导模法(EFG)生长大尺寸厚壁管状蓝宝石单晶

采用自行设计的导模法蓝宝石长晶装备,通过优化模具设计和长晶工艺,成功生长了内/外径分别为31/58 mm和50/65 mm,长度超过300 mm的大尺寸厚壁蓝宝石单晶圆管,无开裂多晶,无肉眼可见气泡,晶体质量优良.     

声表面波器件用〈110〉取向ZnO薄膜的MOCVD生长

Zn O是具有纤锌矿晶体结构的多功能半导体材料 ,它具有 3 .3 7e V的禁带宽度和高达 60 me V的激子束缚能 ,是很有希望的紫外发光材料 .由于具有 c轴的择优取向性 ,因此目前人们的注意力主要集中在对 c轴取向 Zn O薄膜的特性研究上 [1～ 3] .但其它取向的 Zn O薄膜也可在某些衬底的特定面上 ,通过特定的条件进行生长 ,如〈1 1 0〉取向的 Zn O薄膜可在特定的条件下生长在蓝宝石 R面衬底上[4～ 7] .由于 (1 1 0 )面的 Zn O薄膜具有一些 c轴取向薄膜所不具备或无法比拟的特性 ,如 :机电耦合系数高达6% (C面薄膜的机电耦合系数却不足 1 % )…     

Dislocation Analysis for Large-sized Sapphire Single Crystal Grown by SAPMAC Method

In this paper,large-sized sapphire (230×210 mm,27.5 kg) was grown by SAPMAC method (sapphire growth technique with micro-pulling and shoulder-expanding at the cooled center). Dislocation peculiarity in large sapphire boule (0001) basal plane was investigated by chemical etching,scanning electron microscopy and X-ray topography method. The triangular dislocation etch pit measured is 7.6×101～8.0×102 cm-2,in which relative high-density dislocations were generated at both initial and final stages of crystal growth. The analysis of single-crystal X-ray topography shows that there are no apparent sub-grain boundaries; the dislocation lines are isolated and straight. Finally,the origins of low-density dislocation in sapphire crystal are discussed by numerical analysis method.     

SiO2图形化蓝宝石衬底对GaN生长及LED发光性能的影响

为了提高氮化镓(GaN)基发光二极管(LEDs)的发光性能,采用等离子体增强化学气相沉积(PECVD)在蓝宝石衬底上沉积SiO2薄膜,经过光刻和干法刻蚀技术制备了SiO2图形化蓝宝石衬底(SiO2 patterned sap-phire substrate,SPSS),利用LED器件的外延生长和微纳加工技术获得了基于S...     

μ-PD法蓝宝石纤维晶体生长中传热传质的数值模拟

在μ-PD法纤维蓝宝石单晶生长中,利用Comsol软件数值分析了陶瓷管开裂现象、熔体对流和磁场分布.结果表明,试验中陶瓷管保温层总是在距底部0.03 m处断裂,数值模拟发现该处为温度和Von Mises应力最高点位置,验证了数值模拟的准确性;适当增大陶瓷管保温层厚度有利于降低陶瓷管温度,从而降低其开裂概率;熔体对流中Marangoni对流占主导,浮力对流可忽略;磁场分布能够满足μ-PD法蓝宝石晶体生长需求,“趋肤效应”使最高温度位于铱坩埚最上端.     

采用双石英棱镜对的掺钛蓝宝石自锁模激光器

给出了双棱镜对二、三阶色散的解析式。报道了采用双石英棱镜对的掺钛蓝宝石自锁模激光器的实验结果，获得与理论分析一致的结论。     

掺钛蓝宝石与超短脉冲

详细阐述掺钛蓝宝石晶体的物理化学与光谱特性,着重介绍了以掺钛蓝宝石晶体为激光介质的各种激光器件及关键技术。对国内外超短脉冲激光的产生与放大技术的发展历史、研究动态和应用前景也作了简单评述。     

Effect of Interface Nanotexture on Light Extraction of InGaN-Based Green Light Emitting Diodes

We report the enhancement of the light extraction of InGaN-based green light emitting diodes （LEDs） via the interface nanotexturing. The texture consists of high-density nanocraters on the surface of a sapphire substrate with an in situ etching. The width of nanocraters is about 0.5 μm and the depth is around 0.1 μm. It is demonstrated that the LEDs with interface texture exhibit about a 27% improvement in luminance intensity, compared with standard LEDs. High power InGaN-based green LEDs are obtained by using the interface nanotexture. An optical ray-tracing simulation is performed to investigate the effect of interface nanotexture on light extraction.