Characterization of Kovar-to-Kovar laser welded joints and its mechanical strength

For the packaging of a pump laser in butterfly package, the most crucial assembly step is the fiber-to-laser diode coupling and attachment. The use of laser welding as the joining method offers several advantages if compared with the adhesive joints: strong joining strength, short process time and less contamination. This paper reports on laser welding process characteristics; weld strength and its fracture mode. The penetration depth and melt area of laser spot welds were found to be complicated functions of laser pulse energy, intensity, and beam diameter. Effects of pulse width, input power and size of the focal spot on the rate of energy input to the workpieces and consequently, the weld strength were reported. The weld strength was found to be dependent on the overlapping area between the two joining materials. Surface roughness, R_a, has influence on the fraction of energy absorbed, A, and therefore, affecting the penetration depth. Thermal analysis was carried out on the laser-welded joints and its heat-affected zone (HAZ) induced by various power densities was examined. These data are important in order to optimize and utilize the laser welding process as an effective manufacturing tool for fabrication of reliable pump laser.     

A Design of Extreme Long Focal Depth Binary Optical Element

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高寒地区浅基础埋深问题

运用工程实例论述了影响高寒地区浅基础埋深的重要因素, 提出了基础埋深的具体计算方法。     

Formation of niobium oxynitrides by rapid thermal processing (RTP)

The potential of rapid thermal processing (RTP) for the preparation of thin films of niobium oxynitrides was investigated. The 200 and 500 nm niobium films were deposited via sputtering on oxidized silicon(1 0 0)- and on sapphire(1 −1 0 2)-substrates. At first, oxidation of niobium films in molecular oxygen and then nitridation in ammonia using an RTP-system was performed. The films were characterized before and after the oxidation and nitridation processes by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and secondary ion mass spectrometry (SIMS). The influence of the two different substrates, amorphous SiO₂ and single crystalline sapphire on the reactivity of the niobium films was studied in dependence of temperature, time of reaction and film thickness. The existence of niobium oxynitride formation was verified for some of the films. In some of the experiments, crack formation in the films or even delamination of the Nb-films from the substrates was observed.     

偏最小二乘回归方法的局限性及改进算法

提出了偏最小二乘回归中的一类不适用情况,并从理论上分析,实例上验证,给出了针对这种情况的一种改进算法,从而拓宽了偏最小二乘回归的使用范围.     

An Entropy-Based Approach to Measurement of Stock Market Depth

The aim of this study is to investigate market depth as a stock market liquidity dimension. A new methodology for market depth measurement exactly based on Shannon information entropy for high-frequency data is introduced and utilized. The proposed entropy-based market depth indicator is supported by an algorithm inferring the initiator of a trade. This new indicator seems to be a promising liquidity measure. Both market entropy and market liquidity can be directly measured by the new indicator. The findings of empirical experiments for real-data with a time stamp rounded to the nearest second from the Warsaw Stock Exchange (WSE) confirm that the new proxy enables us to effectively compare market depth and liquidity for different equities. Robustness tests and statistical analyses are conducted. Furthermore, an intra-day seasonality assessment is provided. Results indicate that the entropy-based approach can be considered as an auspicious market depth and liquidity proxy with an intuitive base for both theoretical and empirical analyses in financial markets.     

Effect of pearlitic morphology with varying fineness on the cavitation erosion behavior of eutectoid rail steel

The present work discusses the effect of the pearlitic morphology with varying fineness on the cavitation erosion behavior of eutectoid rail steel. Cavitation erosion of three different types of the pearlitic steels (furnace-cooled, air-cooled, and forced-air-cooled) consisting of coarse, fine, and very fine microstructures were tested in 3.5% NaCl solution and compared with that of the as-received pearlitic rail steel. The variation in the mean depth of erosion (MDE) and mean depth erosion rate (MDER) with erosion time was analyzed. Furthermore, the cavitation erosion resistance of the as-received, the air-cooled, and the forced-air-cooled was found to be 1.03, 1.51, and 2.14 times better than the furnace-cooled pearlitic steel, respectively. It was concluded that the cavitation erosion resistance of the pearlitic steel increased with the increase in the fineness of the microstructure.     

Setup of a dipole trap for all-optical trapping

Micromotion induced by the radio-frequency field contributes greatly to the systematic frequency shifts of optical frequency standards. Although different strategies for mitigating this effect have been proposed, trapping ions optically has the potential to provide a generic solution to the elimination of micromotion. This could be achieved by trapping a single ion in the dipole trap composed of a highpower laser field. Here, we present the setup of the dipole trap composed of a 532 nm laser at a power of 10 W aiming to optically trap a single ~(40)Ca~+ and we observe an AC-Stark shift of the fluorescence spectrum line of ～22 MHz caused by the 532 nm dipole beam. The beam waist of the dipole laser is several microns, which would provide a dipole potential strong enough for all-optical trapping of a single ~(40)Ca~+ ion.     

SIMS depth profiling of ‘frozen’ samples: in search of ultimate depth resolution regime

We have performed secondary ion mass spectrometry depth profiling analysis of III–V based hetero‐structures at different target temperatures and found that both the surface segregation and surface roughness caused by ion sputtering can be radically reduced if the sample temperature is lowered to ?150 °C. The depth profiling of ‘frozen’ samples can be a good alternative to sample rotation and oxygen flooding used for ultra‐low‐energy depth profiling of compound semiconductors. Copyright © 2016 John Wiley & Sons, Ltd.     

Effect of SIMS ionization probability on depth resolution for organic/inorganic interfaces

Secondary ion mass spectrometry (SIMS) relies on the fact that surface particles ejected from a solid surface are ionized under ion bombardment. By comparing the signal of molecular secondary ions desorbed from an organic film with that of the corresponding sputtered neutral precursor molecules, we investigate the variation of the molecular ionization probability when depth profiling through the film to the substrate interface. As a result, we find notable variations of the ionization probability both at the original surface and in the interface region, leading to a strong distortion of the measured SIMS depth profile. The experiments show that the effect can act in two ways, leading either to an apparent broadening or to an artificial sharpening of the observed film‐substrate transition. As a consequence, we conclude that care must be taken when assessing interface location, width, or depth resolution from a molecular SIMS depth profile.