The influence of interfacial barrier engineering on the resistance switching of In2O3：SnO2/TiO2/In2O3：SnO2 device

The I-V characteristics of In2O3：SnO2/TiO2/In2O3：SnO2 junctions with different interracial barriers are inves- tigated by comparing experiments. A two-step resistance switching process is found for samples with two interfacial barriers produced by specific thermal treatment on the interfaces. The nonsynchronous occurrence of conducting filament formation through the oxide bulk and the reduction in the interracial barrier due to the migration of oxygen vacancies under the electric field is supposed to explain the two-step resistive switching process. The unique switching properties of the device, based on interracial barrier engineering, could be exploited for novel applications in nonvolatile memory devices.     

An SPICE Model for PCM Based on Arrhenius Equation

Based on the temperature dependence of the Arrhenius law, an HSPICE compact module using Verilog-A language for phase change memory （PCM） is presented. In the model of this HSPICE compact module, the basic theory that the resistance of the amorphous semiconductor has relations with the activation energy and temperature is used, and an assumption that this theory can be expanded to describe the crystalline semiconductor is employed. Moreover, since an objective reality that the resistance of the semiconductor determines the temperature and the temperature affects the resistance inversely is inevitable, coupling with such positive feedback, this model can reproduce the real-time characteristics of the memory cell accurately. The simulation results show that this model can reproduce the features of the PCM cell well. It can be used in the PCM circuit design and further analysis.     

基于RS485总线的存储器网络化技术研究

传统网络化测试技术存在网络化测试精准度低、不能对全部数据进行测试、数据属性测试不明确等问题,为此,基于RS485串行连接框图和存储器结构对网络化测试技术展开研究。采用信息融合技术中的信息融合算法得出测试估计误差方阵,完善传统技术中精准度低的问题。利用定义模型和动态模型有限内存的处理技术,对整个存储内存进行访问,从而对全部数据进行测试。采用分布式计算技术,利用二元制算法测试存储器中数据的质量,从而确定数据的属性。通过实验得出结论,本文测试技术不但能够确定数据属性,还能提高网络化测试精准度,并对全部数据进行测试,为我国未来网络化测试技术奠定了坚实的基础。     

Discrete Charge Storage Nonvolatile Memory Based on Si Nanocrystals with Nitridation Treatment

A nonvolatile memory device with nitrided Si nanocrystals embedded in a floating gate was fabricated. The uniform Si nanocrystals with high density （3× 10^11 cm^-2 ） were deposited on ultra-thin tunnel oxide layer （- 3 nm） and followed by a nitridation treatment in ammonia to form a thin silicon nitride layer on the surface of nanocrystals. A memory window of 2.4 V was obtained and it would be larger than 1.3 V after ten years from the extrapolated retention data. The results can be explained by the nitrogen passivation of the surface traps of Si nanoerystals, which slows the charge loss rate.     

Enhanced Performance of Phase Change Memory Cell Element by Initial Operation and Non-Cumulative Programming

A phase change memory （PCM） device, based on the Ge2Sb2Te5 （GST） material, is fabricated using the standard 0.18-μm CMOS technology. After serials of detailed experiments on the phase transition behaviors, we find that the RESET process is strongly dependent on the state of the inactive area and the active area affects the SET process dramatically. By applying a 5-mA current-voltage （I — V） sweep as initial operation, we can reduce the voltage drop beyond the active area during the RESET process and the overall RESET voltage decreases from 3 V plus to 2.5 V. For the SET operation, a non-cumulative programming method is introduced to eliminate the impact of randomly formed amorphous active area, which is strongly related to the threshold switching process and SET voltage. Combining the two methods, the endurance performance of the PCM device has been remarkably improved beyond 1 × 106 cycles.     

