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排序方式: 共有166条查询结果,搜索用时 419 毫秒
31.
S. Ota S. Shimoura H. Iwasaki M. Kurokawa S. Michimasa N. Aoi H. Baba K. Demichi Z. Elekes T. Fukuchi T. Gomi S. Kanno S. Kubono K. Kurita H. Hasegawa E. Ideguchi N. Iwasa Y.U. Matsuyama K.L. Yurkewicz T. Minemura T. Motobayashi T. Murakami M. Notani A. Odahara A. Saito H. Sakurai E. Takeshita S. Takeuchi M. Tamaki T. Teranishi Y. Yanagisawa K. Yamada M. Ishihara 《Physics letters. [Part B]》2008
32.
Tatsunori Sakano Hiroki Fukuoka Yoshihiro Yata Toshiharu Saiki Minoru Obara 《Applied Physics A: Materials Science & Processing》2008,93(3):697-703
We employed epi-GaN substrates for ZnO film growth, and studied the deposition and post-annealing effects. ZnO films were
grown by pulsed laser deposition (PLD) method. The as-grown films were annealed for one hour under atmospheric pressure air.
ZnO morphologies after annealing were investigated and the post-annealed ZnO films grown at T
g
=700oC have very smooth surfaces and the rms with roughness is about 0.5 nm. Finally, ZnO post-annealed buffer layer was inserted
between ZnO epilayer and GaN/sapphire substrates. It is confirmed by AFM that growth temperature of 700oC helps the films grow in step-flow growth mode. It is observed by cathode luminescence spectrum that the ZnO film grown at
700oC has very low visible luminescence, indicating the decrease of the deep level defects. It is also revealed by Hall measurements
that carrier concentration is decreased by increasing the growth temperatures. It is suggested that low temperature buffer
layer growth and post-annealing technique can be used to fabricate ZnO hetero-epitaxy. 相似文献
33.
Matthias Nagel Romain Fardel Pascal Feurer Mark Häberli Frank A. Nüesch Thomas Lippert Alexander Wokaun 《Applied Physics A: Materials Science & Processing》2008,92(4):781-789
Thin films of a tailor-made photodecomposible aryltriazene polymer were applied in a modified laser-induced forward transfer
(LIFT) process as sacrificial release layers. The photopolymer film acts as an intermediate energy-absorbing dynamic release
layer (DRL) that decomposes efficiently into small volatile fragments upon UV laser irradiation. A fast-expanding pressure
jet is generated which is used to propel an overlying transfer material from the source target onto a receiver. This DRL-assisted
laser direct-write process allows the precise deposition of intact material pixels with micrometer resolution and by single
laser pulses. Triazene-based photopolymer DRL donor systems were studied to derive optimum conditions for film thickness and
laser fluences necessary for a defined transfer process at the emission wavelength of a XeCl excimer laser (308 nm). Photoablation,
surface detachment, delamination and transfer behavior of aryltriazene polymer films with a thickness from 25 nm to ∼400 nm
were investigated in order to improve the process control parameters for the fabrication of functional thin-film devices of
microdeposited heat- and UV-sensitive materials. 相似文献
34.
Photoexposure of a water-stable, Ti-alkoxide, (OC6H6N)2Ti(OC6H2(CH2N(CH3)2)3-2,4,6)2, dissolved in a water/pyridine solution yielded an insoluble, solid phase, present in the form of suspended particles and a deposited material on the vertical side-wall of the solution container. Raman analysis of these photoproducts confirmed the UV-initiation of hydrolysis and condensation reactions in the alkoxide reagent. The excitation wavelength dependence of the photostructural effects observed provides insight into the mechanisms contributing to these photoinduced phenomena. The results are extended to enable the photopatterned deposition of physical relief structures directly from solution in this system. 相似文献
35.
Duk-Yong Choi Steve Maden Andrei Rode Rongping Wang Barry Luther-Davies 《Journal of Non》2008,354(27):3179-3183
Chalcogenide glasses are good candidate materials for ultra-fast non-linear optic devices. In this work, we present the photolithographic process and the plasma etching of arsenic tri-sulphide (As2S3) film. The films were deposited on thermally oxidized silicon substrates by ultra-fast pulsed laser deposition. To protect As2S3 film from photo-resist developer, thin resist layer ∼100-200 nm was remained on the UV exposed area by controlling resist development time. After removing the protective layer in oxygen plasma, As2S3 waveguides were patterned in inductively coupled plasma reactive ion etching (ICP-RIE) system using CF4-O2 gas mixture. We investigated the etch rate and the etch selectivity to photo-resist of As2S3 as a function of bias power, induction power, operating pressure, and gas flow rate ratio of CF4 and O2. The film is mainly etched by the chemical reaction with fluorine radicals. The content of oxygen in the plasma determines the etched sidewall profiles and nearly vertical profile was obtained at high oxygen content plasma. 相似文献
36.
