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41.
Four simple methods are evaluated to determine their accuracies for establishing the interface location in secondary ion mass spectrometry intensity depth profiles of organic layers where matrix effects have not been measured. Accurate location requires the separate measurement of each ion's matrix factor. This is often not possible, and so estimates using matrix-less methods are required. Six pure organic material interfaces are measured using many secondary ions to compare their locations from the four methods with those from full evaluation with matrix terms. For different secondary ions, matrix effects cause the apparent interface positions to vary over 20 nm. The shifts in the intensity profiles on going from a layer of P into a layer of Q are in the opposite direction to that for going from Q into P, so doubling layer thickness errors. The four methods are as follows: M1, use of the median interface position in the intensity profiles for the five lightest ions for 15 ≤ m/z ≤ 150; M2, extrapolation of the position for each ion to m/z = 0 for ions with m/z ≤ 150; M3, as M2 but for m/z ≤ 300; and M4, the extreme positions for all m/z ≤ 100. Comparison with the location using matrix terms shows their ranking, from best to worst, to be M4, M3, M1, and M2 with average errors of 10%, 12%, 14%, and 17%, respectively, of the profile interface full widths at half maximum. Use of pseudo-molecular ions is very much poorer, exceeding 50%, and should be avoided.  相似文献   
42.
 Strain effects on semiconductor layers were studied by means of optical spectroscopic techniques with a device developed especially for the study of layered structures and microstructures. Raman, modulated photoreflectance and reflectance anisotropy spectroscopy (RAS) were applied. Measurements were performed on elemental semiconductors (Si), semiconductor alloys (Si–Ge) and III–V semiconductor compounds (GaAs). By application of RAS, strains lower than 10−4 could be resolved, which is at least one order of magnitude lower than those observable with Raman and modulated reflectance techniques. The RAS spectra of layers strained along either the [010] or [011] direction showed a derivative-like structure at E1-gap energies, which increased linearly and very quickly with increasing strain. The dependence of this spectral feature on applied strain was used to evaluate strain-dependent effects. This behaviour strongly suggests that RAS can be applied for the optical characterisation of strain in semiconductor microstructures and devices, with a higher efficiency and accuracy than that achieved by previously established optical methods such as Raman and modulation spectroscopy. In addition, the compactness and ease of operation of the instrumentation of RAS provides considerable potential for in situ monitoring/control of semiconductor fabrication conditions.  相似文献   
43.
具有自增湿能力的低温质子交换膜燃料电池膜电极是实现自增湿燃料电池的重要途径,对于燃料电池的商业化具有十分重要的意义,它不仅可以大幅度减小燃料电池系统的体积,提升燃料电池系统的输出功率密度,还可以有效降低燃料电池的制造成本. 目前,低温质子交换膜燃料电池自增湿膜电极的研究主要是集中在构建具有自增湿能力的质子交换膜、自增湿催化层和复合自增湿层三个方面. 本文主要从这三个方面系统介绍近年来国内外低温质子交换膜燃料电池自增湿膜电极方面的研究进展和发展趋势.  相似文献   
44.
Oxygen reduction reaction (ORR) is one of the most technologically relevant reactions. It occurs at the interface of the electrocatalyst and electrolyte, where oxygen reacts with protons and electrons to produce water. Because the electrocatalyst is dispersed on a high surface area support, morphological confinement becomes critical, as it dictates proton and oxygen transport. Furthermore, confinement is induced by ionomer, ionic liquids (ILs), or molecular additives, and their impact on electrocatalyst reactivity and transport properties is currently not well understood. We present an overview of electrostatics and mass transport–induced confinement and zoom in into ILs and molecular additives and try to unravel how local confinement induced by them impacts ORR.  相似文献   
45.
