In-plane ESPI using an achromatic interferometer with low-coherence laser source

The use of an achromatic interferometer is explored as a means of doing in-plane ESPI measurements using a laser diode as the light source. This interferometer type, which uses a diffraction grating in place of the conventional beamsplitter, has two features that make it suitable for making ESPI measurements over extended areas, even when using a low-coherence laser diode source. First, the parallelogram optical geometry of the interferometer causes all rays passing through to have the same optical path lengths. Second, the interferometer is achromatic, whereby the piezo-actuated mirror that steps the illumination light does so by the same phase angle, independent of wavelength. This latter feature accommodates the spectral impurity of a laser diode source. A periodic variation of fringe visibility is observed in experiments, where narrow ranges of high visibility occur at regular spatial intervals. This behavior derives from the clustered discrete spectral character of laser diode light output. A method to “tune” the interferometer by slightly rotating the diffraction grating is described so as to achieve consistent high fringe visibility throughout the measured images.     

Upgrade of beamline BL08B at Taiwan Light Source from a photon‐BPM to a double‐grating SGM beamline

During the last 20 years, beamline BL08B has been upgraded step by step from a photon beam‐position monitor (BPM) to a testing beamline and a single‐grating beamline that enables experiments to record X‐ray photo‐emission spectra (XPS) and X‐ray absorption spectra (XAS) for research in solar physics, organic semiconductor materials and spinel oxides, with soft X‐ray photon energies in the range 300–1000 eV. Demands for photon energy to extend to the extreme ultraviolet region for applications in nano‐fabrication and topological thin films are increasing. The basic spherical‐grating monochromator beamline was again upgraded by adding a second grating that delivers photons of energy from 80 to 420 eV. Four end‐stations were designed for experiments with XPS, XAS, interstellar photoprocess systems (IPS) and extreme‐ultraviolet lithography (EUVL) in the scheduled beam time. The data from these experiments show a large count rate in core levels probed and excellent statistics on background normalization in the L‐edge adsorption spectrum.     

980nm半导体激光器输出光谱特性的改善

为了改善980nm半导体激光器的输出光谱特性,采用传输矩阵分析法推导了双布喇格光纤光栅谐振腔的传输表达式,对布喇格光纤光栅长度和谐振腔腔长对输出光谱的影响进行模拟仿真,结果表明布喇格光纤光栅长度对输出光谱的影响大于谐振腔腔长对输出光谱的影响,加长布喇格光纤光栅长度能压缩输出光谱线宽.在980nm半导体激光器尾纤上写入不同布喇格光纤光栅长度的双布喇格光纤光栅谐振腔,验证了引入双布喇格光纤光栅谐振腔在压缩980nm半导体激光器输出光谱线宽的同时改善了其输出光谱的稳定性.当环境温度在0~75℃范围内变化时,980nm半导体激光器输出中心波长仅变化0.06nm.     

基于光楔阵列产生光学涡旋阵列的研究

在研究光楔衍射法产生单涡旋的基础上,基于长条形光楔阵列,提出了利用光束阵列衍射产生涡旋阵列的方法.该方法要求光束阵列在平行于光楔边缘方向上的光束间距等于光束直径的整数倍.利用超精密机床采用一体化加工法加工了光楔阵列元件,验证了该方法的可行性.利用空间光调制器快速灵活调整光束阵列的优点,搭建了借助空间光调制器加载达曼光栅衍射产生所需光束阵列的实验光学系统.针对光束阵列与光楔阵列的匹配问题,研究了达曼光栅掩模图基本单元对光束阵列的调控,获得了可调结构的光束阵列.实验产生了拓扑荷一致的光学涡旋阵列,与仿真结果相一致,证明所提方法的有效性.     

光栅投影相位法系统模型及标定方法

本文针对传统投影光栅相位法的光学三角法模型进行了改进,采用直入射光路并配合使用一种简便易行的标定方法,只需使用相移公式求取相位差,而不会引入与系统几何位置关系有关的量,简化了求取高度矩阵的要求。实验结果表明,新系统模型精度良好,测量误差为0.107 mm。采用该模型和标定方法可以克服传统方法系统模型的局限性,最大限度减少误差源并提高抗干扰性。     

光纤光栅腐蚀传感器

提出了一种测量钢筋腐蚀的新型传感器.这种传感器将光纤光栅拉伸后固定在圆形钢筋的表面,在钢筋被腐蚀后,光纤光栅所受到的拉伸应变将被释放,光纤光栅的反射光波长发生变化,通过测量光纤光栅的波长就可以测得钢筋腐蚀程度.这种传感器测量准确度优于±0.1 μm,测量范围约12 μm,可用于混凝土结构中钢筋腐蚀的早期监测.     

阵列波导光栅波分复用/解复用器光谱响应效率的理论模型

基于单模光波导的本征模场分布,瑞利－索末菲衍射积分公式和天线原理的互易定理,给出耦合器中两个非接触平面光波导耦合特性的描述.基此,根据等光程差不等振幅多光束干涉的光场叠加原理,推导出新颖的阵列波导光栅波分复用/解复用器的光谱响应效率的解析函数表达式,这些表达式可为快速精确分析阵列波导光栅波分复用/解复用器的特性提供理论基础.同时,介绍了一个计算阵列波导光栅波分复用/解复用器特性的例子,给出其光谱响应度和信号通道串扰.     

D形光纤Bragg光栅弯曲灵敏度的理论和实验研究

用材料力学理论分析了D形光纤Bragg光栅（D-shaped fiber Bragg grating,D-FBG）以及常规光纤Bragg光栅由弯曲引起的轴向应变,得到了光栅Bragg波长漂移的弯曲敏感特性.实验结果和理论计算结果基本相符.与常规FBG相比,该D-FBG的弯曲灵敏度要高近80倍.因此D-FBG可以直接应用于弯曲形变的测量,以及间接应用于压力、加速度等物理量的测量.理论分析和实验结果对采用该类型光纤光栅的器件和传感系统的设计具有参考意义.     

基于光栅衍射的晶体X射线衍射缺级的理论基础和实验研究

以光栅衍射缺级理论为切入点对晶体X射线衍射缺级的现象、产生的根源进行了理论分析,得出：(1) 晶体X射线衍射缺级存在的可能性在于某些晶体材料晶胞的几何结构因子为零;(2) 在复式格子晶体或具有某种特殊缺陷的晶体的X射线衍射图样中存在缺级是这方面实验研究的方向。这些结论在材料物相、材料结构类型和不完整性分析等方面具有一定的参考价值。     

一种新型温度自补偿高灵敏度折射率计

基于高频CO2激光脉冲写入的新型超长周期光纤光栅(ULPFG),提出了一种可实现温度自补偿的新型高灵敏度折射率计。理论与实验表明,新型超长周期光纤光栅不同闪耀阶次谐振峰对外界折射率与温度变化的灵敏度各自不同,特别的是,该光栅存在对外界折变不敏感的谐振峰,测量中除了可以利用该峰实现温度同时测量外,还可以补偿另一个测量折变的谐振峰因温度变化带来的测量误差。该折射率计具有制作简单、成本低、强度好,灵敏度高等优点,当外界折射率在1.43~1.45范围内变化时,其折射率测量灵敏度可达每单位折射率240 nm,在实际工业应用中具有较大的潜在实用价值。