Effect of cocrystallization due to bile acid on molecular-ion sensitivity of biological phospholipids in Bi cluster time-of-flight secondary ion mass spectrometry measurements

Bi cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a useful method for evaluating organic surfaces. However, its ability to detect large molecules is limited. One of the problems is that the sensitivities of macromolecules are lower than those of small molecules because larger molecules tend to exhibit lower ionization efficiencies and/or higher probabilities of fragmentation. Matrix-enhanced (ME)-SIMS is a sensitivity enhancement technique for intact molecular ions. The crystal structure of a mixed substance composed of an analyte and a matrix is known to affect the sensitivity of the analysis target. In this study, the effect of cocrystallization, which occurs due to the presence of bile acid, on the molecular-ion sensitivity was investigated using Bi cluster TOF-SIMS. Biological phospholipids and bile acids, which exhibit surfactant behaviors, were selected as the evaluated molecules and additives, respectively. The mass spectra indicated that the secondary-ion yields of phospholipids with bile acid were substantially greater than those of the pristine lipid. Specifically, samples with an analyte/bile acid ratio of 1:100 achieved approximately 60–100-fold sensitivity enhancement of [M + H]⁺ and [2M + H]⁺ molecular ions than the sensitivity achieved with the pristine samples. In the evaluation of molecular distribution, higher signal counts of intact ions were obtained from the cocrystallization area, although less-fragmented ions were emitted from these regions. Consequently, the results indicate that the cocrystallization due to the presence of bile acid provides an effective crystal structure for facilitating emission of larger molecules.     

Thermal and Surface Analytical Study of Flame Retarded Polyolefins I. Interaction of Additives and Structure Formation

Pentaerythritol may react with tetraethoxy-silane and ammonium-polyphosphate in flame retarded polyolefins and an interfacial layer can be formed around the ammonium-polyphosphate particles. It is advantageous to study such systems using methods of thermal and surface analysis together. This revised version was published online in August 2006 with corrections to the Cover Date.     

Development of a highly sensitive analytical technique for surfactants by time-of-flight secondary ion mass spectrometry

We have developed a highly sensitive analytical technique for detecting the distribution of surfactants existing on a polymer surface. We studied the chemical modification of surfactants with the hydroxyl group by using amine-containing compounds in the gaseous phase at 23 °C; then, we performed measurements by using time-of-flight secondary ion mass spectrometry (TOF-SIMS). We found that 4-(dimethylamino) phenyl isocyanate as a modification reagent is capable of modifying the hydroxyl group when 1,8-diazabicyclo[5,4,0]undec-7-ene (DBU) is used as a catalytic agent. We demonstrated this modification with stearyl alcohol on a polymer material surface. The signal sensitivity of stearyl alcohol after the modification increased considerably in comparison with that of the unmodified stearyl alcohol. Moreover, we confirmed that this modification method can be used for the distribution analysis of surfactants. The distribution conditions of traces of surfactants with the hydroxyl group can be observed clearly by using this modification method.     

Surface segregational behaviour studied as an effect of thickness by SIMS and AFM in annealed PS-PMMA blend and block copolymer thin films

The surface behaviour of a two-phase polymer mixture depends on the chemical structure of the polymer components, the interaction between the two polymers and the processing conditions. The microscopic morphology and the surface composition need to be known in order to fully utilize the thin film properties. The technique of static time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used to obtain the molecular surface composition of thin films of blends and block copolymers. The depth profiling tool of Nano-SIMS, a dynamic SIMS technique, helps to provide the chemical mapping of the surface in 2D and 3D. The surface morphology is investigated using AFM. Thin films of PS and PMMA diblock copolymers with molecular weight of 12K-12K and 10K-10K and blends of PS/PMMA (10K/10K) for thicknesses ranging from 5 nm to 50 nm are examined. For the blends, the ToF-SIMS spectra for all the thicknesses show the same behaviour of a high increase of PMMA on the surface after annealing. Nano-SIMS images reveal the formation of nanostructures on the annealed surfaces and AFM studies show these nanostructures to be droplets having distinct phase shift from the surrounding matrix. The droplet dimensions increase with the increase of the thickness of the film but the absolute intensity from the ToF-SIMS spectra for all the annealed films remains almost the same. For the copolymers, the ToF-SIMS spectra show that there is a decrease of PMMA on the surface for the annealed films when compared to the as-cast ones. AFM morphology reveals that, for different thicknesses, annealing induces different topographical features like droplets, holes, spinodal patterns, etc. but with no distinct phase shift between the patterns and the surrounding matrix. The two different copolymers of comparable molecular weight are found to exhibit very different topography even when the thickness of the films remained the same. The surface composition from the ToF-SIMS data, however, was not found to vary even when the topography was completely different.     

Adsorption and interaction of organosilanes on TiO2 nanoparticles

Organosilanes with different organic functional groups are precursors of corresponding organosilanol which can be attached to the surface of oxide nanoparticles by silyation. In this work, surface of commercial TiO₂ nanoparticles was modified by 3-aminopropyltrimethoxysilane (APS) and phenyltrimethoxysilane (PTMS) through an aqueous process. The amount of adsorbed organosilane was evaluated by energy dispersive X-ray spectroscopy and was found to be 3 times higher on PTMS treated sample than on APS treated sample. The orientation and bonding of the molecules on particle surface was analyzed using Fourier transform infrared spectroscopy and time-of-flight secondary ion mass spectrometry. The obtained data confirmed that bonding of organosilanols on particle surface was realized through Si-O-Ti bonds and organic functional groups were extended away from particle surface on both APS and PTMS modified particles. It was found that phenylsilanol molecules are cross-linked to each other through Si-O-Si bonds, while such bonds are very little to none between aminosilanol molecules. A model of adsorption is proposed to explain these observations.     

Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement

In addition to structural information, a detailed knowledge of the local chemical environment proves to be of ever greater importance, for example for the development of new types of materials as well as for specific modifications of surfaces and interfaces in multiple fields of materials science or various biomedical and chemical applications. But the ongoing miniaturization and therefore reduction of the amount of material available for analysis constitute a challenge to the detection limits of analytical methods. In the case of time-of-flight secondary ion mass spectrometry (TOF-SIMS), several methods of secondary ion yield enhancement have been proposed. This paper focuses on the investigation of the effects of two of these methods, metal-assisted SIMS and polyatomic primary ion bombardment. For this purpose, thicker layers of polystyrene (PS), both pristine and metallized with different amounts of gold, were analyzed using monoatomic (Ar⁺, Ga⁺, Xe⁺, Bi⁺) and polyatomic (SF₅⁺, Bi₃⁺, C₆₀⁺) primary ions. It was found that polyatomic ions generally induce a significant increase of the secondary ion yield. On the other hand, with gold deposition, a yield enhancement can only be detected for monoatomic ion bombardment.     

The effect of angle of incidence to low damage sputtering of organic polymers using a C60 ion beam

The effect of angle of incidence of C₆₀ ion beam for low damage polymer depth profiling on TOF-SIMS and XPS has been investigated. In this study, TOF-SIMS and XPS depth profiles were taken at several angles of incidence of C₆₀ ion beam and the results were compared with each other. By using a higher angle of incidence, in XPS analysis, the changes of atomic concentration for polyethyleneterephthalate (PET) were suppressed. In TOF-SIMS analysis, the degradations of fragment ion intensity for PET and polystyrene (PS) were also suppressed at a higher angle of incidence. Although the information depth of TOF-SIMS is different from that of XPS, both results suggested that a higher angle of incidence is a better condition for low damage polymer depth profiling.     

Resonance enhanced multi-photon ionization of neutral atoms sputtered with Ga-FIB

Resonance enhanced multi-photon ionization (REMPI) of neutral aluminum atoms sputtered with gallium focused ion beam (Ga-FIB) was studied in terms of substrate temperature and chemical state of the surfaces. Aluminum has the lowest excitation state (3p ²P_3/2) at 112 cm⁻¹ above the ground state (3p ²P_1/2). The results showed that the total REMPI signal intensity of neutral aluminum atoms and the ratio of REMPI signal intensities attributed to ²P_1/2 to ²P_3/2 were increased at higher temperature. On the other hand, the REMPI signal and the ratio were decreased in the case of partially oxidized aluminum surfaces. Considering the result on Al₂O₃, it was confirmed that the REMPI signals of ground state ²P_1/2 and the first excited spate ²P_1/2 could be affected with surface oxidation state.     

Primary ion fluence dependence in time-of-flight SIMS of self-assembled monolayer of alkyl thiol molecules on Au(1 1 1)—Discussion of static limit

The nondestructive nature of static secondary ion mass spectrometry (SIMS) in the context of studies of self-assembled monolayers (SAMs) of organic molecules has been examined by measuring the primary ion fluence dependence of secondary ion signals with two well-known SAMs, C₁₈H₃₇SH on Au(1 1 1) and C₁₈H₃₇PO₃H₂ on freshly cleaved mica. This SIMS analysis is challenging because the bonding nature is delicate and the areal molecular density is less than 10¹⁵ cm⁻². In SIMS, it is prevalently assumed that if the primary ion fluence is confined to not more than 1 × 10¹² cm⁻², all secondary ion signals should not change by more than 10% and the practically defined static condition is satisfied. Our results from time-of-flight SIMS with the common primary ions of Bi₃⁺, Bi⁺ and Ar⁺, indicate that this prevalent static assumption fails for both model SAMs. The SIMS results from the phosphyl case, which have been recently published, consistently display the evidence of bombardment-induced damage. In comparison, the thiol case presented here shows much more complex primary ion fluence dependence of SIMS signals. It is therefore concluded that practical static analysis should use primary ion fluence not more than 1 × 10¹¹ cm⁻² or should simply record and report the effects of primary ion fluence.     

C60 sputtering of organics: A study using TOF-SIMS, XPS and nanoindentation

Sputtering of organic materials using a C₆₀ primary ion beam has been demonstrated to produce significantly less accumulated damage compared to sputtering with monatomic and atomic-cluster ion beams. However, much about the dynamics of C₆₀ sputtering remains to be understood. We introduce data regarding the dynamics of C₆₀ sputtering by evaluating TOF-SIMS depth profiles of bulk poly(methyl methacrylate) (PMMA). Bulk PMMA provides an ideal test matrix with which to probe C₆₀ sputter dynamics because there is a region of steady-state secondary ion yield followed by irreversible signal degradation. C₆₀ sputtering of PMMA is evaluated as a function of incident ion kinetic energy using 10 keV C₆₀⁺, 20 keV C₆₀⁺ and 40 keV C₆₀⁺⁺ primary ions. Changes in PMMA chemistry, carbon accumulation and graphitization, and topography as a function of total C₆₀ ion dose at each accelerating potential is addressed.