Radiation-based security

The problems presented in different security areas are varied but the solutions that have been offered are generally based upon the same principles. Employing radiation to locate and identify explosives or contraband has been most obvious at airports but other locations are now receiving equal attention. Neutron and X-ray interrogation are the systems most frequently employed. However, the more recently developed approaches such as multi-view dual-energy imaging and the use of high-speed diffraction measurements are the most likely systems to become widely available. This review looks briefly at the neutron and X-ray based systems that have been developed indicating their mode of operation and their advantages and disadvantages. It then summarizes the current state-of-the-art. The paper finishes by looking in some detail at one of the most promising areas of development—in-line diffraction measurements.     

A simple white beam neutron diffraction technique

White beam neutron diffraction by time-of-flight (TOF) technique has been studied over a number of years as it is believed to be the most convenient method to investigate solids in a fixed geometry. This technique needs a pulsed neutron source and a suitable multichannel, analysing system. The entire system is in general, mechanically quite intricate and expensive. We have investigated an alternative technique to achieve the end result of a constant geometry around the diffracting sample. This involves the use of a single crystal as an analyser to study diffraction pattern from the sample bathed in a white beam and diffracting at any fixed scattering angle. In this paper we report the results of our investigations and have compared this technique with other diffraction techniques. Taking Si, KCl and KNO₃ as typical specimens we have illus. trated the results of our technique and we find that the results are comparable to those obtained by conventional neutron diffraction and TOF diffraction. The technique is simple in mechanical design and data acquisition. It can be easily adapted for high pressure diffraction which is being attempted.     

基于D S理论的中子测试数据统计

 针对由于样本数量、测量误差和动态特性等因素，致使采用概率统计方法来对中子发生器的中子测试数据进行统计存在许多局限性和不合理性，讨论了D-S理论中的基本分配、信任函数、上下概率等概念，利用该理论对中子发生器的中子测量数据进行处理统计，最终得到中子产额在一定置信区间内概率分布上、下限值和平均中子产额。与传统的概率统计方法相比，该统计方法能适用于非精确性数据，且不受样本大小的限制。