Nanocavity Shrinkage and Preferential Amorphization during Irradiation in Silicon

We model the recent experimental results and demonstrate that the internal shrinkage of nanocavities in silicon is intrinsically associated with preferential amorphization as induced by self-ion irradiation. The results reveal novel thermodynamic nonequilibrium properties of such an open-volume nanostructure in condensed matter and also of covalently bound amorphous materials both at nanosize scale and during ultrafast interaction with energetic beam.     

Structural and Electrical Characteristics of Pb（Zr0.53,Ti0.47）O3 Thin Films Deposited on Si （100） Substrates

Pb(Zr0.53, Ti0.47)O3 (PZT) films were directly deposited on Si substrates without a buffer layer by pulsed laser deposition. Only(110)-oriented PZT peaks (other than Si substrate peaks) were observed from the XRD data. The electrical properties of the PZT/Si capacitor were characterized in terms of both the capacitance versus voltage (C-V) and current versus voltage (I-V) measurements. The clockwise trace of the C-V curve shows ferroelectric polarization switching, as is expected. From the I-V curves, the Schottky emission and spacecharge-limited-current behaviour are found to be the mainly leakage current mechanism in a certain electric field range in the negative and positive bias, respectively.     

Structure and Photoluminescence of Nano-ZnO Films Grown on a Si （100） Substrate by Oxygen- and Argon-Plasma-Assisted Thermal Evaporation of Metallic Zn

Nano-ZnO thin films were prepared by oxygen- and argon-plasma-assisted thermal evaporation of metallic Zn at low temperature, followed by low-temperature annealing at 300℃ to 500℃ in oxygen ambient. X-ray diffraction patterns indicate that the nano-ZnO films have a polycrystalline hexagonal wurtzite structure. Raman scattering spectra demonstrate the existence of interface layers between Zn and ZnO. Upon annealing at 400℃ for i h, the interface mode disappears, and photoluminescence spectra show a very strong ultraviolet emission peak around 381 nm. The temperature-dependent PL spectra indicate that the UV band is due to free-exciton emission.     

Deposition of Hydrogen-Free Silicon Nitride Thin Films by Microwave ECR plasma Enhanced Magnetron Sputtering at Room Temperature

Hydrogen-free silicon nitride （SiNx） films were deposited at room temperature by microwave electron cyclotron resonance （MW-ECR） plasma enhanced unbalance magnetron sputtering system. Both Fourier-transform infrared spectroscopy and x-ray photoelectron spectroscopy are used to study the bonding type and the change of bonding structures of the silicon nitride films. The results indicate that the chemical structure and composition of SiNx films deposited by this technique depend strongly on the N2 flow rates, the stoichiometric SiNx film, which has the highest hardness of 22.9 GPa, could be obtained at lower N2 flow rate of 4 sccm.     

掺铒重金属氧氟硅铋酸盐玻璃的光谱性质

研究了重金属氧氟硅铋酸盐玻璃 (50-x)SiO2 xBi2O3 50PbF2(x=0, 3, 5, 8, 10, 13, 15 mol%)中Er3+离子的吸收光谱、荧光光谱、荧光半高宽、荧光 寿命和热稳定性能.应用Judd Ofelt理论计算了玻璃的强度参数Ωt(t=2,4,6)，应用 McCumber计算了能级4I13/2→4I15/2跃迁的受激发射截面. 结果发现荧光半高宽与Ω6有较大联系，Ω6越大，荧光半高宽越宽.对Er3+ 关键词： 重金属氧氟硅铋酸盐玻璃 光谱性质 Er3+离子 Judd Ofelt参数     

多孔硅/多孔氧化铝与PVK复合光致发光特性

用旋涂法实现了多孔硅、多孔氧化铝与聚乙烯咔唑(PVK)的复合,研究了多孔硅／PVK、多孔氧化铝／PVK复合体系的光致发光性能。PL谱的测试发现,多孔硅／PVK复合体系的PL谱同时具有多孔硅和PVK的发射峰。此外,在485nm的位置出现了一个新峰,讨论了这个峰的来源。而多孔氧化铝与PVK复合后,没有产生新的峰。但多孔氧化铝与PVK复合后,由于多孔氧化铝纳米孔的纳米限制效应使PVK的发光峰出现大幅度蓝移。从多孔硅与多孔氧化铝发光机制的不同出发,讨论了多孔硅、多孔氧化铝与PVK复合后产生不同结果的原因。     

多孔硅的制备条件对其光致发光特性的影响

不同的实验条件下制备的多孔硅的光致发光(PL)特性是不同的,这是许多研究产生分歧的主要原因。对比分析了阳极氧化电流密度、阳极氧化时间、溶液浓度以及自然氧化时间对多孔硅光致发光光谱的影响。认为在一定的范围内,多孔硅的发光峰位会随电流密度的增大而蓝移,要获得较强的发光,需要选择合适的电流密度;随着腐蚀时间的延长,多孔硅的发光峰位也发生蓝移。当HF酸的浓度较小时,峰位随浓度的增大表现为向低能移动;而当HF酸的浓度较大时,峰位随浓度的增大则表现为移向高能。多孔硅在空气中自然氧化,其发光峰位发生蓝移,而发射强度随放置时间的延长而降低。并用量子限制模型和发光中心模型对实验结果进行解释。     

多孔硅的光致发光机制

人们已经提出了许多解释多孔硅发光的理论模型,每个模型都可以针对某些实验现象做出合理的解释,而对其他的实验结果就可能无法解释甚至相悖,因此多孔硅的发光机制至今仍是需要进一步研究和解决的问题。通过改变阳极氧化的条件,制得了一系列样品,其光致发光谱主要有四个峰。随着制备条件的改变,各个峰位的变化不大,但峰值强度比的变化比较大。随着自然氧化时间的延长,各个峰位的变化很小,有红移也有蓝移,有的则基本不变;而峰值强度的减弱幅度较大,但对应于各个峰位幅度的减弱是均衡的。分析实验现象产生的原因,认为多孔硅的发光是多种发光机制共同作用的结果;多孔硅纳米量子线的一定尺寸分布,不仅使光致发光谱存在一定的带宽,而且也是产生多峰现象的原因之一;多孔硅的结构特征对其发光特性起着决定性的作用。     

非线性一维光子晶体波导光双稳

利用非线性折射率系数较大且非线性时间响应较快的CdS_xSe_1-x玻璃为材料,设计并制备了非线性一维光子晶体波导光双稳器件,该器件的折射率空间分布呈正弦形式。实验测得双稳开关的阈值功率密度为1.60×10⁵W/cm²,开关时间为63ps。采用时域有限差分方法讨论了光子晶体带隙随入射光强变化而移动的情况,随着入射光功率密度的增加,光子晶体的带隙中心向短波方向移动。同时计算了该器件的双稳特性,理论计算得到双稳开关的阈值功率密度为1.40×10⁵W/cm²,开关时间约为50ps。获得了理论与实验基本一致的结果。