结晶紫在纳米磷化镓粉体表面吸附的表面增强拉曼光谱分析

利用Raman光谱对结晶紫(Crystal Violet,CV)在纳米磷化镓(GaP)粉体表面的吸附状态进行了分析.结果表明:与普通拉曼散射谱(Normal Raman Scattering,NRS)相比,结晶紫表面增强拉曼散射(Surface Enhanced Raman Scattering,SERS)谱的4种振动模式,即:中央键的呼吸振动、环-C -环面外弯曲振动、环C-H面外弯曲振动以及N-环伸缩振动,在纳米GaP粉体表面得到增强;通过分析吸附前后结晶紫拉曼散射峰相对强度的变化,确定了结晶紫在纳米GaP粉体表面的吸附取向,并对其表面增强散射机理进行了探讨.     

Effect of double AlN buffer layer on the qualities of GaN films grown by radio-frequency molecular beam epitaxy

This paper reports that the GaN thin films with Ga-polarity and high quality were grown by radio-frequency molecular beam epitaxy on sapphire （0001） substrate with a double A1N buffer layer. The buffer layer consists of a high-temperature （HT） A1N layer and a low-temperature （LT） A1N layer grown at 800℃ and 600℃, respectively. It is demonstrated that the HT-A1N layer can result in the growth of GaN epilayer in Ga-polarity and the LT-A1N layer is helpful for the improvement of the epilayer quality. It is observed that the carrier mobility of the GaN epilayer increases from 458 to 858cm^2/V.s at room temperature when the thickness of LT-A1N layer varies from 0 to 20nm. The full width at half maximum of x-ray rocking curves also demonstrates a substantial improvement in the quality of GaN epilavers by the utilization of LT-A1N layer.     

在液镓电极上反丁烯二腈的电氢化二聚

在液镓电极上,反丁烯二腈（ＦＤＮ）的电氢化二聚（ＥＨＤ）不仅能在含离子型表面活性剂如四乙基对甲苯磺酸铵（ＴＥＡ－ＰＴＳ）溶液中发生,同样也能在含低浓度的强表面活性剂如ＴｒｉｔｏｎＸ－１００溶液中进行,在不含有机表面活性剂的溶液中,ＦＤＮ在滴镓电极上产生一个２电子还原波,生成为丁二腈的饱和单体。在水溶液中加入一定浓度的ＴＥＡ－ＰＴＳ或低浓度的ＴｒｉｔｏｎＸ－１００时,原来的２电子还原波分裂成两个连续     

Low temperature InSb(0 0 1) surface structure studied by scanning tunneling microscopy

InSb(0 0 1) surface prepared by ion sputtering and thermal annealing has been studied in the temperature range from 77 K up to 300 K using scanning tunneling microscopy (STM). At 300 K the surface is c(8 × 2) reconstructed as indicated by low energy electron diffraction and STM images, and its structure appears to be consistent with the “ζ-model” recently proposed for this surface. Upon lowering of the temperature below 180 K a new phase appears on the surface. This phase is characterized by the surface structure period doubling along [1 1 0], lowering the surface symmetry from c2mm to p2, and appearance of structural domains. Possible origins of the new phase are discussed.     

A study of Ga layers on Si(1 0 0)-(2 × 1) by SR-PES: Influence of adsorbed water

Results for deposition and thermal annealing of gallium on the Si(1 0 0)-(2 × 1) surface achieved by synchrotron radiation photoelectron spectroscopy (SR-PES) and low energy electron diffraction (LEED) are presented. In addition to deposition of Ga on a clean surface, the influence of water adsorption on the arrangement of gallium atoms was also studied. The results on Ga deposition at a higher temperature (490 °C) are consistent with a Ga ad-dimer model showing equivalent bond arrangement of all Ga atoms for coverages up to 0.5 ML. The deposition onto a surface with adsorbed water at room temperature led to a disordered gallium growth. In this case gallium atoms bind to silicon dimers already binding fragments of adsorbed water. A subsequent annealing of these layers leads to a surface structure similar to the Ga-(2 × 2), however, it is less ordered, probably due to the presence of silicon oxides formed from water fragments.     

Study of Si(0 0 1)4 × 2-Ga structure by scanning tunneling microscopy and ab initio calculation

We have studied Si(0 0 1)-Ga surface structures formed at Ga coverages of slightly above 0.50 monolayer (ML) at 250 °C by scanning tunneling microscopy (STM). 4 × 2-, 5 × 2-, and 6 × 2-Ga structures were observed in a local area on the surface. The 4 × 2-Ga structure consists of three protrusions, as observed in filled- and empty-state STM images. The characters of these structures are clearly different from those of other Si(0 0 1)-Ga structures. We also performed an ab initio calculation of the energetics for several possible models for the 4 × 2-Ga structure, and clarified that the three-orthogonal-Ga-dimer model is the most stable. Also, the results of comparing the simulated STM images and observation images at various bias voltages indicate that this structural model is the most favorable.