Fractal surface for calibration of an optical profiler

The surface profiler has become a basic metrology tool for the characterization of high-quality optical surfaces. The unknown effective resolution of the surface profiler is problematic in using the instrument, as it distorts the measured surface profile. In this paper, we suggest and describe the use of a fractal surface as a standard test surface with which to calibrate the effective resolution of a surface profiler. Fractal surfaces have the characteristics of irregularity, self-similarity and low correlation, with the correlation length being approximately equal to the length of the profile; therefore, a log-log plot of the power spectral density curve is a straight line. The power spectral density curves of fractal surfaces, which can be acquired through surface characterization techniques such as atomic force microscopy, are fitted to a straight line to act as a standard with which to calibrate an optical profiler in different ranges. Through calibration, we can obtain the effective resolution of the optical profiler, and the surface profiler is found to have good transmission capacity within the effective spatial frequency range.     

K_2(9~1∑~+_g)高位电子态与H_2碰撞中H_2的能量分布

光学-光学双共振激发K2到91∑+g高位态,研究了K2(91∑+g)与H2的电子-振转碰撞能量转移。利用相干反斯托克斯(CARS)光谱技术探测H2的振转态分布,扫描CARS谱表明H2在(1,1)、(2,1)、(2,2)、(3,1)、(3,2)、(3,3)和(3,5)能级上有布居。由时间分辨CARS轮廓得到H2各振转能级上粒子数之比,得到H2的平均振动能和平均转动能分别为9063cm-1和388cm-1。从91∑+g→11∑+u、11∑+u→11∑+g、33∏g→13∑+u跃迁的时间分辨激光感应荧光(LIF)强度得到它们的自发辐射率和碰撞转移率。在H2压强为3×103Pa时,K2(91∑+g)与H2的碰撞转移能为16930cm-1。H2的平均振转能占平均转移能的56%。     

CCD对高空间分辨率波前干涉检测的影响

推导并用实验验证了光强与入射波前在单位像元面积里成近似线性关系,从而得到入射波前经CCD采样后的功率谱密度（PSD）公式.根据该公式,模拟分析了影响CCD采集系统的系统传递函数的各个因素：入射波前、CCD的填充因子及CCD的曝光时间,得出了他们与系统传递函数的定性关系,并且通过实验明确CCD曝光时间对高空间分辨率波前检测不确定度的影响,为高空间分辨率干涉设计提供了理论依据.     

高强度三次谐波转换对光束质量的影响

分别利用光强对比度和功率谱密度作为激光束的振幅调制和位相畸变的定量描述参量,研究了在高功率条件下,三次谐波转换过程对激光光束质量的影响,详细分析了基频光的光束质量与三倍频光光束质量的定量变化关系.     

物质抗磁性的经典统计解释

介绍一种解释物质抗磁性的经典统计方法.     

A five-channel grating spectrometer for millimeter-waves

A five-channel grating spectrometer for use in millimeter wave band (25100GHz) is described with its design theory of optical path, and measured results of insertion loss and resolving power.     

Distance-dependent fluorescence quenching ofN-acetyl-l-tryptophanamide by acrylamide

We examined the time-dependent intensity decays ofN-acetyl-l-tryptophanamide (NATA) when collisionally quenched by acrylamide in propylene glycol over a range of temperatures. The intensity decays of NATA became increasingly heterogeneous in the presence of acrylamide. The NATA intensity decays were not consistent with the Collins-Kimball radiation boundary condition (RBC) model for quenching. The steady-state Stern-Volmer plots show significant upward curvature, and quenching of NATA by acrylamide was observed even in vitrified propylene glycol, where translational diffusion cannot occur during the lifetime of the excited state. These frequencydomain and steady-state data indicate a through-space quenching interaction between NATA and acrylamide, and the results are consistent with a rate constant for quenching that depends exponentially on the fluorophore-quencher separation distance. The exponential distance-dependent rate of quenching also explains the upward curvature of the Stern-Volmer plot, and the steady-state data aid in determining the interaction distance between NATA and acrylamide. These results suggest that the distance-dependent quenching rates need to be considered in the interpretation of acrylamide quenching of proteins.     

透射强度比X射线荧光光谱法测定金属镀层组分

本文介绍了X射线荧光光谱透射强度比测定中等可变厚度金属镀层的组分方法。采用镀层元素强度和基片透射强度之比对镀层元素镀布分量制作工作曲线。     

溶液样品温度对ICP光源发射强度的影响

通过光电检测法研究了溶液样品温度在20,40和60 ℃条件下,对电感耦合等离子体(ICP)光源发射强度的影响。实验结果表明,随着溶液温度的提高,元素钡、铜和锌的谱线强度有明显的增强。观察了在不同溶液温度下,谱线强度随光源观察高度和载气压力的变化规律, 发现温度的提高使最佳观测高度位置降低,而最佳载气压力升高。     

X射线荧光光谱检测多层薄膜样品的增强效应研究

研究了X射线荧光光谱检测多层薄膜样品的增强效应。根据多层膜中的X荧光强度理论计算公式编写了计算机程序,并计算了Zn/Fe和Fe/Zn双层膜样品中不同薄膜厚度时Fe Kα的一次荧光强度、二次荧光强度、二次荧光与一次荧光强度比以及二次荧光在总荧光强度中比例。研究发现,在多层膜样品的X射线荧光分析中,激发条件不变的情况下,元素谱线的一次荧光相对强度、二次荧光相对强度和二次荧光在总荧光强度中所占比例都随薄膜厚度及位置的变化而变化。当Fe和Zn层厚度相同时,随厚度的变化,对于Fe/Zn样品,Fe Kα二次荧光强度占总荧光强度最高为9％,而对于Zn/Fe样品这一比例最高可达35％。