrology for advanced silicon processes

X-ray reflectivity (XRR), X-ray fluorescence (XRF) and small angle X-ray scattering (SAXS) techniques are used to the monitoring of Cu/porous low κ processes, which are developed for the next generation (≤65 nm) integrated circuits. Sensitivity of XRR and XRF is sufficient to detect drifts of the copper barrier layer, copper seed layer and Cu CMP (chemical-mechanical polishing) processes. Their metrology key parameters comply with production requirements. SAXS allows determining the pore structure of low κ films: average pore size and pore size distribution.     

Scattering from infinite rough tubular surfaces

We study the Helmholtz equation in the exterior of an infinite perturbed cylinder with a Dirichlet boundary condition. Existence and uniqueness of solutions are established using the variational technique introduced (SIAM J. Math. Anal. 2005; 37 (2):598–618). We also provide stability estimates with explicit dependence of the constants in terms of the frequency and the perturbed cylinder thickness. Copyright © 2006 John Wiley & Sons, Ltd.