ICP-AES测定彩涂前处理表面调整转化层中Ti、Ni含量及钝化膜中Cr含量

采用电感耦合等离子体-原子发射光谱法同时测定彩涂前处理表面调整转化层中Ti、Ni含量及钝化膜中Cr含量.以表征表面调整转化层厚度及钝化膜厚度,采用本方法准确度高、快速简便,经试验结果令人满意.     

晶界内耗研究的新进展

由不同取向差的纯Al双晶的内耗实验观察到，不同类型晶界的弛豫参量有明屁差别。用耦合模型对内耗数据的分析表明，小角度晶界内耗的基本机制是位错攀移，而大角度晶界内耗的基本机制是晶界扩散。在此基础上，对多晶中晶界内耗的一些特征也作了解释。     

分析布拉格光栅破坏的两纤芯不同的光纤耦合器

进一步推广了描述纤芯不同光纤耦合器的耦合模理论，用于解释被布拉格光栅破坏的两纤芯不同光纤耦合器的耦合现象，理论分析的结果与已报道的实验结果相符，与单独的布拉格光栅所起的反射作用不同,这里布拉格光栅所起的作用主要是引入了强烈的色散，在光栅的频谱范围内使耦合器不再同步，在被布拉格光栅破坏的光纤耦合器的选择性频谱中，其边缘部分出现非常弱的波动，而在其阻带内出现非常强的凹陷。     

红外耦合光学系统设计

红外目标模拟器由红外目标图像发生器和投影光学系统组成。该红外光学系统是一个要求与2个导引光学系统的光学技术参数相匹配的长焦距、大视场和具有像方远心光路的中红外光学系统。叙述用于红外目标模拟器的红外耦合光学系统的设计原理，提出它与导引光学系统一起可组成放大倍率M=4.5×的红外投影光学系统，并指出IR CRT产生的图像通过红外投影光学系统可成像在导引接收器上。针对给出的红外耦合光学系统的设计特点和技术要求，光学材料选取硅（Si） 锗（Ge） 硅（Si），采用简单的柯克三片式结构完成光学系统设计。设计评价结果表明，该系统的光学性能和成像质量均满足设计指标要求。     

Numerical Study on Left-Handed Materials Made of Ferrite and Metallic Wires

Due to coupling effect, we show that it is difficult to realize the left-handed material by placing metallic wires directly into a ferrite matrix. However by introducing an insulating material round the metallic wires to decouple the direct interaction between the metallic wire and ferrite matrix, we have proposed two microstructures, which are shown by numerical simulation to have negative refractive indexes. The influence of microstructure on the transmission property is also examined.     

A Novel Contactless Method for Characterization of Semiconductors：Surface Electron Bean Induced Voltage in Scanning Electron Microscopy

We present a novel contactless and nondestructive method called the surface electron beam induced voltage (SEBIV) method for characterizing semiconductor materials and devices.The SEBIV method is based on the detection of the surface potential induced by electron beams of scanning electron microscopy (SEM).The core part of the SEBIV detection set-up is a circular metal detector placed above the sample surface.The capacitance between the circular detector and whole surface of the sample is estimated to be about 0.64pf.It is large enough for the detection of the induced surface potential.The irradiation mode of electron beam (e-beam) influences the signal generation When the e-beam irradiates on the surface of semiconductors continuously,a differential signal is obtained.The real distribution of surface potentials can be obtained when a pulsed e-beam with a fixed frequency is used for irradiation and a lock-in amplifier is employed for detection.The polarity of induced potential depends on the structure of potential barriers and surface states of samples.The contrast of SEBIV images in SEM changes with irradiation time and e-beam intensity.     

增算子的不动点和耦合不动点

Under some general continuous and compact conditions, the existence problems of fiked points andd coupled fixed points for increasing operators are studied. an application, we utilize the results obtained to study the existence of solutions for differential inclusions in Banach spaces.     

古青铜器的ICP光谱分析

本文利用ICP光谱法测定了11个古青铜器中的主要元素Cu、Sn、Pb和微量元素As、Ni、Fe、Ag的含量，结果完全满足考古研究的要求，为考古研究提供了科学的依据。     

高温QCD的耦合常数和退禁闭相变

用有限温度场论中重整化群方法,研究了QCD的有效耦合常数的温度依赖性,发现高温时耦合常数在全动量区都很小,体现出了QCD的退禁闭特征.