微波脉冲频率与重频对限幅器热损伤效应的影响

基于PIN限幅器的电路与器件物理混合模式（Mixed-Mode）模型,考虑大功率微波作用下器件的高温强电场多物理过程,模拟分析了频率及重频等微波脉冲参数对限幅器热损伤过程的影响,数值模拟结果表明,不同频率的微波脉冲损伤PIN限幅器存在拐点频率,拐点频率的微波脉冲附近需要更多的能量（脉宽）损伤器件;重频脉冲前一个脉冲作用后,器件峰值温度近似负指数关系快速下降,器件处于高温时更容易损伤,热积累效应使重频脉冲较单个脉冲更容易毁伤器件。     

Design of double-layer active frequency-selective surface with PIN diodes for stealth radome

An experimental double-layer active frequency-selective surface(AFSS) for stealth radome is proposed. The AFSS is a planar structure which is composed of a fixed frequency-selective surface(FSS), a PIN diodes array, and a DC bias network. The AFSS elements incorporating switchable PIN diodes are discussed. By means of controlling the DC bias network, it is possible to switch the frequency response for reflecting and transmitting. Measured and simulated data validate that when the incidence angle varies from 0?to 30?the AFSS produces more than-11.5 d B isolation across6–18 GHz when forward biased. The insertion loss(IL) is less than 0.5 d B across 10–11 GHz when reverse biased.     

Thermal experiment of silicon PIN detector

The experiment of this paper is the thermal test of the leakage current of silicon PIN detector. Raising temperature may cause the detector to increase leakage current, decrease depletion and increase noise. Three samples are used in the experiment. One (called ΔE) is the sample of 100 μm in thickness. The other two (called E₁ and E₂) are stacks of five detectors of 1000 μm in thickness. All of them are 12 mm in diameter. The experiment has been done for 21 hours and with power on continuously. The samples have undergone more than 60℃ for about one hour. They are not degenerated when back to the room temperature. The depletion rate is temperature and bias voltage related. With the circuit of the experiment and temperature at 35℃, ΔE is still depleted while E₁ and E₂ are 94.9% and 99.7% depleted respectively. The noises of the samples can be derived from the values at room temperature and the thermal dependence of the leakage currents. With the addition of the noise of the pre-amplifier, the noises of E₁, E₂ and ΔE at 24℃ are 16.4, 16.3, and 10.5 keV (FWHM) respectively while at 35℃ are about 33.6, 33.1, and 20.6 keV (FWHM) respectively.     

不同频率高功率微波辐照下PCB电路的混合模拟

采用一个混合模拟方法研究计算了不同频率高功率微波(HPM)辐照下含有PIN限幅器的PCB电路上的耦合信号。该混合模拟方法基于瞬态电磁拓扑和器件/电路混合模拟技术,实现了场、路、器件的混合模拟,能够模拟计算出HPM辐照下屏蔽腔内PCB电路上的耦合信号。用该方法研究计算了频率分别为1,1.25和2.5 GHz的HPM在PCB电路上的耦合信号。计算结果表明：当PCB电路无屏蔽腔时,1 GHz HPM的耦合信号最大,而PCB电路有屏蔽腔时,2.5 GHz HPM的耦合信号最大;PIN限幅器在耦合信号较大时具有较好的抑制作用。     

6～18GHz,120W,PIN大功率开关的设计

PIN开关是微波控制电路中的基本部件,它在雷达、电子对抗、微波通信、卫星通信以及微波测量等方面有着广泛的应用.大功率PIN开关是开关型产品中技术最难实现的一种开关,在许多整机和系统中起到关键的作用.文中给出了实现大功率单刀掷开关和大功率单刀双掷开关的方法.     

组合PIN脉冲中子探测器灵敏度研究

对新型组合PIN脉冲中子探测器的灵敏度进行了研究,实验测量探测器的DT中子灵敏度和γ相对灵敏度,用Monte?Carlo方法计算了探测器的中子灵敏度.实验测量和计算表明:通过转换靶的选取,组合PIN探测器的中子灵敏度在一定范围内连续可调,组合PIN探测器对γ的灵敏度比普通PIN探测器低2个量级,是一种对γ不灵敏的新型脉冲中子探测器.     

带STC控制系统的RF-IF放大器组件的研制

介绍了带STC控制系统的RF-IF放大器组件的研制工作。该组件包含有多个功能单元,有低噪声放大器、镜像抑制混频器、前置中频放大器、STC控制电路、PIN电调衰减器等。介绍了组件整体和各功能单元的设计思路和设计结果。     

Thermal experiment of silicon PIN detector

The experiment of this paper is the thermal test of the leakage current of silicon PIN detector.Raising temperature may cause the detector to increase leakage current,decrease depletion and increase noise.Three samples are used in the experiment.One (called △E) is the sample of 100 tan in thickness.The other two (called E1 and E2) are stacks of five detectors of 1000 μm in thickness.All of them are 12 mm in diameter.The experiment has been done for 21 hours and with power on continuously.The samples have undergone more than 60 ℃ for about one hour.They are not degenerated when back to the room temperature.The depletion rate is temperature and bias voltage related.With the circuit of the experiment and temperature at 35 ℃,△E is still depleted while E1 and E2 are 94.9% and 99.7% depleted respectively.The noises of the samples can be derived from the values at room temperature and the thermal dependence of the leakage currents.With the addition of the noise of the pre-amplifier,the noises of E1,E2 and AE at 24 ℃ are 16.4,16.3,and 10.5 keV (FWHM) respectively while at 35 ℃ are about 33.6,33.1,and 20.6 keV (FWHM) respectively.     

磁共振快速T/R开关驱动器研制

在磁共振T/R开关和主动失谐线圈中广泛使用PIN管,由外部驱动器向PIN管提供驱动电源,控制其导通或截止,从而达到开关切换和线圈失谐的目的.因此,驱动器的性能直接影响T/R开关和线圈的性能.该工作提出了一种新的T/R开关驱动器设计方案.电路中门控信号与驱动电源互相隔离,同时包含了场效应管死区调整电路,提高了电路稳定性和灵活性.该电路开关切换时间可达500 ns,驱动电压和电流理论上分别可达400 V和10 A以上,具有快速、驱动能力强等特点.可用于快速T/R开关和主动失谐线圈的驱动、缩短死时间、减小发射线圈和接收线圈间的耦合.     

PIN限幅器电磁脉冲效应数值模拟与验证

基于电磁脉冲对半导体器件效应的电-热多物理场模型,利用Sentaurus-TCAD仿真器建立了PIN限幅器电磁脉冲效应数值模型,研究了不同峰值功率的电磁脉冲作用下限幅器的输入/输出特性,以及大功率电磁脉冲注入PIN器件热损伤阈值与脉冲宽度的关系。模拟与实验结果表明：基于器件热效应影响载流子输运过程的电-热多物理模场型,模拟限幅器在大功率电磁脉冲注入下输入/输出功率的结果与实验结果吻合较好;模拟大功率电磁脉冲注入PIN器件热损伤阈值与脉冲宽度的关系式,与Wunsch-Bell半经验关系式符合较好。