自旋轨道矩调控的垂直磁各向异性四态存储器结构

利用氧化钽缓冲层对垂直各向异性钴铂多层膜磁性的影响,构想并验证了一种四态存储器单元.存储器器件包含两个区域,其中一区域的钴铂多层膜[Pt(3 nm)/Co(0.47 nm)/Pt(1.5 nm)]直接生长在热氧化硅衬底上,另一个区域在磁性膜和衬底之间沉积了一层氧化钽作为缓冲层[TaO x(0.3 nm)/Pt(3 nm)/Co(0.47 nm)/Pt(1.5 nm)],缓冲层导致两个区域的垂直磁各向异性不同.在固定的水平磁场下对器件施加与磁场同向的电流,由于电流引起的自旋轨道耦合力矩,两个区域的磁化取向均会发生翻转,且拥有不同的临界翻转电流.改变通过器件导电通道的电流脉冲形式,器件的磁化状态可以在4个态之间切换.本文器件的结构为设计自旋轨道矩存储器件提供了新的思路.     

宽温域跨室温磁斯格明子材料的发现及器件研究

报道了阻挫型磁体Fe_3Sn_2单晶中宽温域跨室温磁斯格明子的发现及其"赛道型"微纳器件的初步探索.通过合金化设计和实验,突破晶体取向生长和克服包晶反应两个关键技术难关,制备出了高质量的Fe_3Sn_2单晶.原位洛伦兹电子显微镜结果表明,在该材料体系中,磁斯格明子具有多种拓扑结构,并可以在一定磁场下相互转化.基于高质量的Fe_3Sn_2单晶,利用聚焦离子束技术,进一步制备出了600 nm宽并具有磁斯格明子单链排列的"赛道性"微纳器件.实验结果表明,该单链磁斯格明子具有极高的温度稳定性:单个磁斯格明子的尺寸以及相邻两个磁斯格明子之间的距离可以在室温到630 K宽温区内保持不变.宽温域跨室温磁斯格明子材料Fe_3Sn_2的发现及单链"赛道型"微纳器件的成功制备,从材料和器件两个方面推进了磁斯格明子材料的实用化.     

基于IBIS模型的仿真分析在SDRAM印刷电路板设计中的应用

针对高速数字视频系统印刷电路板(PCB)设计中由于传输线的高频特性导致的信号完整性问题,通过输入/输出缓冲器信息规范(input/output buffer information specification,IBIS)模型对TI公司提供的TMS320DM642芯片扩展的外部存储器的反射仿真以及对同步动态随机存储器(SDRAM)的时序仿真来优化数字视频系统的PCB的设计.结果表明,使用这些设计方案可以有效地提高信号完整性,从而增强高速数字视频系统的可靠性.     

W/TiO2/ITO薄膜的阻变性能及其机理研究

采用磁控溅射方法沉积TiO2薄膜及电极层,制备W/TiO2/ITO薄膜阻变存储器单元.利用原子力显微镜、X射线衍射仪、X射线光电子能谱仪对薄膜进行表征,测试结果表明:TiO2薄膜表面平整、致密;组织结构以非晶为主,仅有少量的金红石相TiO2(110)面结晶;钛氧比为1∶1.92,其内部存在少量的氧空位.在电学测试中,元件呈现出了稳定的双极阻变现象,VSet分布在0.92 V左右,VReset分布在-0.82 V左右;元件窗口值稳定,数据保持特性良好.通过对元件Ⅰ-Ⅴ曲线线性拟合结果的分析,我们认为元件的阻变机理由导电细丝机制主导.进一步的分析发现,该导电细丝是由钨原子构成,钨原子在电场作用下发生氧化还原反应并在TiO2薄膜层中迁移,造成了导电细丝的形成和断裂.     

利用加速器重离子进行SRAM单粒子效应研究

 报导了利用北京大学串列静电加速器提供的重离子对两类静态随机存储器进行单粒子效应的实验和测量。给出了两类静态随机存储器的单粒子效应翻转截面随线性能量转移值的变化关系曲线。