K. Osvay I.N. Ross J.M.D. Lister C.J. Hooker 《Applied physics. B, Lasers and optics》1999,69(1):19-23
This paper presents an experimental technique for measurement of the contrast ratio of ultrashort UV pulses. As a multiple-shot
device based on the scheme of difference frequency generation this is, to our knowledge, the only cross correlator in the
UV so far, which offers a dynamic range of 107 and operates with input pulse energies as low as 5 μJ. By changing the cross correlator into single-shot mode, the temporal
shape of the UV pulse can be measured.
Received: 26 October 1998 / Revised version: 13 January 1998 / Published online: 28 April 1999 相似文献
37.
E.M. de Miguel-Sanz M. Tebaldi S. Granieri N. Bolognini L. Arizmendi 《Applied physics. B, Lasers and optics》2000,70(3):379-383
A photorefractive optical correlator stored and fixed in lithium niobate is presented. The device shows good correlation characteristics
together with very high output efficiency and insensitivity to optical erasure during read-out.
Received: 10 May 1999 / Revised version: 21 June 1999 / Published online: 16 September 1999 相似文献
38.
R. Arvind Singh 《Applied Surface Science》2009,255(9):4821-4828
In miniaturized devices like micro/nano-electro-mechanical systems (MEMS/NEMS), the critical forces, namely adhesion and friction restrict the smooth operation of the elements that are in relative motion. MEMS/NEMS are traditionally made of silicon, whose tribological properties are not good. In this paper, we present an investigation on the approach of dual surface modification of silicon surfaces and their tribological properties at micro-scale. The dual surface modification is a combination of topographical and chemical modifications. As the topographical modification, micro-patterns with varying shapes of pillars and channels were fabricated on Si(1 0 0) wafer surfaces using photolithography method. Chemical modification included the coating of micro-patterns with diamond-like carbon (DLC) and Z-DOL (perfluoropolyether, PFPE) thin films. The surfaces with combined modification were evaluated for their micro-friction behavior in comparison with those of bare Si(1 0 0) flat surfaces and the topographically/chemically modified silicon surfaces. Results showed that the surfaces with dual modification exhibited superior tribological properties. These results indicate that a combination of topographical and chemical modification is very effective in enhancing tribological properties at small-scale. The combined surface treatments such as the ones investigated in the current work could be useful for tribological applications in small-scale devices such as MEMS/NEMS. The motivation for undertaking the dual modification approach comes from an earlier observation made on the significant influence of the surface characteristics of lotus leaf on its micro-friction behavior. 相似文献
39.
Transparent SiO2 thin films were selectively fabricated on Si wafer by 157 nm F2 laser in N2/O2 gas atmosphere. The F2 laser photochemically produced active O(1D) atoms from O2 molecules in the gas atmosphere; strong oxidation reaction could be induced to fabricate SiO2 thin films only on the irradiated areas of Si wafer. The oxidation reaction was sensitive to the single pulse fluence of F2 laser. The irradiated areas were swelled and the height was approximately 500-1000 nm at the 205-mJ/cm2 single pulse fluence for 60 min laser irradiation. The fabricated thin films were analytically identified to be SiO2 by the Fourier-transform IR spectroscopy. The SiO2 thin films could be also removed by subsequent chemical etching to fabricate micro-holes 50 nm in depth on Si wafer for microfabrication. 相似文献
40.
The photocatalytic activity of TiO2 films deposited on different substrates by the spray-drying method using suspensions of commercially available TiO2 (Degussa P25 or Tronox) as starting material was studied. The influence of the type of the initial TiO2, preparation conditions (temperature of the substrate during the film deposition, temperature of the post-deposition annealing), substrate material (glass, fused silica, stainless steel and graphite), the presence of additives in the spraying suspension (polyethylene glycol, ethylene glycol and acetylacetone) and its sonication before spraying on the morphology, size of crystallites and phase composition (rutile/anatase ratio) was studied. Optimal conditions for spray deposition of the films are suggested. 相似文献