非正态变异下的非线性轮廓异常点识别方法研究

在质量控制领域,非线性轮廓异常点识别问题是重点研究问题之一。本文综合运用了小波分析、数据深度、聚类分析等数据分析处理技术,提出了一种新的非正态变异的异常点识别方法。文章通过仿真分析技术,将新方法χ²与控制图方法进行性能对比,结果证实新方法能够以更高的准确率和稳定性识别异常点,表现出更好的异常点识别性能。最后将新方法应用于木板垂直密度轮廓实例对新方法进行验证,分析结果表明本方法能够有效识别出异常轮廓数据。     

Effective detection of benzoyl peroxide in flour based on parameter selection of Raman hyperspectral system

Penetration depth and spatial resolution of Raman hyperspectral imaging system were studied for effective detection of benzoyl peroxide in flour. The determinations of parameters were achieved by using the single-band background-correct image of a benzoyl peroxide Raman characteristic band and a simple threshold method. The selected parameters were used to detect mixture samples with different concentrations. Percentage of detected benzoyl peroxide pixels was positively correlated to its concentration. The result shows that parameters selected in this study are effective for the detection of benzoyl peroxide additive in flour and can be used for quantitative analysis in the future.     

Implementation of depth-dependent soil concentrations in multimedia mass balance models

In standard multimedia mass balance models, the soil compartment is modeled as a box with uniform concentrations, which often does not correspond with actual field situations. Therefore, the theoretically expected decrease of soil concentrations with depth was implemented in the multimedia model SimpleBox 3.0. The effects of this implementation on the model outcomes were explored for nine compounds in four environmental compartments. For compounds with a low penetration depth, the new model predicts substantially higher or lower concentrations in the vegetation compartment than the old model. For those compounds, predicted concentrations in surface water and air were higher in the new model, but the deviations from the old model were smaller than in the vegetation compartment. For compounds with a large penetration depth, the model adaptations show little effect. No field study was carried out to validate the results of the model calculations, but we did collect measured data on concentrations in vertical soil profiles from literature. According to those data, we concluded that the implementation of depth dependent soil concentrations might be a useful extension for steady state multimedia mass balance models. More field study has to be carried out to validate the model outcomes.     

Experimental shift allowance in the deconvolution of SIMS depth profiles

We study the deconvolution of the secondary ion mass spectrometry (SIMS) depth profiles of silicon and gallium arsenide structures with doped thin layers. Special attention is paid to allowance for the instrumental shift of experimental SIMS depth profiles. This effect is taken into account by using Hofmann's mixing‐roughness‐information depth model to determine the depth resolution function. The ill‐posed inverse problem is solved in the Fourier space using the Tikhonov regularization method. The proposed deconvolution algorithm has been tested on various simulated and real structures. It is shown that the algorithm can improve the SIMS depth profiling relevancy and depth resolution. The implemented shift allowance method avoids significant systematic errors of determination of the near‐surface delta‐doped layer position. Copyright © 2013 John Wiley & Sons, Ltd.     

An analytical depth resolution function for the MRI model

The mixing roughness information depth model is frequently used for the quantification of sputter depth profiles. In general, the solution of the convolution integral for any kind of in‐depth distributions is achieved by numerical methods. For a thin delta layer, an analytical depth resolution function is presented, which enables a simple and user‐friendly quantification of measured delta layer profiles in AES, XPS and SIMS. Copyright © 2013 John Wiley & Sons, Ltd.     

Characterization of size‐segregated aerosols using ToF‐SIMS imaging and depth profiling

