衍射光学透镜色散特性的仿真研究

在白光照射下,衍射光学透镜的焦距不仅同材料色散和波长色散有关,而且还同孔径因子有关。基于折射率随波长变化的经验公式,利用自编的仿真计算程序包,得到了透镜焦距、材料色散、波长色散、孔径因子之间的关系曲线。所获得的理论分析和仿真计算结果为进一步设计消色差的纯衍射目视光学系统提供了理论依据,具有一定的指导意义。     

中空光纤技术与应用特性

介绍一种采用环烯烃聚合物镀膜的中空光纤结构，阐述其传输特性，说明其使用特点，指出它在工业和医疗等领域中的应用前景。     

Focused ion beam Moiré method

A focused ion beam (FIB) Moiré method is proposed to measure the in-plane deformation of object in a micrometer scale. The FIB Moiré is generated by the interference between a prepared specimen grating and FIB raster scan lines. The principle of the FIB Moiré is described. The sensitivity and accuracy of deformation measurement are discussed in detail. Several specimen gratings with 0.14 and 0.20 μm spacing are used to generate FIB Moiré patterns. The FIB Moiré method is successfully used to measure the residual deformation in a micro-electro-mechanical system structure after removing the SiO₂ sacrificial layer with a 5000 lines/mm grating. The results demonstrate the feasibility of this method.     

基于新型长周期光纤光栅的掺铒光纤放大器

报道了基于高频CO₂激光脉冲写入的新型长周期光纤光栅的低噪音掺铒光纤放大器,这种新型长周期光纤光栅是用大约几千Hz的高频CO₂激光脉冲对光纤玻璃热冲击作用而形成的.在铒纤中插入一个长周期光纤光栅,会明显减少掺铒光纤放大器的放大自发辐射(ASE)噪音.报道了两种低噪音掺铒光纤放大器,作为前置放大器和线路放大器,它们的ASE噪音指数分别从4.0 dB减少到3.5 dB和从4.8 dB减少到4.3 dB,并且在作为线放时,其小信号增益从30 dB提高到37 dB,降噪及提高增益效应十分显著.     

用数值方法分析微孔激光器出射光的近场特性

微孔激光器作为应用于近场光信息存储系统中的一种新型光源，它的出射光斑的近场特性对于近场光存储是十分重要的。针对纳米孔径运用角谱进行Fox-Li数值迭代，得到不同孔径微孔激光器的基模光强分布，然后运用二维非线性时域有限差分法分析微孔激光器出射端即微孔金属膜的近场光学性质，模拟计算了不同孔径和厚度的微孔金属膜的光强近场分布，从应用于近场光存储的角度，给出反映其近场光学特性的相关数据。发现由于TM模式下金属存在局域表面等离子增强效应，使得其出射强度比TE模式高一个数量级，从而更适于作为实际中近场光存储系统和原理试验的光学头。     

Submicrometric Displacement and Vibration Measurement Using Optical Feedback in a Fiber Laser

A very simple and efficient technique for the remote sensing of a noncooperative target is presented. This technique is based on the frequency-shifted reinjection of light in a class B laser. Ytterbium- and erbium-doped fiber lasers have both been used to measure displacements with a submicrometric resolution and the vibration power spectrum of an object.     

蓝光相变光盘的多层膜结构设计

为了使光盘获得优良的记录／读出性能并能够长期稳定地使用，必须优化设计相变光盘的多层膜结构。采用自行设计的模拟分析相变光盘读出过程设计软件，从光学角度出发模拟计算了蓝光(405nm)相变光盘的膜层结构，研究了多层膜系的反射率和反射率对比度等光学参量与各层膜厚度和槽深的关系。研究得出的最佳多层膜结构为：下介电层／记录层／上介电层／反射层的厚度对于台记录为100nm／10nm／25nm，／60nm，而对于槽记录则为140nm／15nm／30nm，／60nm，槽深为50nm。模拟计算结果对于将来高密度蓝光相变光盘的制备具有一定的指导意义。     

Analytical study of a flattened Gaussian beam through multi-apertured optical imaging systems of B = 0

By using the methods of the matrix decomposition and expansion of the hard-edged aperture function into a finite sum of complex Gaussian functions, the recurrence propagation expressions for a flattened Gaussian beam (FGB) through multi-apertured optical imaging systems of B = 0 are derived and illustrated with numerical examples. Comparisons with the straightforward numerical integration of the Collins formula and with the previous work are made. It is shown that the main advantages of our methods and results are the more accuracy and great reduction of computer time.     

原子的吸收光谱和发射光谱的演示

介绍了利用光学多道分析仪和投影仪在课堂上实时演示原子的吸收光谱和发射光谱的实验方法。     

Analysis of Two-Dimensional Optical Fields Using an Additional Shift

A solution to the phase problem in optics is considered within the context of registration and analysis of two-dimensional stationary optical fields transformed by the object under study or fields forming an image. To obtain information on amplitude and phase distributions of the light field analyzed, a method of registration of two intensity distributions is used. The first distribution corresponds directly to the amplitude distribution. The other is formed for the sum of the initial field and the field shifted along a certain direction. The intensity distributions obtained allow one to calculate the two-dimensional structure of the field under study. It is noteworthy that the method requires no iteration procedures in solving the problem. This leads to speeding up of the processing and analysis of the information. Two variants of optical schemes for the analysis of light fields are considered. The first one corresponds to registration of the image of the analyzed plane and the second to registration of the spectrum of the spatial frequencies.