非平凡4—调和映照的一个必要条件

本文给出了非平凡４－调和映照的一个必要条件。     

薄膜界面粗糙对双晶摇摆曲线的影响

用X射线衍射动力学理论,模拟计算InP衬底上InGaAs/AllnAs超晶格和InGaAs单层膜的X射线双晶摇摆曲线,计算结果表明:薄膜界面粗糙对单层膜的衍射峰和超晶格的零级衍射峰影响较小,但却明显影响单层膜衍射干涉条纹和超晶格的±1级卫星峰,随着平均界面粗糙度的增大,单层膜衍射干涉条纹强度减弱并趋于消失;超晶格的±1级卫星峰变弱并逐渐展宽,理论计算的模拟双晶摇摆曲线与超晶格实验曲线比较表明:高质量匹配In_0.53Ga_0.47As(85?)/Al_{0.4 关键词：}     

复映射z←z^w＋c（w=α＋iβ）的广义M集的外部结构

为探讨Mandelbrot集（简称M集）的外部结构，Philip曾提出了“区域分解”和“角度分解”方法。本文推广了这两种方法，提出了等势线和色彩调配法，并利用这四种方法构造了复映射z←z^w c(w=α iβ）的广义M集的外部结构图。研究表明广义M集的外部结构具有分形特征，其断裂的原因是主幅角选取的不连续性。     

慢波导环形换能器指向性的计算机计算程序

本文利用有限而元式Helmholtz积分方程法完成了慢波导环形换能器指向性的数学计算程序。文中给出了程序中所用的各种数学表达式,计算程序方框图以及计算题例。计算题例中计算机计算结果与实际测量结果基本上是一致的。     

Microstructure and Texture Changes of Tungsten-Rhenium coated on Carbon Fiber Composite during Annealing

Since tungsten was chose as the divertor tiles of 1TER, the investigation of tungsten and its coating as plasma facing material (PFM) have been paid more attentions by fusion scientists all over the world. Recent years, tungsten coatings have been successfully     

分形维数与城市规模分布评析

本在分形概念的基础上，指出城市规模分布是基于统计意义上的一种分形分布，并计算了安徽省1978～1998年城市规模分布的分维值，评析了安徽省城市规模分布变化的特征。     

Na2O2体系半经验势能面

硷二聚物与氧反应碰撞的中间络合物是M~ _2X~-离子对(M代表硷原子,X代表氧原子或氧分子)。我们导出了Na~ _2O~-和Na~ _2O~-_2体系最低能量电子态绝热势能面的解析形式。     

Fabrication and Characterization of Ni Thin Films Using Direct-Current Magnetron Sputtering

Ni films are deposited by using ultra high vacuum dc magnetron sputtering onto silicon substrates at room temperature, and the high-quality and high-density films are prepared. The parameters, such as thickness, density and surface roughness, are obtained by using small-angle x-ray diffraction (XRD) analyses with the Marquardt gradient-expansion algorithm. The deposition rate is calculated and the Ni single layer can be fabricated precisely. Based on the fitting results, we can find that the surface roughness of the Ni films is about 0.7nm, the densities of Ni films are around 97% and the deposition rate is 0.26nm/s. The roughness of the surface is also characterized by using an atomic force microscope (AFM). The changing trend of the surface roughness in the simulation of XRD is in good agreement with the AFM measurement.