法布里-珀罗标准具和共焦球面扫描干涉仪的调节

观察法布里—珀罗标准具和共焦球面扫描干涉仪在共焦前后的多光束干涉图像,根据干涉条纹的变化和干涉仪频谱信号强弱进行精确调焦的方法,提高了实验效率并且得到了较好的实验结果。     

迈克尔逊干涉仪干涉环纹光电计数器的研制

利用干涉环纹明暗交替变化的原理,设计制作了可以用于迈克尔逊干涉仪的干涉环纹计数的光电计数器,利用此仪器可以精确高效地实现干涉环纹的计数,减少了由于人眼进行干涉环纹计数的误差,提高了实验稳定度和精度。我们将制作的干涉环纹光电计数器用于基于迈克尔逊干涉仪的激光波长实验,结果表明采用光电计数器之后,实验精度比裸眼探测明显提高,百分差缩小37.5倍,标准差缩小近3倍。     

计算电容中Fabry-Perot干涉仪测量位移的相位修正方法

计算电容是复现电学阻抗单位的基准装置, 利用计算电容值和量子霍尔电阻值可以准确计算出精细结构常数α. 计算电容的本质是通过高准确度地测量屏蔽电极的位移, 实现对电容量值的测量. 因此, 基于Fabry-Perot干涉仪的精密电极位移测量系统是计算电容装置中最为核心和关键的部分. 在Fabry-Perot干涉仪测位移过程中, 由于高斯激光束存在轴向Gouy相位, 该附加相位将会引起相邻干涉条纹对应位移的变化(大于或者小于λ/2), 导致位移的测量值与实际值存在偏差. 本文阐述了高斯激光场的传播特性, 利用高斯激光束在自由空间和透过薄透镜复振幅的变换关系, 建立了计算电容装置中Fabry-Perot干涉仪透射光束的传输模型; 通过对不同腔长的Fabry-Perot干涉仪透射光场相位的分析, 获得了高斯激光束轴向Gouy相位修正与传输距离的关系. 结果表明, 当腔长从111.3 mm移动至316.3 mm时, 在接收距离为560 mm的情况下, 高斯光束轴向Gouy 相位引起的位移修正的绝对值最小为0.7 nm, 其相对相位修正量|δL|/|ΔL| = 3.4×10^-9.     

Michelson干涉仪式光纤空气声传感器

介绍了一种用于直升机等低空目标探测的光纤空气声传感器.该传感器基于光纤Michelson干涉仪的原理,结合弹性盘片的应力应变理论分析和光纤粘接的工艺设计,采用相位载波解调技术进行信号解调.对比实验测试验证了这种声音探测技术可行性.传感器理论灵敏度为2.38 rad/Pa,实测灵敏度为1.5 rad/Pa,采用PGC相位解调理论最小可探测的最小声信号为6.7 μPa,即9.5 dB.传感器在20～300 Hz范围内响应基本平坦.结合声音传播规律分析并肯定其在实用中的可行性.     

消除外界振动影响的象面全息干涉计量

本文提出了参考光和物光采用公共路径进行象面全息干涉计量的一种新方法,消除了外界振动的影响,并且利用象面全息图可以用白光再现,也减少了相干噪声     

Real Time Correction and Evaluation of Nonlinear Errors in Single Frequency Interferometers

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铊玻璃自聚焦透镜边缘折射率分布的改进

本文用雅明干涉仪测定第一次离子交换后的径向折射率分布,边缘部分与理想分布有极大的偏差。在此基础上并进行了第二步高于交换,测定其边缘分布有进一步改进,同时,第二次成象比第一次有明显的改善。     

Sinusoidal Phase-Modulating Superluminescent Diode Interferometer with Fabry-Perot Etalone for Step-Profile Measurement

In this paper we use a superluminescent diode (SLD) as the light source of an interferometer and extract a narrow spectrum from a wide spectrum of the SLD with a Fabry-Perot Etalone (FPE). By varying sinusoidally the distance between the two mirrors of FPE, the central wavelength of the narrow spectrum is scanned sinusoidally. The distance between the mirrors is exactly set by a feedback control system, and sinusoidal phase-modulated SLD light that has a large scanning width of about 10 nm can be obtained with high stability and spatial uniformity. The phase of the interference signal has two different components. One is amplitude Z_b of sinusoidal phase modulation, which is proportional to the optical path difference (OPD) and the scanning width. The other is conventional phase α, which provides a fractional value of the OPD in the range of the wavelength. By combining the two values of the OPD obtained from Z_b and α, an exact OPD larger than the wavelength can be measure with ment accuracy in α. Characteristics of the interferometer are made clearly through step-profile measurements.     

Error-Compensating Phase Measuring Algorithms in a Fizeau Inter ferometer

In phase-shifting Fizeau interferometers, nonlinear motion of the phase shifter and multiple-beam interference are the most common sources of systematic errors affecting high-precision phase measurement. A new class of algorithms with extended compensating capability for these errors is proposed. Measurement errors for the new algorithms and two groups of conventional algorithms: discrete Fourier algorithms and the Schwider-Larkin-Hibino algorithms are estimated as a function of the number of sampled images when these systematic error sources are equally dominant. It is shown that the conventional phase-measuring algorithms produce significant errors when the reflectivity of the testing surface exceeds ten percent. Also, these algorithms have an optimum number of samples at around seven with which the residual errors become minimum. The new class of algorithms shows a substantial reduction of the residual errors when the number of samples exceeds ten. There is no optimum number of samples for the new algorithms. For fewer than six samples, discrete Fourier algorithms which have no error-compensating capability for the nonlinearity of phase modulation give a minimum error.     

Heterodyne Interferometers Using Orthogonally Polarized and Two-Frequency Shifted Light Sources with Super-high Extinction Ratio

This paper describes heterodyne interferometers using orthogonally polarized and two-frequency shifted light sources of two types with super-high extinction ratio to reduce non-linearity of the interferometer due to polarization cross-talk. The acousto-optic modulators are used to shift light frequency. In the first interferometer the light source with Glan-Thomson prisms of very high extinction ratio (50 dB) is used to make the polarization cross-talk very small. In the second interferometer the light source of two-frequency shifted beams with small crossing angle (2.5 rnrad-10 mrad) is used to completely exclude non-linearity of the interferometer due to polarization cross-talk. By measuring the thickness of vacuum evaporation film, it was demonstrated that the interferometers are useful to measure thickness of a thin film in nanometer order.