Tomography of Binomial States of the Radiation Field

The symplectic, optical, and photon-number tomographic symbols of binomial states of the radiation field are studied. Explicit relations for all tomograms of the binomial states are obtained. Two measures for nonclassical properties of these states are discussed.     

n维氢原子的散射态

研究了n维氢原子的散射态性质．给出了精确的按“k/2π标度”归一化的散射态的精确解波函数及相移表达式，讨论了相移的解析性质，获得了束缚-连续跃迁矩阵元的解析计算公式．普通氢原子(n=3)散射态的有关结果作为特例包含在本文的一般结论之中． 关键词： n维氢原子 散射态 精确解 相移 束缚-连续跃迁矩阵元     

States and Structure of von Neumann Algebras

We summarize and deepen recent results on the interplay between properties of states and the structure of von Neumann algebras. We treat Jauch–Piron states and the concept of independence in noncommutative probability theory.     

Yb2.75C60价带光电子能谱

用角积分紫外光电子能谱技术测量了Yb2 75C6 0 薄膜的价带电子态密度分布 .相纯Yb2 75C6 0 样品通过C1s芯态x射线电子谱峰的位移表征 .结果表明Yb2 75C6 0 是半导体 ,在费米能级处几乎没有电子态分布 .Yb 6s电子态和C6 0 LU MO能带的杂化效应不可忽略 ,有部分Yb 6s电子分布在Yb C6 0 杂化能带上 .     

Spatially localized states in Marangoni convection in binary mixtures

Two-dimensional Marangoni convection in binary mixtures is studied in periodic domains with large spatial period in the horizontal. For negative Soret coefficients convection may set in via growing oscillations which evolve into standing waves. With increasing amplitude these waves undergo a transition to traveling waves, and then to more complex waveforms. Out of this state emerge stable stationary spatially localized structures embedded in a background of small amplitude standing waves. The relation of these states to the time-independent spatially localized states that characterize the so-called pinning region is investigated by exploring the stability properties of the latter, and the associated instabilities are studied using direct numerical simulation in time.     

有限维希尔伯特空间q广义相干态振幅平方压缩

构造了有限维希尔伯特空间q变形非简谐振子广义相干态,研究了它的振幅平方压缩效应,结果表明,该量子态存在振幅平方压缩效应,并且给出了压缩条件与参数s,r,q之间的关系。     

Sn/Ge(1 1 1) α-phase: characterization of image resonances by specular electron reflection and selective electron scattering

Image potential resonances on the Sn/Ge(1 1 1) α-phase are investigated by two closely related methods: specular electron reflection and so-called selective electron scattering. Electrons from image resonances are detected on this surface at 120 and 300 K, i.e. below and above the phase transition at about 200 K. The dispersion of the image resonances reveals at these two temperatures equivalent effective electron masses, which are characteristic for this type of electronic surface states. The results of the two methods are consistent according to the similarity of the scattering processes. Changes in the loss peak intensity with the annealing temperature are assigned to the surface quality and are reflected by characteristic photoemission intensities.     

Applications of electronic speckle interferometry (ESI) techniques for spacecraft structural components

Laser-based electronic speckle interferometry (ESI) techniques, viz., electronic speckle pattern interferometry (ESPI) and electronic speckle shearographic interferometry (ESSI) are used for testing of spacecraft structural components. The combined ESPI and ESSI system developed in house was successfully used for the non-destructive evaluation (NDE) of honeycomb sandwich panels and propellant tanks of Indian Space Research Organization (ISRO). Debonds between face sheet and the honeycomb core were identified using (i) thermal and (ii) dual vacuum stressing methods. On-line NDE of the propellant tanks under internal pressure loading for identification of the minute cracks and thickness reduction areas were successfully implemented by ESI.     

Development of measuring magnetic Compton profiles by grazing incidence geometry

A novel technique of measuring a magnetic Compton profile using the grazing angle geometry against a sample surface (Grazing Incidence Magnetic Compton Profile) has been successively developed. Measurements of a magnetic moment and a magnetic Compton profile are possible for a Fe 200 nm film on a thick glass substrate. The estimated thinnest limit for measurements is 100 nm for a Fe film.