Predicting and researching adsorption configurations of pyridazine on Si(100) surface by means of X-ray spectroscopies in theory

The landscape of organic molecule on Si(100) surface has a great significance for organic functionalisation of Si semiconductor. Several possible adsorption configurations for pyridazine on Si(100) surface have been forecasted by systemic comparison and investigation. The C1s XPS and NEXAFS spectra of these adsorption systems based on density functional theory and full core-hole potential approximation have been calculated. Although the sensibility of XPS to these adsorption configurations is not very strong, these configurations can be absolutely distinguished by NEXAFS spectra, which will bring tremendous reference to the future experimental study. Mode II, III, V and VI have a significantly higher adsorption energy, which are most likely to be present in experiment. In addition, we have made the research on specific sources of the peaks in spectra by analysing their decomposed NEXAFS spectra, the results show that the Carbon atoms which do not bond to surface atoms, make the most contribute to the intensity of characteristic peaks in spectra.     

Laser‐pump/X‐ray‐probe experiments with electrons ejected from a Cu(111) target: space‐charge acceleration

A comprehensive investigation of the emission characteristics for electrons induced by X‐rays of a few hundred eV at grazing‐incidence angles on an atomically clean Cu(111) sample during laser excitation is presented. Electron energy spectra due to intense infrared laser irradiation are investigated at the BESSY II slicing facility. Furthermore, the influence of the corresponding high degree of target excitation (high peak current of photoemission) on the properties of Auger and photoelectrons liberated by a probe X‐ray beam is investigated in time‐resolved pump and probe measurements. Strong electron energy shifts have been found and assigned to space‐charge acceleration. The variation of the shift with laser power and electron energy is investigated and discussed on the basis of experimental as well as new theoretical results.     

Soft X‐ray characterization technique for Li batteries under operating conditions

O K‐edge and Co L‐edge near‐edge X‐ray absorption fine structure has been used to examine the cathode of an intact solid‐state lithium ion battery. The novel technique allowed for the simultaneous acquisition of partial electron yield and fluorescence yield data during the first charge cycle of a LiCoO₂‐based battery below the intercalation voltage. The chemical environments of oxygen and cobalt at the surface are shown to differ chemically from those in the bulk. The present design enables a wide variety of in situ spectroscopies, microscopies and scattering techniques.     

Radiation damage from EELS and NEXAFS in diesel soot and diesel soot extracts

Carbon NEXAFS and EELS spectra of soot, and NEXAFS spectra of soot extracts, are presented. The EELS spectra of solid soot particles from a TEM-EELS show fewer structures than the corresponding NEXAFS spectra obtained at two different synchrotron beamlines. We attribute radiation damage in the TEM-EELS to the failure at resolving structures of surface functional carbon groups in or on soot. NEXAFS spectra of soot extracts studied with a scanning transmission X-ray microscope show alterations during X-ray exposure, which can be explained by a simple chemical model where oxygen apparently reacts with the sample. When the same extract is studied in an ultrahigh-vacuum beamline, no such alterations are observed.     

A study of the interaction between perylene and the TiO2(1 1 0)-(1 × 1) surface-based on XPS, UPS and NEXAFS measurements

The interaction between a semi-large aromatic hydrocarbon compound (perylene) and the TiO₂(1 1 0)-(1 × 1) surface under ultra high vacuum conditions has been probed by X-ray photoemission spectroscopy (XPS), ultraviolet photoemission spectroscopy (UPS) and near-edge X-ray absorption fine structure (NEXAFS) methods. UPS measurements of the adsorbate system have been compared with an experimental UPS spectrum of perylene in the gas phase and a calculated spectrum obtained by means of density functional theory (DFT) methods. NEXAFS results of perylene molecules adsorbed on TiO₂(1 1 0)-(1 × 1) were compared with data from an α-phase perylene single crystal. A novel analysis of the valence data has been employed to show that no strong chemical interaction takes place between perylene and the TiO₂(1 1 0)-(1 × 1) surface. Furthermore, angle-dependent NEXAFS measurements and the growth curve results suggest that the perylene molecules are oriented flat down onto the TiO₂ substrate due to weak van der Waals interactions.     

Molecular orientation of thiol-derivatized tetraphenylporphyrin on gold studied by XPS and NEXAFS

Tetraphenylporphyrins bearing four linkers consisting of thioacetyl-functionalized carbon chains were immobilized on a gold surface via thiolate-gold bonds using two different preparation routes. The structure of these molecular layers was characterized in detail with synchrotron radiation based core-level spectroscopy, X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. The results show that the geometry of the molecular layers and the number of linkers that bind to the gold surface depends on the preparation schemes. The deprotection of the linkers through removal of the terminal acetyl group before the molecular adsorption (deprotected systems) resulted in porphyrins bound to the gold surface with on the average three linkers, their normal axis being tilted ∼38° with respect to the surface normal. On the other hand, porphyrin layers prepared directly with the acetyl group still in place on the linkers (protected systems) are made of molecules bound to the gold surface via two linkers on the average. The resulting orientation is more upright, with the normal axis of the porphyrin plane tilted ∼50° with respect to the surface normal. Moreover, NEXAFS measurements revealed that the acetyl deprotected porphyrin layers have a higher degree of ordering than the protected systems.     

Simultaneous Surface and Bulk Imaging of Polymer Blends with X‐ray Spectromicroscopy

We demonstrate the utility of soft X‐ray spectromicroscopy to simultaneously image the surface and bulk composition of polymer blend thin films. In addition to conventional scanning transmission X‐ray microscopy that employs a scintillator and photomultiplier tube to measure the transmitted X‐ray flux, channeltron detection of near‐surface photoelectrons is employed to provide information of the composition of the first few nanometers of the film. Laterally phase‐separated blends of two polyfluorene co‐polymers are studied, with the structure of both wetting and capping layers clearly imaged. This new information provides insight into the connectivity of bulk and surface structures that is of particular relevance to the operation of such blends in optoelectronic devices.

     

Analysis of organic contaminants on Si wafers with TXRF-NEXAFS

Organic contamination is starting to play an important role in the production and quality control of Si wafers. For the traceability of the source of contamination, information on the chemical binding conditions is very valuable. A near edge X-ray absorption fine structure (NEXAFS) investigation is the natural development of total reflection X-ray fluorescence (TXRF) analysis of the wafer surfaces able to solve the problem of speciation. The plane grating monochromator beamline for undulator radiation of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY II, which provides photon energies between 30 eV and 1.9 keV for the specimen excitation, is an ideal excitation source for TXRF-NEXAFS experiments that require a high resolving power and a sufficient photon flux for trace analysis of low Z elements. The contaminants have been diluted and deposited as droplets on wafer pieces thoroughly cleaned after the cutting. The K edges of C, N, O have been examined. Some discrepancies have been found in the analysis of the same compounds in two different beamtimes; molecular orientation is pointed to as the cause for the difference in magnitude of the resonances. The unintentional contamination has been identified as mainly composed of aliphatic chains.     

SiH4凝聚态结构的近边X射线吸收精细结构研究

用多重散射团簇方法对低温下凝聚态SiH-4进行了Si的1 s NEXAFS理论研究,对不同的模型研究表明,此时凝聚相SiH-4形成链状结构.