Sodium insertion in the tetrahedral layer structure of the ferrites Ba2−xSrxFe4O8 was performed by solid state reaction at 1220 K in air. Superstoichiometric oxides with the actual formula (Ba2−xSrx)1−y/4NayFe4O8y0.56; 0.60Ba/Sr1.67—were characterized by X-ray and neutron powder diffraction. The hexagonal unit-cell volume shows an increasing dependence on the sodium insertion when the Ba/Sr ratio reaches the largest values. The marked expansion of the c parameter is the likely signature of the location of the inserted sodium cations within the interlayer space. One-half of the sodium cations partly sits on the Sr(Ba) sites in octahedral coordination and the other half occupies extra octahedral and tetrahedral sites. ac conductivity measurements point to a cationic conductivity whose thermally activated regime—Ea 0.7 eV—evidenced from 570 K, is unsensitive to the sodium content. The bottleneck of the 2D sodium mobility regards the crossing of the oxygen triangular faces shared by the different polyhedra within the interlayer space.  相似文献   
46.
47.
Two new metal succinates modified by rigid bipyridines, Cd(4, 4′‐bpy)(C4H4O4)·1/4H2O ( 1 ) and Cu(2, 2′‐bpy)(C4H4O4)0.5(NO3)(H2O) ( 2 ) (bpy = bipyridine), have been synthesized by hydrothermal reactions and structurally determined. Complex 1 crystallizes in the orthorhombic space group Cmca with the cell parameters a = 11.696(2), b = 15.554(2), c = 15.874(3) Å, α = β = γ = 90.00°, V = 2888(3) Å3, Z = 8. Complex 2 crystallizes in the triclinic space group with a = 7.077(1), b = 9.838(2), c = 10.461(2) Å, α = 71.941(3)°, β = 73.078(3)°, γ = 74.502(3)°, V = 649.8(2) Å3, Z = 2. In complex 1 , a 2‐D network was formed by Cd‐succinato bonding. The 2‐D networks are pillared by 4, 4′‐bpy ligands, forming a 3‐D grid framework. The 2‐fold interpenetration of the resulting 3‐D frameworks completes the molecular structure. In complex 2 , the CuII atom adopts a distorted octahedral in which the CuII atoms are bridged by two H2O molecules into an infinite zigzag chain, [Cu2(H2O)2(C4H4O4)]n. The neighboring chains are further linked by π‐π stacking interactions into a 2‐D network, and the interlayer hydrogen bonds lead to the final 3‐D crystal structure.  相似文献   
48.
We study the deconvolution of the secondary ion mass spectrometry (SIMS) depth profiles of silicon and gallium arsenide structures with doped thin layers. Special attention is paid to allowance for the instrumental shift of experimental SIMS depth profiles. This effect is taken into account by using Hofmann's mixing‐roughness‐information depth model to determine the depth resolution function. The ill‐posed inverse problem is solved in the Fourier space using the Tikhonov regularization method. The proposed deconvolution algorithm has been tested on various simulated and real structures. It is shown that the algorithm can improve the SIMS depth profiling relevancy and depth resolution. The implemented shift allowance method avoids significant systematic errors of determination of the near‐surface delta‐doped layer position. Copyright © 2013 John Wiley & Sons, Ltd.  相似文献   
49.
Summary The regularities previously established in salting-out thin-layer chromatography on silica gel of Co(III) complexes, in which the side chains of a specific chelate ring were successively increased in length, were also found to be valid for two series of Co(III) complexes of the EDTA type, in which different chelate rings were enlarged by one CH2 group. It was found that in the case of complexes of the EDTA type the salting-out efficiencies were practically the same for all members of a series, while the values of the separation factors were paractically independent of the ammonium sulphate concentration in the solvent system used. The results obtained were consistent with the mechanism of nonspecific hydrophobic interactions. The method used can be applied to the separation of the members of the series of complexes that we investigated.  相似文献   
50.
Intercalationchemistryoflayeredtransitionmetaldisulfideshasbeenextensivelystudiedinthepastyears[1].Ithasbeenestablishedthattheintercalationreactiondependsstronglyonelectronicstructureofthetransitionmetaldisulfides.Forinstance,variousguestmoleculeshavebe…  相似文献   
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