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31.
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Conventionally, surface roughness is predominantly determined through the use of stylus instruments. However, there are certain limitations involved in the method, particularly when a test specimen, such as a silicon wafer, has a smooth mirror-like surface. Hence, it is necessary to explore alternative non-contact techniques. Light scattering has recently been gaining popularity as an optical technique to provide prompt and precise inspection of surface roughness. In this paper, the total integrated scattering (TIS) model is modified to retrieve parameters on surface micro-topography through light scattering. The applicability of the proposed modified TIS model is studied and compared with an atomic force microscope. Experimental results obtained show that the proposed technique is highly accurate for measuring surface roughness in the nanometer range. 相似文献
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35.
Soraya A. Khodier 《Optics & Laser Technology》2004,36(1):355-67
A combined interference and diffraction pattern, in the form of equidistant interference fringes, resulting from illuminating a vertical metallic wire by a laser beam is analyzed to measure the diameter of four standard wires. The diameters range from 170 to 450 μm. It is found that the error in the diameter measurements increases for small metallic wires and for small distances between the wire and the screen due to scattering effects. The intensity of the incident laser beam was controlled by a pair of sheet polaroids to minimize the scattered radiation. The used technique is highly sensitive, but requires controlled environmental conditions and absence of vibration effects. The expanded uncertainty for k=2 is calculated and found to decrease from U(D)=±1.45 μm for the wire of nominal diameter 170 μm to ±0.57 μm for the diameter 450 μm. 相似文献
36.
Miguel A. Arcones 《Annals of the Institute of Statistical Mathematics》1998,50(1):87-117
We consider exact weak and strong Bahadur-Kiefer representations of the least absolute deviation estimator for the linear regression model. The precise behavior of these representations is obtained under minimal conditions. 相似文献
37.
G. Carelli A. Di Siena N. Ioli A. Moretti G. Moruzzi F. Strumia 《International Journal of Infrared and Millimeter Waves》1994,15(4):619-633
We have measured the frequencies of four CH3OH far-infrared laser lines that were previously known only by wavelength measurement. Two of these lines turned out to be doublets, bringing the total number of measured lines to six. We can now confirm the assignments of five of them and definitely disprove the assignments proposed for the sixth.In particular we confirm the assignments for the four strong laser lines at 205 and 208 µm pumped by the 9-P(34) CO2 laser line. These lines share a common upper level in the first excited CO-stretch state, and terminate in the upper and lower levels of a hybrid state with J=5. Heterodyne frequency measurements and conventional microwave spectroscopy show that both lines are split into two components approximately 3.5 MHz apart. The origin of this further splitting is interpreted as a perturbed K-splitting.Work supported by Consiglio Nazionale delle Ricerche -Italia 相似文献
38.
Conducting drop tests to investigate impact behavior and identify failure mechanisms of small-size electronic products is
generally expensive and time-consuming. Nevertheless, strict drop/impact performance criteria for hand-held electronic products
such as cellular phones play a decisive role in the design because they must withstand unexpected shocks. The design of product
durability on impact has heavily relied on the designer's intuition and experience. In this study, a reliable drop/impact
simulation for a cellular phone is carried out using the explicit code LS-DYNA. Subsequently globallocal experimental verification
is accomplished by means of high-speed photography and impact response measurement. Using this methodology, we predict potential
damage locations in a cellular phone and compare them with real statistical data. It is envisaged that development of a reliable
methodology of drop/impact simulation will provide us with a powerful and efficient vehicle for improvement of the design
quality and reduction of the product development cycle. 相似文献
39.
田兴 《新疆大学学报(理工版)》1991,8(1):53-55
本文分析计算了荧光光纤温度传感器的温敏元件——GsAlAs/GaAs双异质结半导体材料的荧光辐射效率与激励光波长的关系。讨论了温度测量范围及温敏元件GaAlAs层铝含量对激励光源的限制,在0~200℃测温范围内,若采用LED作激励光源,其峰值波长应在0.70~0.76μm之间选择。 相似文献
40.
《Surface and interface analysis : SIA》2006,38(1):19-24
We have been developing a new analytical transmission electron microscope (TEM), called a coincidence TEM, which in principle enables elemental mapping images to be observed at a high signal‐to‐noise (S/N) ratio under very low dose radiation conditions. In this paper, we report the development of a coincidence TEM with a digital waveform measuring system for obtaining a coincidence elemental mapping image. In this system, analog signals detected by a Si(Li) detector and a multianode, position‐sensitive photomultiplier (PSPM) are continuously converted into 12‐bit digital waveform data at a rate of 100 MHz, and transferred to a PC. From the transferred digital waveform data, information on X‐ray photon energy, electron incident position, and detection times of both X rays and electrons are calculated by digital waveform measurement, which lead to the observation of a successful coincidence elemental mapping image. Copyright © 2005 John Wiley & Sons, Ltd. 相似文献