利用4400系统构造具有光学多道分析功能的信号处理系统

基于4400系统,通过引入光电二极管列阵作为传感器,构造了具有光学多道分析功能的信号处理系统。利用该系统对实际的激光空间分布进行了描绘,给出了高斯场分布的相应参数。通过进一步观测p偏振光在K9玻璃上下表面反射光强比(γ)的角度调制曲线,获得了玻璃表面层的光学参数。实验结果表明,该系统测量精度高,可应用在激光时间信号及空间场分布的表征与测量领域。     

The velocity component effect to the mass resolution within de Heer and Milani criteria

The velocity component effect to the mass resolution was considered for two different positions of beam source in the time-of-flight mass spectrometer based on de Heer and Milani criteria. The results estimated for various potassium cluster sizes showed that resolution is reduced at considerable level and the cluster range is limited to the small mass sizes for the position along with the cluster beam axis. The resolution is high and the effect appears close to K₁₀₀₀ cluster sizes depending upon perpendicular axis used.     

X射线激发荧光光谱仪的建立及闪烁晶体发光表征

利用X射线作为激发光源,自行组装并实现计算机控制的X射线激发荧光光谱仪.介绍了X射线激发荧光光谱仪的建立及其结构特性.该仪器具有时间分辨率高、测量动态范围大、使用方便等优点,可应用于晶体、粉末和液体等各种样品的测量,该仪器同时还具有很强的扩展性.     

Procedure for rapid spectroscopic control of the distribution of oxygen and of doping impurities in silicon ingots

Spectral dependences of the coefficients of absorption by free carriers and of multiphoton absorption by a silicon lattice in the region of the interstitial oxygen band at 5.8 μm are established. A procedure for measurement of the distribution of oxygen and alloying impurities in silicon ingots is given. The effectiveness of the spectrometers developed for controlling the segregation of impurities and nonstationary convection of the silicon melt in growing ingots by the Czochralski method is shown. Belarusian State University, 4, F. Skorina Ave., Minsk, 220080, Belarus. Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 64, No. 5, pp. 655–659, September–October, 1997.     

Spectral Line Profile Correction of the Detector Effect: for a SOHO/UVCS Spectrometer

It has been noticed that observed spectral line profiles by the SOHO ultraviolet coronagraph spectrometer (SOHO/UVCS) are contaminated by a so-called detector effect, and an iterative correction of observed profiles by convolution with a zero-integral function has been employed to remove this unwanted effect on UVCS detectors. It is shown here that this iteration procedure using a zero-integral function can be replaced by an only-once application of convolution. For zero-integral functions of exp[- |x|/L]-type, the convolution function in this method is proved to have exactly the same, but narrower (steeper), functional form as the original one. These results are also valid, with some modifications, for the discrete case used in numerical calculation.     

原位光谱反射比测量系统设计

介绍了用光纤和双通道光谱仪测量光谱反射比的技术优势，并着重讨论了原位光谱及光谱反射比测量系统的主要技术。利用这套测量装置对真空室中试验样品氧化前后进行测量，得到了与计量院标定值一致的结果。     

红外光谱仪在红外电磁波吸收材料研究中的应用

以Lambere-Beer定律为基础．根据傅里叶变换红外光谱仪的特点，提出了红外电磁波吸收材料吸波性能的测试方法，并对非晶态SiO2粉末材料的红外电磁波吸收特性进行了讨论．实验结果表明。该方法简便、快速、可操作性强．     

分光仪应用拓展

本文提出了棱镜顶角的两种新的测量方法．对外入射时的光栅光谱进行了分析和测量，并对光栅在载物台上的位置进行了研究。     

Analysis of the lateral displacement and optical path difference in wide-field-of-view polarization interference imaging spectrometer

The mechanism of beam splitting and principle of wide-field-of-view compensation of modified Savart polariscope in the wide-field-of-view polarization interference imaging spectrometer (WPIIS) are analyzed and discussed. Formulas for the lateral displacement and optical path difference (OPD) produced by the modified Savart polariscope are derived by ray-tracing method. The theoretical and practical guidance is thereby provided for the study, design, modulation, experiment and engineering of the polarization interference imaging spectrometers and other birefringent Fourier-transform spectrometers based on Savart polariscopes.