Double threshold behaviour of I－V characteristics of CoSi2/Si Schottky contacts

The forward current－voltage (I－V) characteristics of polycrystalline CoSi₂/n-Si(100) Schottky contacts have been measured in a wide temperature range. At low temperatures (≤200K), a plateau-like section is observed in the I－V characteristics around 10^-4A·cm^-2. The current in the small bias region significantly exceeds that expected by the model based on thermionic emission (TE) and a Gaussian distribution of Schottky barrier height (SBH). Such a double threshold behaviour can be explained by the barrier height inhomogeneity, i.e. at low temperatures the current through some patches with low SBH dominates at small bias region. With increasing bias voltage, the Ohmic effect becomes important and the current through the whole junction area exceeds the patch current, thus resulting in a plateau-like section in the I－V curves at moderate bias. For the polycrystalline CoSi₂/Si contacts studied in this paper, the apparent ideality factor of the patch current is much larger than that calculated from the TE model taking the pinch-off effect into account. This suggests that the current flowing through these patches is of the tunnelling type, rather than the thermionic emission type. The experimental I－V characteristics can be fitted reasonably well in the whole temperature region using the model based on tunnelling and pinch-off.     

ITON Schottky contacts for GaN based UV photodetectors

Lateral Schottky ultraviolet detectors were fabricated in GaN using indium-tin-oxynitride (ITON) as a contact metal. The GaN semiconductor material was grown on 2 in. sapphire substrate by metal-organic chemical vapor deposition (MOCVD). The Schottky contact has been realized using ITON that has been deposited using sputter techniques. I-V characteristics have been measured with and without UV illumination. The device shows photo-to-dark current ratios of 10³ at −1 V bias. The spectral responsivity of the UV detectors has been determined. The high spectral responsivity of more than 30 A/W at 240 nm is explained by a high internal gain caused by generation-recombination centers at the ITON/GaN interface. Persistent photocurrent effect has been observed in UV light (on-off) switching operation, time constant and electron capture coefficient of the transition has been determined.     

Electronic States and Schottky Barrier Height at Metal/MgO(100) Interfaces

Using an ab initio total energy approach, we study the electronic structure of metal/MgO(100) interfaces. By considering simple and transition metals, different adsorption sites and different interface separations, we analyze the influence of the character of metal and of the detailed interfacial atomic structure. We calculate the interface density of states, electron transfer, electric dipole, and the Schottky barrier height. We characterize three types of electronic states: states due to chemical bonding which appear at well defined energies, conventional metal-induced gap states associated to a smooth density of states in the MgO gap region, and metal band distortions due to polarization by the electrostatic field of the ionic substrate. We point out that, with respect to the extended Schottky limit, the interface formation yields an electric dipole mainly determined by the substrate characteristics. Indeed, the metal-dependent contributions (interfacial states and electron transfer) remain small with respect to the metal polarization induced by the substrate electrostatic field.     

Low frequency characteristics of a quasioptical Schottky diode detector part I: Theory

A theoretical study is made of saturation effects of FIR point contacts Schottky diodes when used in the envelope detection mode of operation. A model is described that fits experimental results for radiation wavelength ranging from microwaves down to FIR wavelengths. This model permits the prediction of saturation levels throughout this range.     

Optimum coupling of a Gaussian beam to a corner reflector with a four-wavelength antenna

The coupling of a Gaussian radiation beam to a corner reflector with a four-wavelength long wire antenna was studied theoretically and experimentally. The antenna configuration in conjunction with a Schottky barrier diode is recently used widely as a fast submillimeter wave detector. The optimum angle focusing the radiation to the antenna has been obtained and is 11° (half-width at the 8.7dB points).     

太赫兹GaAs肖特基混频二极管高频特性分析

在太赫兹波段,存在几种新的高频效应会限制混频二极管的高频特性.应用热电子发射理论和隧道理论,研究了外延层肖特基二极管的高频特性,并以截止频率为品质因数对二极管进行优化设计.研究表明,当二极管工作频率大于等离子频率时,二极管相当于一个电容,失去了混频性能;提高基底掺杂浓度可以减小基底等离子共振效应;外延层等离子频率非常重要并且在研究外延层等离子共振效应时必须考虑传输时间效应;减小阳极直径、减小外延层厚度、提高外延层掺杂浓度可以提高二极管的工作频率.这对太赫兹波段室温混频器件的研制具有重要的参考价值.     

双层钙钛矿La1.8Ca1.2Mn2O7磁性相关I-V非线性与电输运性质

采用传统固相反应法制备了双层钙钛矿结构锰氧化物La_1.8Ca_1.2Mn₂O₇陶瓷,并用X射线粉末衍射法,扫描电镜,HL5500PC Hall效应分析仪和综合物性测量系统(PPMS)对其磁、电性质进行了表征.结果表明:经过两次高温烧结可合成具有双层Sr₃Ti₂O₇型四方结构的La_1.8Ca_1.2Mn_2<     

Current-voltage characterization of Au contact on sol-gel ZnO films with and without conducting polymer

This study investigates the current density-voltage (J-V) characteristics of Au/n-type ZnO and Au/polyaniline (PANI)/n-type ZnO devices. ZnO films were prepared by the sol-gel method. For Au/n-type ZnO devices, native defects and impurities resident within the ZnO depletion region contribute to barrier thinning of, carrier hopping across, and tunneling through the Schottky barrier. This leads to the formation of nonalloyed ohmic contacts. However, rectifying junctions were formed on n-type ZnO by employing the simple technique of spin-coating PANI to act as the electron-blocking layer. Our present results suggest that the ZnO depletion region at the PANI/n-type ZnO interface is not the origin of the rectifying behavior of Au/PANI/n-type ZnO contact. In addition, the presence of the built-in potential of Au/PANI/n-type ZnO devices could result in the shift of the J-V curve toward negative voltage. Excellent agreement between simulated and measured data was obtained when the built-in potential was taken into account in the J-V relationship.     

Leakage currents in ferroelectric thin films

The main mechanisms of leakage currents in thin lead zirconate titanate (PZT) ferroelectric films prepared by the sol–gel method are discussed. Four specific regions are determined in I–V dependencies. At very weak fields (10–20 kV/cm), the current falls with the voltage increase as a result of depolarization. In the low fields region (about 70–100 kV/cm), the leakage current decreases with the decrease of voltage ramp speed and its components are the ohmic and displacement currents. In the high fields region (≥130 kV/cm), the leakage current increases with the decrease of step voltage ramp in contrast to the previous case. Possible conductivity mechanisms are the Poole– Frenkel emission and hopping conduction. In the transition region between above-mentioned ones (from 80–90 to ～130 kV/cm), an abrupt unstable increase of current is observed caused by breakdown of reverse bias Schottky barrier. Depolarization currents are studied for sol–gel PZT films prepared at different preparation conditions.