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61.
A quantization method based on replacement of c-number by c-number parameterized by an unbiased hidden random variable is developed. In contrast to canonical quantization, the replacement has a straightforward physical interpretation as a statistical modification of classical dynamics of an ensemble of trajectories, and implies a unique operator ordering. We then apply the method to develop quantum measurement without wave function collapse and external observer a la pilot-wave theory. 相似文献
62.
MNA/PMMA有机薄膜光波导 总被引:2,自引:0,他引:2
研究出MNA/PMMA有机薄膜光波导。用棱镜耦合器进行了波导参数的测量,发现薄膜呈现各向异性,有较大的双折射。 相似文献
63.
The uncertainty affecting analytical measurements has to be taken into account when evaluating compliance of suspect matrices
to legislative limits. To this aim Type 1 and 2 errors must be considered. This necessarily leads to the evaluation of the
minimum detectable inadmissible signal, from which the minimum detectable inadmissible concentration can be obtained. The
signal of suspect matrices thus has to be compared with the minimum detectable inadmissible signal. This paper aims to discuss
practical problems involved in the comparison. 相似文献
64.
一、引言 在现行的托卡马克实验中,辐射损失和中性粒子损失是高温等离子体能量损失的主要通道之一。为了更好地了解托卡马克等离子体中能量平衡、辐射损失以及这些损失随等离子体参数的变化;了解等离子体中杂质含量和杂质输运以及等离子体与器壁的相互作用,辐射能量损失的时间特性、空间分布的测量显得很有必要。为 相似文献
65.
光纤白光干涉法与膜厚纳米测量新技术研究 总被引:6,自引:3,他引:3
运用薄膜光学干涉原理、光纤技术和干涉光谱分析技术,用光纤反射式干涉光谱仪(Reflectromic Interference Spectroscopy)直接测试宽带入射光在单晶硅表面超薄SiO2膜层前后界面反射形成的干涉光谱曲线,并用专业软件对被测光谱信号数据处理后,可直接用公式准确计算出SiO2氧化膜的厚度和光学折射率通过对单晶硅片表面超薄SiO2氧化膜的实测,并与成熟的椭圆偏振仪测试结果相比,测试误差≤2nm但该方法测试简单、快速,精度高,不需要制定仪器曲线和数表,可对薄膜任意位置的厚度在线测试经过对不同厚度聚苯乙烯薄膜的厚度测试表明,该方法适合0.5~20μm薄膜厚度的精确在线测量,测量误差小于7nm. 相似文献
66.
双反射镜式光电经纬仪测角误差的分析(轴系部分) 总被引:1,自引:1,他引:0
双反射镜式光电经纬仪由于采用了反射镜跟踪头,轴系误差对测角精度的影响不同于典型光电经纬仪。本文从建立经纬仪三维直角坐标系入手,建立了该类型经纬仪轴系误差引起测角误差的数学模型,为精度分析和误差修正提供了依据。 相似文献
67.
68.
热象无损检测技术应用 总被引:1,自引:1,他引:0
本文将热象无损检测技术应用于鉴定受测物结构和性质,并测出受测物中的缺陷,实验结果取得了较为满意的进展。 相似文献
69.
The measurement uncertainty of the result of chemical oxygen demand determination in wastewater was evaluated. The major
sources of uncertainty of the result of measurement were identified as the purity of reagents, volumetric operations, gravimetric
operations, bias, and the repeatability of the method. Identification and evaluation of uncertainty sources was followed by
combined uncertainty calculations. The combined uncertainty was compared to the experimentally determined variation and good
agreement was found, indicating that the major uncertainty sources had been identified. The results show that the major sources
of uncertainty arose from repeatability at high concentration level and volumetric steps at low concentration level, thus
revealing the target operations for reducing the measurement uncertainty of this determination.
Received: 5 August 2002 Accepted: 5 November 2002
Acknowledgements This research was supported by the Ministry of Education, Science and Sport of the Republic of Slovenia (Project Z2–3530).
Presented at CERMM-3, Central European Reference Materials and Measurements Conference: The function of reference materials
in the measurement process, May 30–June 1, 2002, Rogaška Slatina, Slovenia
Correspondence to A. Drolc 相似文献
70.
In this paper, the deposition of Cu13 onto Cu(1 1 1) surface through argon buffer layers was investigated by molecular dynamics (MD) simulations. The interactions between Cu-Cu, Cu-Ar, and Ar-Ar were described by Finnis-Sinclair (FS) tight-binding potential and L-J potential, respectively. The impact energy was chosen to be 2-6 eV/atom in order to compare with experimental results. It was observed that with Ar-buffer layers, the Cu cluster deposited on the surface may retain its free cluster symmetry (Ih). Whereas, on originally bare Cu surface, the deposited Cu cluster lost its original symmetry completely and was recrystalized to have the same fcc structure as the substrate. The Ar-buffer dissipates most of the translational energy of the incident cluster. Therefore, it prevents the cluster from being overheated upon impinging. Furthermore, the interaction between Ar and Cu benefits the confinement of the cluster structure. Our study shows that with Ar-buffer layers, the lateral spread of deposited clusters is 20% smaller than that on the bare Cu surface. This is consistent with the experimental findings. 相似文献