大气压射流等离子体放电特性及其灭菌效果

介绍了一种同轴电极的射流等离子体发生装置,可以直接在大气中将生成的氦气辉光放电射流等离子体喷出进行杀菌消毒,无需反应容器和真空系统,并从电压、频率、流速等方面讨论了该同轴等离子体发生器的放电特性。在稳定的放电条件下,利用实验装置进行了大气压下的等离子体灭菌实验,验证了本装置在等离子体灭菌应用上的可行性和易操作性。灭菌结果表明：在最初的2 min内,细菌减小趋势明显,3 min后细菌几乎全部消亡。     

磁约束等离子体推进器高温超导磁体系统的电磁计算

在地面实验中磁约束等离子体推进器磁体系统是靠四个NbTi低温超导磁体提供磁场,现在设计依靠G-M制冷机传导制冷的由Bi2223超导带材绕制成的四个高温超导磁体替代以前的四个低温超导磁体.本文利用ANSYS有限元分析软件进行电磁计算,得出高温超导磁体的参数。     

ICP-MS测定无公害畜禽饮用水中铅、汞、砷和镉

用ICP-MS测定畜禽饮用水中铅、汞、砷、镉的含量,其最终结果与现行国家标准方法一致。     

Is the Near-Earth Current Sheet Prior to Reconnection Unstable to Tearing Mode？

The tearing mode instability plays a key role in the triggering process of reconnection. The triggering collisionless tearing mode instability has been theoretically and numerically analyzed by many researchers. However, due to the difficulty in obtaining the observational wave number, it is still unknown whether the tearing mode instability can be excited in an actual plasma sheet prior to reconnection onset. Using the data from four Cluster satellites prior to a magnetospheric reconnection event on 13 September 2002, we utilized the wave telescope technique to obtain the wave number which corresponds to the peak of power spectral density. The wavelength is about 18RE and is consistent with previous theoretic and numerical results. After substituting the wave vector and other necessary parameters of the observed current sheet into the triggering condition of tearing mode instability, we find that the near-Earth current sheet prior to reconnection is unstable to tearing mode.     

Surface plasmon interference formed by tightly focused higher polarization order axially symmetric polarized beams

We numerically study the surface plasmon interference formed by tightly focused higher polarization order axially symmetric polarized beams (ASPBs) based on the vectorial diffraction theory. The definition of ASPBs is stated, and the optical setup for surface plasmon polariton (SPP) excitation and mathematical expressions for interfering SPP fields are proposed. The simulation results show that the interfering SPP fields present a multi-focal spot pattern. In addition, the number of spots is related to the polarization order of the incident beams P as 2×(P-1), indicating potential utilization in near-field multiple optical trapping and near-field imaging and sensing. The unique interfering phenomenon is also explained.     

基于偏振分光棱镜的表面等离子体波传感系统

常规棱镜表面等离子体共振(SPR)传感器检测系统共振波谷浅且谷底平坦,从而导致共振波长不易确定。在常规棱镜SPR传感器系统基础上,加入偏振分光棱镜(PBS),构建了一种新型棱镜SPR传感器系统。对PBS的分光带宽展宽进行了研究,提出了基于膜系设计的展宽方法。在无水乙醇检测的实验中,滤除s偏振光后,共振波谷谷底曲率半径由86.2394减小到39.3990,近似减少为滤除s偏振光之前的1/2,这与理论分析相吻合。采用常规和新型棱镜SPR检测系统分别对折射率在1.32~1.39内的6种液体进行了测量,分辨率从1.62×10-4提高到1.55×10-4。该系统能较好地滤除s偏振光,使得共振波谷更加尖锐,从而提高共振光谱的检测精度。     

Compton散射下等离子体中电子相轨道的演化

用KMR模型研究了等离子体中多光子非线性Compton散射下电子相轨道的演化,发现电子与光子进行能量交换后,只有未被俘获电子的相轨道才能从周期性向非周期性、随机型演化,其演化剧烈程度随电子吸收光子数的增大而加剧,随电子与光子碰撞非弹性成分和碰撞前初始速度的增大而迅速减弱,但低于强激光场中的剧烈程度。当电子被光场俘获时,这种演化过程结束并做稳定的运动,光子不再为电子提供能量。     

极区夏季中层顶区域尘埃粒子参数的研究

采用轨道受限运动方法研究了极区夏季中层顶区域的尘埃粒子电荷数与尘埃粒子半径。利用尘埃等离子体充电理论,建立了尘埃粒子充电方程模型,得到尘埃粒子充电时尘埃电荷数和半径的比值。然后结合ECT02实验数据,分析了发生极区中层夏季回波现象时极区中层顶区域尘埃粒子电荷数和半径的比值,并得到尘埃粒子的半径以及尘埃粒子所带电荷量。结果表明,极区中层顶区域的尘埃粒子平均所带电荷不到一个,它的半径约为20nm。     

EAST装置放电预测的初步研究

用托卡马克模拟程序对实验前期的放电进行了模拟,获得了期望的等离子体演化过程及主要参数波形,如极向场线圈电流、等离子体电流、等离子体位置等。通过等离子体控制系统将模拟获取的参数波形用于实验,开展了等离子体R位置控制、完全程序场控制及RZIp控制下的放电模拟对实验的预测研究。模拟结果与实验吻合较好,表明放电模拟具有一定的可预测性,为今后EAST装置开展更深入的物理实验提供了一定的参考。     

等离子体浸没注入超低能注入掺杂研究

A plasma immersion ion implantation(PIII) system based on inductively coupled plasma(ICP) technology was designed. The PIII system had a cylindrical chamber, and a radio frequency(RF) power was used to sustain discharge and a pulsed voltage source was provided to bias the wafer. The RF power was coupled into chamber by a non-coplanar two-turn circular structure coil. A Langmuir probe was connected to the PIII system to diagnose the plasma parameters. The probe diagnosis indicated that plasma ion density of the system achieves 10¹⁷m^-3, the uniformity of the ion density along radial direction achieves 3.53%. Boron (B) and phosphorus (P) doping experiments were performed on the system. Results from second ion mass spectrum (SIMS) tests showed that the measured injection depth is about 10nm and the shallowest is 8.6 nm (at 10¹⁸cm^-3), the peak ion concentration is below the surface of the wafer, and the ion dose reaches above10¹⁵cm^-2 and the abrupt 2.5 nm/decade.