Size‐segregated particles were collected with a ten‐stage micro‐orifice uniform deposit impactor from a busy walkway in a downtown area of Hong Kong. The surface chemical compositions of aerosol samples from each stage were analyzed using time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) operated in the static mode. The ToF‐SIMS spectra of particles from stage 2 (5.6–10 µm), stage 6 (0.56–1 µm), and stage 10 (0.056–0.1 µm) were compared, and the positive ion spectra from stage 2 to stage 10 were analyzed with principal component analysis (PCA). Both spectral analysis and PCA results show that the coarse‐mode particles were associated with inorganic ions, while the fine particles were associated with organic ions. PCA results further show that the particle surface compositions were size dependent. Particles from the same mode exhibited more similar surface features. Particles from stage 2 (5.6–10 µm), stage 6 (0.56–1 µm), and stage 10 (0.056–0.1 µm) were further selected as representatives of the three modes, and the chemical compositions of these modes of particles were examined using ToF‐SIMS imaging and depth profiling. The results reveal a non‐uniform chemical distribution from the outer to the inner layer of the particles. The coarse‐mode particles were shown to contain inorganic salts beneath the organics surface. The accumulation‐mode particles contained sulfate, nitrate, ammonium salts, and silicate in the regions below a thick surface layer of organic species. The nucleation‐mode particles consisted mainly of soot particles with a surface coated with sulfate, hydrocarbons, and, possibly, fullerenic carbon. The study demonstrated the capability of ToF‐SIMS depth profiling and imaging in characterizing both the surface and the region beneath the surface of aerosol particles. It also revealed the complex heterogeneity of chemical composition in size and depth distributions of atmospheric particles. Copyright © 2014 John Wiley & Sons, Ltd.     

Investigation of block depth distribution in PS‐b‐PMMA block copolymer using ultra‐low‐energy cesium sputtering in ToF‐SIMS

Directed self‐assembly of block copolymers (BCPs) is a promising candidate for next generation nanolithography. In order to validate a given pattern, the lateral and in‐depth distributions of the blocks should be well characterized; for the latter, time‐of‐flight (ToF) SIMS is a particularly well‐adapted technique. Here, we use an ION‐TOF ToF‐SIMS V in negative mode to provide qualitative information on the in‐depth organization of polystyrene‐b‐polymethylmethacrylate (PS‐b‐PMMA) BCP thin films. Using low‐energy Cs⁺ sputtering and Bi₃⁺ as the analysis ions, PS and PMMA homopolymer films are first analyzed in order to identify the characteristic secondary ions for each block. PS‐b‐PMMA BCPs are then characterized showing that self‐assembled nanodomains are clearly observed after annealing. We also demonstrate that the ToF‐SIMS technique is able to distinguish between the different morphologies of BCP investigated in this work (lamellae, spheres or cylinders). ToF‐SIMS characterization on BCP is in good agreement with XPS analysis performed on the same samples. Copyright © 2013 John Wiley & Sons, Ltd.     

Fabrication and characteristics of self‐aggregation nanoparticles used for conformance control treatment

In order to alleviate the contradiction between injectability of the profile control agent and its profile control performance, a novel core‐shell heterogeneous structure colloidal particles (CSA) were synthesized, and the mechanism of self‐aggregation plugging was proposed. Cross‐linking inside the nanoparticles and chain‐growth polymerization via capturing acrylamide in the aqueous phase result in the formation of core‐shell heterogeneous structures as proved by TEM observation and XPS analysis. Moreover, CSA nanoparticles exhibit good hydrophilic properties, outstanding thermal stability and limited expansion capacity. Effects of different metal cations and surface group on the self‐aggregation time of CSA nanoparticles were systematically studied. Results showed that divalent cations contributed to more significant aggregation of CSA nanoparticles in comparison to monovalent cations. The increasing cations concentration and valency decreased the thickness of electric double layer, which lead to a decrease in the zeta potential. Core flooding test shows that the injection of nanoparticles which diameter is much smaller that of pore‐throats into the target reservoir can not only successfully enter the depth of porous media, but also effectively block the high permeability areas by the formation of self‐aggregation particle clusters. This study provides a new method for the equilibrium between nanoparticles injectivity and in‐depth profile control of nanoparticles.     

Chemical depth profiling and 3D reconstruction of III–V heterostructures selectively grown on non‐planar Si substrates by MOCVD

The chemical characterization of novel 3D architectures with nanometre‐scale dimensions is extremely challenging. The chemical composition of InGaAs/AlAs quantum wells selectively grown in SiO₂ trenches, 100–300 nm wide, is studied. Combining high lateral resolution 3D ToF‐SIMS analysis and Auger measurements, the chemical composition of individual trenches was obtained confirming the uniformity of these III–V heterostructures. These results correlate well with an average approach using SIMS depth profiling. The effects of ion beam orientation on the surface topography of confined structures were highlighted. (© 2015 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)