STABLE DOUBLE LR ALGORITHM AND ITS ERROR ANALYSIS

In this paper, the normative matrices and their double LR transformation with origin shifts are defined, and the essential relationship between the double LR transformation of a normative matrix and the QR transformation of the related symmetric tridiagonal matrix is proved. We obtain a stable double LR algorithm for double LR transformation of normative matrices and give the error analysis of our algorithm. The operation number of the stable double LR algorithm for normative matrices is only four sevenths of the rational QR algorithm for reed symmetric tridiagonal matrices.     

多目标分数变分问题的对偶性

本文利用参数逼近在函数广义（F，ρ）－凸的条件下，建立了一类多目标式变分问题关于有效解的对偶理论。     

Enantioseparation of Dencichine and D-Isomer on L-Cysteine Derivative Phase by Ligand-exchange Chromatography

Dencichine (β-N-oxalyl-L-α, β-diaminopropionic acid, L-ODAP), a nonprotein amino acid, is a haemostatic agent present in important Chinese medicinal herbs such as Panax notoginseng, as well as other Panax species1. It was first isolated from the seeds …     

电热泵用于蔬菜温室供热的经济性分析

现代化蔬菜温室是我国都市农业发展中的一个重要组成部分，目前这类温室的冬季加热均以燃煤方式为主．伴随着越加严重的城市环境污染，温室供热系统也面临着改造问题，需要引入清洁供热方式，热泵供热是其中的一种．本文以上海地区现代化蔬菜温室为研究对象，分析了蔬菜温室中使用电热泵供热的运行成本，并与燃煤供热方式进行了对比．就热泵供热系统在温室中的应用前景及可行性、经济性进行了分析，为热泵在温室供热系统中的应用提供了可参考依据．     

巯基乙酸锑配合物的合成与X射线粉末衍射数据指标化

一些锑和铋的配合物可以应用于医药研究[1,2 ] ,已合成了许多锑的有机配体配合物[3～ 7] ,但其中大多数没有生物活性。因此 ,研究锑或铋离子的配合物不仅对主族元素化学、生物无机化学而且对医药都有着非常重要的意义。我们用三氯化锑与巯基乙酸液相反应法合成的二巯基乙酸锑 (Ⅲ)配合物 ,其组成为ＨＳｂ(ＳＣＨ2 ＣＯＯ) 2 ,用Ｘ射线粉末多晶衍射数据指标化来研究配合物晶体结构[8] 。1　实验部分1 1　仪器与试剂ＥＡ - 1 1 0 6型元素分析仪 (意大利卡拉欧巴公司制造 ) ,Ｄ Ｍａｘ -ＹＢ型多晶Ｘ射线粉末衍射仪(日本理学 ,ＣｕＫα射线 ,…     

采用二叉树编码的遗传算法实现数据似合

针对采用数值分析方法进行数据似合求解复杂度高、运算最大而精度较低的缺陷，本给出一种基于二叉树编码的遗传算法来进行数据拟合，取得了较好的效果。     

受激喇曼散射在掺铒光纤放大器中的影响

本文在分析了均匀掺杂分布式光纤放大器（d－EDFA）的基础上，提出了沿传输方向掺杂浓度单调下降（单变），和降升结合（两变）的两种渐变型分布式光纤放大器，并用传输方程研究了透明传输和最佳掺杂浓度下，受激喇曼散射对均匀、单变和两变型三种d－EDFA的各种特性的影响．     

试样研磨对铜合金主要元素分析结果的影响

本文从砂带，研磨方法，试样表现状况三个方面，分析了试样研磨对铜合金主要元素测试结果的影响。     

Experimental Study of Capillary Effect in Porous Silicon Using Micro-Raman Spectroscopy and X-Ray Diffraction

We investigate the capillary effect and the residual stress evolution in the wetting, drying and rewetting stages of porous silicon using x-ray diffraction and micro-Raman spectroscopy. A reversible capillary effect and an irreversible oxidation effect are the driving forces for the residual stress evolution. The lattice expansion of the porous-silicon layer is observed to decrease slightly by x-ray diffraction and the tensile residual stress increases rapidly by micro-Raman spectroscopy, with the change of about 82 MPa for the oxidation effect and the change of 2.78 GPa (enough for cracking) for the capillary effect. Therefore, the capillary effect plays a major role in the residual stress evolution in the stages. A simple microscopic liquid-bridge model is introduced to explain the capillary effect and its reversibility. The capillary emergence has a close relation with a great deal of the micro-pore structure of porous silicon.