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31.
Two types of Schottky Barrier Diodes (SBDs) with and without PVA (Bi2O3-doped) polymeric interfacial layer, were fabricated and measured at room temperature in order to investigate the effects of the PVA (Bi2O3-doped) interfacial layer on the main electrical parameters such as the ideality factor (n), zero-bias barrier height (ΦB0), series resistance (Rs) and interface-state density (Nss). Electrical parameters of these two diodes were calculated from the current-voltage (I-V) characteristics and compared with each other. The values of ΦB0, n and Rs for SBDs without polymeric interfacial layer are 0.71 eV, 1.44 and 4775 Ω, respectively. The values of ΦB0, n and Rs for SBDs with PVA (Bi2O3-doped) polymeric interfacial layer are 0.74 eV, 3.49 and 10,030 Ω, respectively. For two SBDs, the energy density distribution profiles of interface states (Nss) were obtained from forward-bias I-V measurements by taking the bias dependence of Rs of these devices into account. The values of Nss obtained for the SBD with PVA (Bi2O3-doped) polymeric interfacial layer are smaller than those of the SBD without polymeric interfacial layer. 相似文献
32.
在电学实验的创新设计类问题中,常常涉及到滑线变阻器的分压线路和限流线路。本文对滑线变阻器的分压线路和限流线路的特性作一较系统的分析,对涉及到此类问题的实际工作具有指导意义。 相似文献
33.
由于尺寸效应和晶界效应的影响,纳米薄膜在导电和导热方面呈现出与体材料不同的性质.本文实验研究了不同厚度(20~54 nm)金薄膜在不同温度(100~340 K)的导电、导热性质.测量结果显示,薄膜的电导率和热导率比体材料小,洛伦兹数比体材料大,Wiedemann-Franz定律不再成立.随着厚度增加,薄膜的电导率,热导率和电阻温度系数都增加.薄膜热导率随温度变化趋势与体材料相反,随着温度升高而升高.电导率随温度变化趋势与体材料相同,随着温度升高而降低;但薄膜没有体材料对温度变化敏感,导致电阻温度系数下降. 相似文献
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Pure iron is a potential material applying for coronary artery stents based on its biocorrodible and nontoxic properties. However, the degradation characteristics of pure iron in vivo could reduce the mechanical stability of iron stents prematurely. The purpose of this work was to implant the lanthanum ion into pure iron specimens by metal vapor vacuum arc (MEVVA) source at an extracted voltage of 40 kV to improve its corrosion resistance and biocompatibility. The implanted fluence was up to 5 × 1017 ions/cm2. The X-ray photoelectron spectroscopy (XPS) was used to characterize the chemical state and depth profiles of La, Fe and O elements. The results showed lanthanum existed in the +3 oxidation state in the surface layer, most of the oxygen combined with lanthanum and form a layer of oxides. The lanthanum ion implantation layer could effectively hold back iron ions into the immersed solution and obviously improved the corrosion resistance of pure iron in simulated body fluids (SBF) solution by the electrochemical measurements and static immersion tests. The systematic evaluation of blood compatibility, including in vitro platelets adhesion, prothrombin time (PT), thrombin time (TT), indicated that the number of platelets adhesion, activation, aggregation and pseudopodium on the surface of the La-implanted samples were remarkably decreased compared with pure iron and 316L stainless steel, the PT and TT were almost the same as the original plasma. It was obviously showed that lanthanum ion implantation could effectively improve the corrosion resistance and blood compatibility of pure iron. 相似文献
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用滑线式电桥巧测微安表的内阻 总被引:1,自引:0,他引:1
本文从讨论滑线式电桥的构成原理出发,全面分析了滑线式电桥测量的最有利条件及阻值的可信度。在此基础上详细研究了运用滑线式电桥测量微安表内阻的具体操作方法。 相似文献
39.
为了得到光折变晶体中非相干耦合空间孤子对统一理论的结果,基于单光子光折变空间光孤子的基本理论模型,建立了稳态条件下有分压电阻和e偏振非相干均匀背景光辐照的单光子光伏光折变晶体中非相干耦合空间孤子对理论. 研究表明:这种孤子对是由两束偏振方向和波长都相同的互不相干光束耦合形成的, 孤子对两光束都能在晶体中稳定传播;当分压电阻、e偏振背景光、外加电场和光伏场取不同值时, 可获得14种光折变非相干耦合空间孤子对. 本文的结果对完善和充实光折变空间孤子理论体系有重要意义. 相似文献
40.
A. Sanson M. Giarola E. Napolitani G. Impellizzeri V. Privitera A. Carnera G. Mariotto 《Journal of Raman spectroscopy : JRS》2013,44(5):665-669
The distribution profile of Al implanted in crystalline Ge has been investigated by micro‐Raman spectroscopy. Using different excitation laser lines, corresponding to different optical penetration depths, the Al concentration at different depths beneath the sample surface has been studied. We have found a strong correlation between the intensity of the Al–Ge Raman peak at ~370 cm−1, which is due to the local vibrational mode of substitutional Al atoms, and the carrier concentration profile, obtained by the spreading resistance profiling analysis. A similar connection has been also observed for both shape and position of the Ge–Ge Raman peak at ~300 cm−1. According to these experimental findings, we propose here a fast and nondestructive method, based on micro‐Raman spectroscopy under different excitation wavelengths, to estimate the carrier concentration profiles in Al‐implanted Ge. Copyright © 2013 John Wiley & Sons, Ltd. 相似文献